DE602004001276D1 - System und Verfahren zur absoluten Positionierung mit wiederholtem Quasizufalls-Muster - Google Patents

System und Verfahren zur absoluten Positionierung mit wiederholtem Quasizufalls-Muster

Info

Publication number
DE602004001276D1
DE602004001276D1 DE602004001276T DE602004001276T DE602004001276D1 DE 602004001276 D1 DE602004001276 D1 DE 602004001276D1 DE 602004001276 T DE602004001276 T DE 602004001276T DE 602004001276 T DE602004001276 T DE 602004001276T DE 602004001276 D1 DE602004001276 D1 DE 602004001276D1
Authority
DE
Germany
Prior art keywords
random pattern
absolute positioning
quasi
repeated
repeated quasi
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602004001276T
Other languages
English (en)
Other versions
DE602004001276T2 (de
Inventor
Benjamin K Jones
Michael Nahum
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitutoyo Corp
Original Assignee
Mitutoyo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitutoyo Corp filed Critical Mitutoyo Corp
Publication of DE602004001276D1 publication Critical patent/DE602004001276D1/de
Application granted granted Critical
Publication of DE602004001276T2 publication Critical patent/DE602004001276T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
    • G01D5/244—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains
    • G01D5/245—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains using a variable number of pulses in a train
    • G01D5/2454—Encoders incorporating incremental and absolute signals
    • G01D5/2455—Encoders incorporating incremental and absolute signals with incremental and absolute tracks on the same encoder
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D2205/00—Indexing scheme relating to details of means for transferring or converting the output of a sensing member
    • G01D2205/90—Two-dimensional encoders, i.e. having one or two codes extending in two directions

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optical Transform (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE602004001276T 2003-05-02 2004-04-08 System und Verfahren zur absoluten Positionierung mit wiederholtem Quasizufalls-Muster Expired - Lifetime DE602004001276T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/427,921 US6937349B2 (en) 2003-05-02 2003-05-02 Systems and methods for absolute positioning using repeated quasi-random pattern
US427921 2003-05-02

Publications (2)

Publication Number Publication Date
DE602004001276D1 true DE602004001276D1 (de) 2006-08-03
DE602004001276T2 DE602004001276T2 (de) 2007-04-26

Family

ID=32990460

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004001276T Expired - Lifetime DE602004001276T2 (de) 2003-05-02 2004-04-08 System und Verfahren zur absoluten Positionierung mit wiederholtem Quasizufalls-Muster

Country Status (4)

Country Link
US (1) US6937349B2 (de)
EP (1) EP1473549B1 (de)
JP (1) JP4463612B2 (de)
DE (1) DE602004001276T2 (de)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007056777B4 (de) * 2007-11-23 2012-02-23 Deutsches Zentrum für Luft- und Raumfahrt e.V. Messverfahren und Messanordnung mit einem stochastischen Punktemuster sowie stochastisches Punktemuster zur Verwendung dabei
DE102010047444A1 (de) * 2010-10-04 2012-04-05 Audi Ag Verfahren zur Visualisierung von Maßabweichungen zwischen einer Ist- und Soll-Geometrie eines Bauteils

Families Citing this family (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4180497B2 (ja) * 2003-12-05 2008-11-12 富士通株式会社 コード種類判別方法、およびコード境界検出方法
GB0413827D0 (en) 2004-06-21 2004-07-21 Renishaw Plc Scale reading apparatus
US7085673B2 (en) * 2004-08-31 2006-08-01 Hewlett-Packard Development Company, L.P. Displacement estimation system and method
GB0428165D0 (en) * 2004-12-23 2005-01-26 Renishaw Plc Position measurement
JP4545580B2 (ja) * 2004-12-27 2010-09-15 株式会社ミツトヨ 面内方向変位計
US7400415B2 (en) * 2005-03-15 2008-07-15 Mitutoyo Corporation Operator interface apparatus and method for displacement transducer with selectable detector area
US7230727B2 (en) * 2005-04-22 2007-06-12 Agilent Technologies, Inc. System for sensing an absolute position in two dimensions using a target pattern
US7826063B2 (en) * 2005-04-29 2010-11-02 Zygo Corporation Compensation of effects of atmospheric perturbations in optical metrology
JP5002144B2 (ja) * 2005-09-30 2012-08-15 株式会社トプコン 三次元計測用投影装置及びシステム
DE102006010161B4 (de) * 2006-02-28 2010-04-08 Dr. Johannes Heidenhain Gmbh Codestruktur für eine Positionsmesseinrichtung und Positionsmesseinrichtung mit einer solchen Codestruktur
JP4772540B2 (ja) * 2006-03-10 2011-09-14 株式会社東芝 超音波診断装置
US7885480B2 (en) 2006-10-31 2011-02-08 Mitutoyo Corporation Correlation peak finding method for image correlation displacement sensing
EP2095065A4 (de) * 2006-11-15 2010-11-24 Zygo Corp Messsysteme für distanzmessungsinterferometer und kodierer für lithografiewerkzeug
US7894075B2 (en) * 2006-12-11 2011-02-22 Zygo Corporation Multiple-degree of freedom interferometer with compensation for gas effects
US7812965B2 (en) * 2006-12-11 2010-10-12 Zygo Corporation Multiple-degree of freedom interferometer with compensation for gas effects
JP2009097871A (ja) * 2007-10-12 2009-05-07 Sony Corp 部材所定位置の検出装置
US20100227687A1 (en) * 2009-03-05 2010-09-09 Vcat, Llc Random generated display associated with gaming device
US20100318550A1 (en) * 2009-05-26 2010-12-16 Nikon Corporation Image searching system, image searching apparatus, and medium storing image searching program
JP5779012B2 (ja) * 2011-06-24 2015-09-16 キヤノン株式会社 ２次元アブソリュートエンコーダ及びそのスケール
US20130001412A1 (en) * 2011-07-01 2013-01-03 Mitutoyo Corporation Optical encoder including passive readhead with remote contactless excitation and signal sensing
WO2013172561A2 (ko) 2012-05-15 2013-11-21 한국표준과학연구원 절대 위치 측정 방법, 절대 위치 측정 장치, 및 스케일
KR101328996B1 (ko) 2012-10-15 2013-11-13 한국표준과학연구원 절대 위치 측정 방법, 절대 위치 측정 장치, 및 이진 스케일
KR101244145B1 (ko) * 2012-07-13 2013-03-15 이상용 위치 제어 엔코딩 장치에서의 위치 제어 엔코딩 방법
JP6099908B2 (ja) 2012-09-13 2017-03-22 キヤノン株式会社 ２次元アブソリュートエンコーダおよびスケール
US20140208201A1 (en) * 2013-01-22 2014-07-24 International Business Machines Corporation Image Obfuscation in Web Content
KR101417654B1 (ko) 2013-06-25 2014-07-10 강신준 광원의 반사광을 이용하는 엔코더
US9483816B2 (en) 2013-09-03 2016-11-01 Litel Instruments Method and system for high accuracy and reliability registration of multi modal imagery
US9903719B2 (en) 2013-09-03 2018-02-27 Litel Instruments System and method for advanced navigation
EP3096346A4 (de) 2014-01-16 2017-09-27 Nikon Corporation Belichtungsvorrichtung, belichtungsverfahren und vorrichtungsherstellungsverfahren
EP3139132B1 (de) 2015-09-03 2020-02-19 Hexagon Technology Center GmbH Flächen-absolutcodierung
JP6908357B2 (ja) * 2016-06-21 2021-07-28 株式会社ミツトヨ 位置特定装置及び位置特定方法
JP7103664B2 (ja) * 2016-11-02 2022-07-20 プレシラブズ エスエー 検出装置、位置決めコード、および位置検出方法
JP6878908B2 (ja) 2017-01-23 2021-06-02 セイコーエプソン株式会社 エンコーダー、ロボットおよびプリンター
JP2018185251A (ja) 2017-04-27 2018-11-22 セイコーエプソン株式会社 ロボットおよびプリンター
DE102017113615A1 (de) * 2017-06-20 2018-12-20 Carl Zeiss Smt Gmbh System, Verfahren und Marker zur Positionsbestimmung eines beweglichen Objektes im Raum
US10713385B2 (en) * 2018-07-03 2020-07-14 International Business Machines Corporation Position data pseudonymization
US10871366B2 (en) 2018-08-16 2020-12-22 Mitutoyo Corporation Supplementary metrology position coordinates determination system for use with a robot
US11745354B2 (en) 2018-08-16 2023-09-05 Mitutoyo Corporation Supplementary metrology position coordinates determination system including an alignment sensor for use with a robot
US11002529B2 (en) 2018-08-16 2021-05-11 Mitutoyo Corporation Robot system with supplementary metrology position determination system
US10751883B2 (en) 2018-08-16 2020-08-25 Mitutoyo Corporation Robot system with supplementary metrology position coordinates determination system
US10913156B2 (en) * 2018-09-24 2021-02-09 Mitutoyo Corporation Robot system with end tool metrology position coordinates determination system
DE102018131000A1 (de) * 2018-12-05 2020-06-10 Lufthansa Technik Aktiengesellschaft Optisches Positionsbestimmungs- und Identifikationssystem
JP2022065646A (ja) 2020-10-15 2022-04-27 株式会社ミツトヨ 補足計測位置決定システムを用いたロボットシステム

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4967093A (en) * 1988-06-22 1990-10-30 Hamamatsu Photonics Kabushiki Kaisha Deformation measuring method and device using cross-correlation function between speckle patterns with reference data renewal
US5198869A (en) * 1990-10-15 1993-03-30 Vlsi Standards, Inc. Reference wafer for haze calibration
US5104225A (en) 1991-01-25 1992-04-14 Mitutoyo Corporation Position detector and method of measuring position
US6677948B1 (en) * 1999-06-14 2004-01-13 Mitutoyo Corporation Systems and methods for multi-resolution image defocusing
GB9926574D0 (en) 1999-11-11 2000-01-12 Renishaw Plc Absolute position measurement
US6642506B1 (en) * 2000-06-01 2003-11-04 Mitutoyo Corporation Speckle-image-based optical position transducer having improved mounting and directional sensitivities
US6873422B2 (en) * 2000-12-08 2005-03-29 Mitutoyo Corporation Systems and methods for high-accuracy displacement determination in a correlation based position transducer
US6781694B2 (en) 2002-07-16 2004-08-24 Mitutoyo Corporation Two-dimensional scale structures and method usable in an absolute position transducer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007056777B4 (de) * 2007-11-23 2012-02-23 Deutsches Zentrum für Luft- und Raumfahrt e.V. Messverfahren und Messanordnung mit einem stochastischen Punktemuster sowie stochastisches Punktemuster zur Verwendung dabei
DE102010047444A1 (de) * 2010-10-04 2012-04-05 Audi Ag Verfahren zur Visualisierung von Maßabweichungen zwischen einer Ist- und Soll-Geometrie eines Bauteils

Also Published As

Publication number Publication date
US6937349B2 (en) 2005-08-30
JP2004333498A (ja) 2004-11-25
DE602004001276T2 (de) 2007-04-26
US20040218181A1 (en) 2004-11-04
EP1473549A1 (de) 2004-11-03
JP4463612B2 (ja) 2010-05-19
EP1473549B1 (de) 2006-06-21

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