DE602004025136D1 - BESCHICHTUNGEN AUS M(n+1)AX(n)-MATERIAL FÜR ELEKTRISCHE KONTAKTELEMENTE - Google Patents

BESCHICHTUNGEN AUS M(n+1)AX(n)-MATERIAL FÜR ELEKTRISCHE KONTAKTELEMENTE

Info

Publication number
DE602004025136D1
DE602004025136D1 DE200460025136 DE602004025136T DE602004025136D1 DE 602004025136 D1 DE602004025136 D1 DE 602004025136D1 DE 200460025136 DE200460025136 DE 200460025136 DE 602004025136 T DE602004025136 T DE 602004025136T DE 602004025136 D1 DE602004025136 D1 DE 602004025136D1
Authority
DE
Germany
Prior art keywords
contact
coatings
materials
electrical contact
contact elements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE200460025136
Other languages
English (en)
Inventor
Peter Isberg
Per Eklund
Jens Emmerlich
Lars Hultman
Hans Hoegberg
Henrik Ljungcrantz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ABB Research Ltd Switzerland
IMPACT COATINGS PUBL AB
ABB Research Ltd Sweden
Original Assignee
ABB Research Ltd Switzerland
IMPACT COATINGS PUBL AB
ABB Research Ltd Sweden
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ABB Research Ltd Switzerland, IMPACT COATINGS PUBL AB, ABB Research Ltd Sweden filed Critical ABB Research Ltd Switzerland
Publication of DE602004025136D1 publication Critical patent/DE602004025136D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/03—Contact members characterised by the material, e.g. plating, or coating materials
    • H01R13/035—Plated dielectric material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H1/00—Contacts
    • H01H1/02—Contacts characterised by the material thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/03—Contact members characterised by the material, e.g. plating, or coating materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/26—Pin or blade contacts for sliding co-operation on one side only
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00—Stock material or miscellaneous articles
    • Y10T428/31504—Composite [nonstructural laminate]
    • Y10T428/31678—Of metal

Landscapes

  • Contacts (AREA)
  • Conductive Materials (AREA)
DE200460025136 2003-10-16 2004-10-18 BESCHICHTUNGEN AUS M(n+1)AX(n)-MATERIAL FÜR ELEKTRISCHE KONTAKTELEMENTE Active DE602004025136D1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US51142403P 2003-10-16 2003-10-16
US51143003P 2003-10-16 2003-10-16
PCT/IB2004/003390 WO2005038985A2 (en) 2003-10-16 2004-10-18 COATINGS OF Mn+1AXn MATERIAL FOR ELECTRICAL CONTACT ELEMENTS

Publications (1)

Publication Number Publication Date
DE602004025136D1 true DE602004025136D1 (de) 2010-03-04

Family

ID=34467990

Family Applications (1)

Application Number Title Priority Date Filing Date
DE200460025136 Active DE602004025136D1 (de) 2003-10-16 2004-10-18 BESCHICHTUNGEN AUS M(n+1)AX(n)-MATERIAL FÜR ELEKTRISCHE KONTAKTELEMENTE

Country Status (6)

