DE602004019562D1 - - Google Patents

Info

Publication number
DE602004019562D1
DE602004019562D1 DE602004019562T DE602004019562T DE602004019562D1 DE 602004019562 D1 DE602004019562 D1 DE 602004019562D1 DE 602004019562 T DE602004019562 T DE 602004019562T DE 602004019562 T DE602004019562 T DE 602004019562T DE 602004019562 D1 DE602004019562 D1 DE 602004019562D1
Authority
DE
Germany
Prior art keywords
current
under test
device under
shunt
booster
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602004019562T
Other languages
German (de)
English (en)
Inventor
Peter Cuevas
Gedaliahoo Krieger
Maurice Evans
Jens Ullmann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
QualiTau Inc
Original Assignee
QualiTau Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by QualiTau Inc filed Critical QualiTau Inc
Publication of DE602004019562D1 publication Critical patent/DE602004019562D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841—Signal generators

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Dc-Dc Converters (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Generation Of Surge Voltage And Current (AREA)
DE602004019562T 2003-12-10 2004-12-02 Expired - Lifetime DE602004019562D1 (enExample)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/734,002 US7049713B2 (en) 2003-12-10 2003-12-10 Pulsed current generator circuit with charge booster
PCT/US2004/040591 WO2005060568A2 (en) 2003-12-10 2004-12-02 Pulsed current generator circuit with charge booster

Publications (1)

Publication Number Publication Date
DE602004019562D1 true DE602004019562D1 (enExample) 2009-04-02

Family

ID=34653271

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004019562T Expired - Lifetime DE602004019562D1 (enExample) 2003-12-10 2004-12-02

Country Status (8)

Country Link
US (1) US7049713B2 (enExample)
EP (1) EP1692056B1 (enExample)
JP (1) JP4520998B2 (enExample)
CN (1) CN100550624C (enExample)
AT (1) ATE423324T1 (enExample)
DE (1) DE602004019562D1 (enExample)
TW (1) TWI342959B (enExample)
WO (1) WO2005060568A2 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7724017B2 (en) * 2006-08-31 2010-05-25 Keithley Instruments, Inc. Multi-channel pulse tester
EP2071342B1 (de) 2007-12-10 2009-11-25 Mtronix Precision Measuring Instruments Gmbh Vorrichtung und Verfahren zur Erzeugung eines definierten Ladungspulses zur Ausführung einer Teilentladungsmessung
TWI410642B (zh) * 2011-03-04 2013-10-01 Realtek Semiconductor Corp 電感偵測裝置與方法
US9088207B2 (en) * 2012-06-04 2015-07-21 Stangenes Industries, Inc. Long pulse droop compensator
US20170131326A1 (en) * 2015-11-10 2017-05-11 Qualitau, Inc. Pulsed current source with internal impedance matching
CN107493092B (zh) * 2017-08-18 2020-06-19 河海大学常州校区 大脉冲电流发生装置及其控制方法
US11705894B2 (en) * 2019-08-27 2023-07-18 Keithley Instruments, Llc Pulsed high current technique for characterization of device under test
WO2022027438A1 (en) * 2020-08-06 2022-02-10 Innoscience (Zhuhai) Technology Co., Ltd. Device and method for testing semiconductor devices
CN113109045B (zh) * 2021-03-11 2024-01-05 东风商用车有限公司 一种助力器总成的耐久试验方法
CN113098273B (zh) * 2021-04-25 2023-06-30 阳光电源股份有限公司 一种多输入Boost电路及其故障检测方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4362955A (en) * 1980-12-18 1982-12-07 Tektronix, Inc. Current boost circuit for a pulse generator output stage
US4434401A (en) * 1981-05-04 1984-02-28 Flight Systems, Inc. Apparatus for testing semiconductor devices and capacitors
DE3702680A1 (de) * 1986-02-18 1987-10-29 Bosch Gmbh Robert Verfahren und schaltung zur ansteuerung von elektromagnetischen verbrauchern
JPH0792492B2 (ja) * 1986-11-28 1995-10-09 日立電子エンジニアリング株式会社 電子デバイス駆動回路
JPS63187810A (ja) * 1987-01-30 1988-08-03 Hitachi Ltd 試験信号発生回路
JP2866750B2 (ja) * 1991-01-28 1999-03-08 三菱電機株式会社 半導体試験装置および半導体装置の試験方法
JPH102930A (ja) * 1996-06-18 1998-01-06 Hitachi Electron Eng Co Ltd Ｉｃテスタ
US6348802B1 (en) * 1998-04-10 2002-02-19 Electro Scientific Industries, Inc. Device for enhancing contact checking
JPH11330925A (ja) * 1998-05-19 1999-11-30 Maw:Kk 電流パルス発生装置
JP2000171493A (ja) * 1998-12-02 2000-06-23 Advantest Corp 電流測定方法及び電流測定装置
US6249137B1 (en) * 1999-10-14 2001-06-19 Qualitau, Inc. Circuit and method for pulsed reliability testing
IT1318238B1 (it) * 2000-07-25 2003-07-28 St Microelectronics Srl Circuito autoelevatore nei convertitori statici dc/dc.
JP2002139539A (ja) * 2000-10-30 2002-05-17 Advantest Corp 半導体デバイスの電源電流測定方法・電源電流測定装置
JP2004117100A (ja) * 2002-09-25 2004-04-15 Hitachi Ltd 半導体試験装置
JP4318511B2 (ja) * 2003-08-26 2009-08-26 三洋電機株式会社 昇圧回路

Also Published As

Publication number Publication date
TW200525162A (en) 2005-08-01
WO2005060568A3 (en) 2005-12-29
EP1692056B1 (en) 2009-02-18
EP1692056A2 (en) 2006-08-23
WO2005060568A2 (en) 2005-07-07
JP4520998B2 (ja) 2010-08-11
TWI342959B (en) 2011-06-01
JP2007523518A (ja) 2007-08-16
CN1914803A (zh) 2007-02-14
ATE423324T1 (de) 2009-03-15
CN100550624C (zh) 2009-10-14
US7049713B2 (en) 2006-05-23
US20050128655A1 (en) 2005-06-16
EP1692056A4 (en) 2007-01-24

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition