DE602004015557D1 - Ultraviolett-Quantentopf-Laserdioden auf Basis von Gruppe-III-Nitriden - Google Patents
Ultraviolett-Quantentopf-Laserdioden auf Basis von Gruppe-III-NitridenInfo
- Publication number
- DE602004015557D1 DE602004015557D1 DE602004015557T DE602004015557T DE602004015557D1 DE 602004015557 D1 DE602004015557 D1 DE 602004015557D1 DE 602004015557 T DE602004015557 T DE 602004015557T DE 602004015557 T DE602004015557 T DE 602004015557T DE 602004015557 D1 DE602004015557 D1 DE 602004015557D1
- Authority
- DE
- Germany
- Prior art keywords
- group iii
- quantum well
- laser diodes
- iii nitrides
- well laser
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34333—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer based on Ga(In)N or Ga(In)P, e.g. blue laser
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/2004—Confining in the direction perpendicular to the layer structure
- H01S5/2009—Confining in the direction perpendicular to the layer structure by using electron barrier layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/3407—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers characterised by special barrier layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/3408—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers characterised by specially shaped wells, e.g. triangular
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biophysics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Semiconductor Lasers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/736,643 US7138648B2 (en) | 2003-12-17 | 2003-12-17 | Ultraviolet group III-nitride-based quantum well laser diodes |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602004015557D1 true DE602004015557D1 (de) | 2008-09-18 |
Family
ID=34523127
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602004015557T Active DE602004015557D1 (de) | 2003-12-17 | 2004-11-29 | Ultraviolett-Quantentopf-Laserdioden auf Basis von Gruppe-III-Nitriden |
Country Status (4)
Country | Link |
---|---|
US (1) | US7138648B2 (de) |
EP (1) | EP1544968B1 (de) |
JP (1) | JP2005183964A (de) |
DE (1) | DE602004015557D1 (de) |
Families Citing this family (70)
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KR20050082251A (ko) * | 2004-02-18 | 2005-08-23 | 삼성전자주식회사 | 반도체 레이저 디바이스 |
US9524869B2 (en) | 2004-03-11 | 2016-12-20 | Epistar Corporation | Nitride-based semiconductor light-emitting device |
KR100513923B1 (ko) * | 2004-08-13 | 2005-09-08 | 재단법인서울대학교산학협력재단 | 질화물 반도체층을 성장시키는 방법 및 이를 이용하는 질화물 반도체 발광소자 |
PL211286B1 (pl) * | 2004-08-15 | 2012-04-30 | Inst Wysokich Ciśnień Polskiej Akademii Nauk | Azotkowa dioda laserowa i sposób wytwarzania azotkowej diody laserowej |
US7590161B1 (en) * | 2004-10-05 | 2009-09-15 | Photon Systems | Electron beam pumped semiconductor laser |
US8759791B1 (en) | 2004-10-05 | 2014-06-24 | Photon Systems, Inc. | Native fluorescence detection methods and detectors for naphthalene and/or other volatile organic compound vapors |
US9442070B1 (en) | 2004-10-05 | 2016-09-13 | Photon Systems, Inc. | Native fluorescence detection methods, devices, and systems for organic compounds |
US20060249741A1 (en) * | 2005-04-25 | 2006-11-09 | Cao Group, Inc. | GaN semiconductor devices with A1N buffer grown at high temperature and method for making the same |
JPWO2007026767A1 (ja) * | 2005-08-31 | 2009-03-12 | 国立大学法人京都大学 | 発光素子及びその製造方法 |
KR100742988B1 (ko) * | 2005-11-25 | 2007-07-26 | (주)더리즈 | p형 질화갈륨계 디바이스 제조방법 |
KR100735488B1 (ko) * | 2006-02-03 | 2007-07-04 | 삼성전기주식회사 | 질화갈륨계 발광다이오드 소자의 제조방법 |
JP2009527898A (ja) * | 2006-02-17 | 2009-07-30 | ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア | 半極性(Al、In、Ga、B)Nの光電子素子の成長方法 |
JP4872450B2 (ja) * | 2006-05-12 | 2012-02-08 | 日立電線株式会社 | 窒化物半導体発光素子 |
JP2008118037A (ja) * | 2006-11-07 | 2008-05-22 | Sumitomo Electric Ind Ltd | 面発光レーザ素子およびその製造方法、ならびに面発光レーザアレイおよびその製造方法 |
US8211723B2 (en) * | 2007-02-12 | 2012-07-03 | The Regents Of The University Of California | Al(x)Ga(1-x)N-cladding-free nonpolar III-nitride based laser diodes and light emitting diodes |
US20080219303A1 (en) * | 2007-03-02 | 2008-09-11 | Lucent Technologies Inc. | Color mixing light source and color control data system |
US7502160B2 (en) * | 2007-03-02 | 2009-03-10 | Alcatel-Lucent Usa Inc. | Speckle reduction in laser-projector images |
US7750286B2 (en) * | 2007-06-19 | 2010-07-06 | Alcatel-Lucent Usa Inc. | Compact image projector having a mirror for reflecting a beam received from a polarization beam splitter back to the polarization beam splitter |
KR101305786B1 (ko) * | 2007-06-21 | 2013-09-06 | 엘지이노텍 주식회사 | 질화물 반도체 발광소자 및 그 제조방법 |
JP2010536182A (ja) * | 2007-08-08 | 2010-11-25 | ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア | 長波長放射を有する非極性iii窒化物発光ダイオード |
DE102007044439B4 (de) | 2007-09-18 | 2022-03-24 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Optoelektronischer Halbleiterchip mit Quantentopfstruktur |
US7723719B2 (en) * | 2007-12-14 | 2010-05-25 | Palo Alto Research Center Incorporated | Light emitting devices with inhomogeneous quantum well active regions |
US20090184976A1 (en) * | 2008-01-22 | 2009-07-23 | Alcatel-Lucent | System and Method for Color-Compensating a Video Signal Having Reduced Computational Requirements |
US8247999B2 (en) * | 2008-01-22 | 2012-08-21 | Alcatel Lucent | Time division multiplexing a DC-to-DC voltage converter |
US8109638B2 (en) * | 2008-01-22 | 2012-02-07 | Alcatel Lucent | Diffuser configuration for an image projector |
US8129669B2 (en) * | 2008-01-22 | 2012-03-06 | Alcatel Lucent | System and method generating multi-color light for image display having a controller for temporally interleaving the first and second time intervals of directed first and second light beams |
US8659852B2 (en) | 2008-04-21 | 2014-02-25 | Seagate Technology Llc | Write-once magentic junction memory array |
US7852663B2 (en) | 2008-05-23 | 2010-12-14 | Seagate Technology Llc | Nonvolatile programmable logic gates and adders |
US7855911B2 (en) | 2008-05-23 | 2010-12-21 | Seagate Technology Llc | Reconfigurable magnetic logic device using spin torque |
US7881098B2 (en) | 2008-08-26 | 2011-02-01 | Seagate Technology Llc | Memory with separate read and write paths |
US7985994B2 (en) | 2008-09-29 | 2011-07-26 | Seagate Technology Llc | Flux-closed STRAM with electronically reflective insulative spacer |
US8169810B2 (en) | 2008-10-08 | 2012-05-01 | Seagate Technology Llc | Magnetic memory with asymmetric energy barrier |
US8039913B2 (en) | 2008-10-09 | 2011-10-18 | Seagate Technology Llc | Magnetic stack with laminated layer |
US8089132B2 (en) | 2008-10-09 | 2012-01-03 | Seagate Technology Llc | Magnetic memory with phonon glass electron crystal material |
CN101728451B (zh) * | 2008-10-21 | 2013-10-30 | 展晶科技(深圳)有限公司 | 半导体光电元件 |
US7852667B2 (en) * | 2008-10-27 | 2010-12-14 | Seagate Technology Llc | ST-RAM employing a magnetic resonant tunneling diode as a spacer layer |
US8045366B2 (en) | 2008-11-05 | 2011-10-25 | Seagate Technology Llc | STRAM with composite free magnetic element |
US8043732B2 (en) | 2008-11-11 | 2011-10-25 | Seagate Technology Llc | Memory cell with radial barrier |
US7826181B2 (en) | 2008-11-12 | 2010-11-02 | Seagate Technology Llc | Magnetic memory with porous non-conductive current confinement layer |
US8289756B2 (en) | 2008-11-25 | 2012-10-16 | Seagate Technology Llc | Non volatile memory including stabilizing structures |
US10753863B1 (en) | 2008-11-28 | 2020-08-25 | Photon Systems, Inc. | Spectroscopic chemical analysis methods and apparatus |
US10598596B1 (en) | 2008-11-28 | 2020-03-24 | Photon Systems, Inc. | Native fluorescence detection methods, devices, and systems for organic compounds |
US7826259B2 (en) | 2009-01-29 | 2010-11-02 | Seagate Technology Llc | Staggered STRAM cell |
DE102009015569B9 (de) | 2009-03-30 | 2023-06-29 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Optoelektronischer Halbleiterchip |
JP2010258096A (ja) * | 2009-04-22 | 2010-11-11 | Panasonic Electric Works Co Ltd | 窒化物半導体発光素子 |
US8226241B2 (en) * | 2009-05-15 | 2012-07-24 | Alcatel Lucent | Image projector employing a speckle-reducing laser source |
EP2452371A1 (de) * | 2009-07-09 | 2012-05-16 | The Regents of the University of California | Struktur zur verbesserung der spiegelfacetten-spaltsägeausbeute von (ga,al,in,b)n-laserdioden, die auf nicht polaren oder semipolaren (ga,al,in,b)n-substraten gezüchtet werden |
US7999338B2 (en) | 2009-07-13 | 2011-08-16 | Seagate Technology Llc | Magnetic stack having reference layers with orthogonal magnetization orientation directions |
CN101645471B (zh) * | 2009-09-07 | 2011-11-16 | 中国科学院微电子研究所 | 一种基于AlGaN的全波段紫外探测器及其制备方法 |
US20110234985A1 (en) * | 2010-03-26 | 2011-09-29 | Alcatel-Lucent Usa Inc. | Despeckling laser-image-projection system |
EP2667421A1 (de) | 2011-01-21 | 2013-11-27 | Panasonic Corporation | Lichtemittierendes halbleiterelement aus einer galliumnitridverbindung und mit besagtem lichtemittierenden element ausgerüstete lichtquelle |
JP5361925B2 (ja) * | 2011-03-08 | 2013-12-04 | 株式会社東芝 | 半導体発光素子およびその製造方法 |
US8742396B2 (en) * | 2012-01-13 | 2014-06-03 | Dowa Electronics Materials Co., Ltd. | III nitride epitaxial substrate and deep ultraviolet light emitting device using the same |
JP2014072431A (ja) | 2012-09-28 | 2014-04-21 | Fujitsu Ltd | 半導体装置 |
JP2014072426A (ja) | 2012-09-28 | 2014-04-21 | Fujitsu Ltd | 半導体装置及び半導体装置の製造方法 |
TWI524551B (zh) * | 2012-11-19 | 2016-03-01 | 新世紀光電股份有限公司 | 氮化物半導體結構及半導體發光元件 |
US10153394B2 (en) | 2012-11-19 | 2018-12-11 | Genesis Photonics Inc. | Semiconductor structure |
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JP5521068B1 (ja) * | 2013-01-30 | 2014-06-11 | Dowaエレクトロニクス株式会社 | Iii族窒化物半導体発光素子 |
JP2014229812A (ja) * | 2013-05-24 | 2014-12-08 | 住友電気工業株式会社 | 窒化物半導体発光素子 |
US9048387B2 (en) * | 2013-08-09 | 2015-06-02 | Qingdao Jason Electric Co., Ltd. | Light-emitting device with improved light extraction efficiency |
US20170069721A1 (en) | 2015-09-08 | 2017-03-09 | M/A-Com Technology Solutions Holdings, Inc. | Parasitic channel mitigation using silicon carbide diffusion barrier regions |
US9627473B2 (en) * | 2015-09-08 | 2017-04-18 | Macom Technology Solutions Holdings, Inc. | Parasitic channel mitigation in III-nitride material semiconductor structures |
TWI738640B (zh) | 2016-03-08 | 2021-09-11 | 新世紀光電股份有限公司 | 半導體結構 |
DE102016109022B4 (de) * | 2016-05-17 | 2021-02-18 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Laserdiodenchip |
DE102016111929A1 (de) * | 2016-06-29 | 2018-01-04 | Osram Opto Semiconductors Gmbh | Optoelektronischer Halbleiterkörper und Leuchtdiode |
TWI717386B (zh) | 2016-09-19 | 2021-02-01 | 新世紀光電股份有限公司 | 含氮半導體元件 |
US11038023B2 (en) | 2018-07-19 | 2021-06-15 | Macom Technology Solutions Holdings, Inc. | III-nitride material semiconductor structures on conductive silicon substrates |
US11448598B1 (en) | 2020-07-13 | 2022-09-20 | Photon Systems, Inc. | Methods and systems for detection of biohazard signatures in complex clinical and environmental samples |
CN114374146A (zh) * | 2020-10-15 | 2022-04-19 | 山东华光光电子股份有限公司 | 一种GaAs基915nm/976nm大功率双波长激光器外延片及其制备方法 |
Family Cites Families (13)
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JP2704181B2 (ja) * | 1989-02-13 | 1998-01-26 | 日本電信電話株式会社 | 化合物半導体単結晶薄膜の成長方法 |
JPH06310801A (ja) * | 1993-04-26 | 1994-11-04 | Yokogawa Electric Corp | 半導体レーザ |
JP3713100B2 (ja) * | 1996-05-23 | 2005-11-02 | ローム株式会社 | 半導体発光素子の製法 |
US5987048A (en) * | 1996-07-26 | 1999-11-16 | Kabushiki Kaisha Toshiba | Gallium nitride-based compound semiconductor laser and method of manufacturing the same |
US6121634A (en) * | 1997-02-21 | 2000-09-19 | Kabushiki Kaisha Toshiba | Nitride semiconductor light emitting device and its manufacturing method |
KR100447367B1 (ko) | 1997-03-07 | 2004-09-08 | 샤프 가부시키가이샤 | 다중 양자 웰 구조 활성층을 갖는 질화갈륨계 반도체 발광 소자 및 반도체 레이저 광원 장치 |
US6563850B1 (en) | 1997-10-06 | 2003-05-13 | Sharp Kabushiki Kaisha | Light-emitting device and fabricating method thereof |
US6841800B2 (en) * | 1997-12-26 | 2005-01-11 | Matsushita Electric Industrial Co., Ltd. | Light-emitting device comprising a gallium-nitride-group compound-semiconductor |
JP2000349393A (ja) * | 1999-03-26 | 2000-12-15 | Fuji Xerox Co Ltd | 半導体デバイス、面発光型半導体レーザ、及び端面発光型半導体レーザ |
US6389051B1 (en) * | 1999-04-09 | 2002-05-14 | Xerox Corporation | Structure and method for asymmetric waveguide nitride laser diode |
JP4030260B2 (ja) * | 1999-09-27 | 2008-01-09 | 三洋電機株式会社 | 半導体レーザ素子及びその製造方法 |
JP4161603B2 (ja) * | 2001-03-28 | 2008-10-08 | 日亜化学工業株式会社 | 窒化物半導体素子 |
JP2003163418A (ja) * | 2001-11-29 | 2003-06-06 | Nichia Chem Ind Ltd | 窒化ガリウム系化合物半導体レーザ |
-
2003
- 2003-12-17 US US10/736,643 patent/US7138648B2/en not_active Expired - Fee Related
-
2004
- 2004-11-29 DE DE602004015557T patent/DE602004015557D1/de active Active
- 2004-11-29 EP EP04028264A patent/EP1544968B1/de not_active Expired - Fee Related
- 2004-12-15 JP JP2004362206A patent/JP2005183964A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
EP1544968B1 (de) | 2008-08-06 |
US20050224781A1 (en) | 2005-10-13 |
EP1544968A3 (de) | 2005-11-23 |
EP1544968A2 (de) | 2005-06-22 |
US7138648B2 (en) | 2006-11-21 |
JP2005183964A (ja) | 2005-07-07 |
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Legal Events
Date | Code | Title | Description |
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8364 | No opposition during term of opposition |