Country Link
US (1) US7786393B2 (de)
EP (1) EP1685626B1 (de)
CN (1) CN1868096B (de)
AT (1) ATE455379T1 (de)
DE (1) DE602004025136D1 (de)
WO (1) WO2005038985A2 (de)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE0402865L (sv) * 2004-11-04 2006-05-05 Sandvik Intellectual Property Belagd produkt och framställningsmetod för denna
SE0402904L (sv) * 2004-11-26 2006-05-27 Sandvik Intellectual Property Belagd produkt och produktionsmetod för denna
WO2006115451A1 (en) * 2005-04-25 2006-11-02 Impact Coatings Ab Smart card and smart card reader
EP1934995B1 (de) * 2005-07-15 2014-04-02 Impact Coatings AB (Publ.) Kontaktelement und kontaktanordnung
FR2901721B1 (fr) * 2006-05-30 2008-08-22 Commissariat Energie Atomique Poudres de phase max et procede de fabrication des dites poudres
US20080131686A1 (en) * 2006-12-05 2008-06-05 United Technologies Corporation Environmentally friendly wear resistant carbide coating
DE102007029683B4 (de) * 2007-06-27 2011-07-14 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 80686 Verfahren zur Messung von Zustandsgrößen an mechanischen Komponenten
KR100878872B1 (ko) * 2007-09-03 2009-01-15 성균관대학교산학협력단 나노결정 전도성 탄소층을 게이트 전극으로 포함하여 이루어진 유기 박막 트랜지스터, 이의 제조방법 및 이를 포함하여 이루어진 유기 반도체 소자
SE531749C2 (sv) * 2007-09-17 2009-07-28 Seco Tools Ab Metod att utfälla slitstarka skikt på hårdmetall med bågförångning och katod med Ti3SiC2 som huvudbeståndsdel
EP2223315B1 (de) * 2007-12-20 2016-10-05 Impact Coatings AB Leitfähiges element für umfangreiche ströme
CN102017254A (zh) * 2008-02-27 2011-04-13 因派科特涂料公司 具有涂层的电极、其制造方法和材料的用途
DE102009023191A1 (de) * 2009-05-29 2010-12-30 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Gehäuse mit einer Beschichtung
JP5544778B2 (ja) * 2009-08-05 2014-07-09 トヨタ自動車株式会社 オーミック電極およびその製造方法
WO2011123553A2 (en) * 2010-04-02 2011-10-06 Visa International Service Association Crack embossing using diamond technology
DE102011082593A1 (de) * 2011-09-13 2013-03-28 Siemens Aktiengesellschaft Schaltkontakt, Schalter und Relais und deren Herstellung
CN103204694B (zh) * 2013-04-03 2014-04-02 哈尔滨工业大学 一种采用Zr/Ni复合中间层扩散连接TiAl基合金和Ti3AlC2陶瓷的方法
EP2838166B1 (de) 2013-08-16 2019-09-25 Schleifring GmbH Schleifringanordnung und Komponenten davon
TWI539164B (zh) 2013-11-22 2016-06-21 財團法人工業技術研究院 塗佈探針及其製作方法
EP2944624A1 (de) * 2014-05-14 2015-11-18 Haldor Topsøe A/S MAX-Phasenmaterialien frei von den Elementen Al und Si
FR3032449B1 (fr) * 2015-02-09 2017-01-27 Office Nat D'etudes Et De Rech Aerospatiales (Onera) Materiaux en cermet et procede de fabrication de tels materiaux
US10199788B1 (en) 2015-05-28 2019-02-05 National Technology & Engineering Solutions Of Sandia, Llc Monolithic MAX phase ternary alloys for sliding electrical contacts
DE102016216428A1 (de) 2016-08-31 2018-03-01 Federal-Mogul Burscheid Gmbh Gleitelement mit MAX-Phasen-Beschichtung
US20200211590A1 (en) * 2016-09-06 2020-07-02 Universität Duisburg-Essen Heat assisted magnetic recording media with optimized heat sink layer
CN110541150B (zh) * 2019-08-22 2024-05-03 沈阳科友真空技术有限公司 一种干簧管继电器触点用多层膜结构及其制备方法
CN110911705A (zh) * 2019-11-20 2020-03-24 上海大学 燃料电池复合材料双极板上的Ti3SiC2涂层的制备方法
DE102019135459A1 (de) * 2019-12-20 2021-06-24 Deutsches Zentrum für Luft- und Raumfahrt e.V. Vorrichtung zur Unterbrechung eines elektrischen Kreises
US11728270B2 (en) 2020-07-27 2023-08-15 Samsung Electronics Co., Ltd. Semiconductor interconnect, electrode for semiconductor device, and method of preparing multielement compound thin film
CN114069360A (zh) * 2021-11-23 2022-02-18 江苏科技大学 轻型、高电导滑环及制备方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2188250Y (zh) * 1993-12-09 1995-01-25 中南工学院 弹性夹片经强化的电源插座
JPH10134869A (ja) * 1996-10-30 1998-05-22 Yazaki Corp 端子材料および端子
KR100385946B1 (ko) * 1999-12-08 2003-06-02 삼성전자주식회사 원자층 증착법을 이용한 금속층 형성방법 및 그 금속층을장벽금속층, 커패시터의 상부전극, 또는 하부전극으로구비한 반도체 소자
SE519921C2 (sv) * 1999-05-06 2003-04-29 Sandvik Ab PVD-belagt skärverktyg och metod för dess framställning
SE9904350D0 (sv) * 1999-11-30 1999-11-30 Abb Ab A contact element and a contact arrangement
US6544674B2 (en) * 2000-08-28 2003-04-08 Boston Microsystems, Inc. Stable electrical contact for silicon carbide devices
CN1261602C (zh) * 2001-03-29 2006-06-28 西安建筑科技大学 一种Cu－C电刷材料及其制造工艺
CN100439554C (zh) * 2001-11-30 2008-12-03 Abb股份有限公司 式Mn+1AXn化合物的合成方法,该化合物的膜及其用途
US6747291B1 (en) * 2003-01-10 2004-06-08 The United States Of America As Represented By The Secretary Of The Air Force Ohmic contacts on p-type silicon carbide using carbon films

Also Published As

Publication number Publication date
EP1685626B1 (de) 2010-01-13
WO2005038985A3 (en) 2005-06-16
WO2005038985B1 (en) 2005-07-28
ATE455379T1 (de) 2010-01-15
CN1868096B (zh) 2010-10-13
CN1868096A (zh) 2006-11-22
EP1685626A2 (de) 2006-08-02
US20070111031A1 (en) 2007-05-17
WO2005038985A2 (en) 2005-04-28
US7786393B2 (en) 2010-08-31

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