DE60128420D1 - Beobachtungsverfahren für ein optisches Mikroskop mit konvergentem Beleuchtungsstrahl - Google Patents

Beobachtungsverfahren für ein optisches Mikroskop mit konvergentem Beleuchtungsstrahl

Info

Publication number
DE60128420D1
DE60128420D1 DE60128420T DE60128420T DE60128420D1 DE 60128420 D1 DE60128420 D1 DE 60128420D1 DE 60128420 T DE60128420 T DE 60128420T DE 60128420 T DE60128420 T DE 60128420T DE 60128420 D1 DE60128420 D1 DE 60128420D1
Authority
DE
Germany
Prior art keywords
optical microscope
illumination beam
observation method
beam optical
convergent illumination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60128420T
Other languages
English (en)
Other versions
DE60128420T2 (de
Inventor
Masao Minobe
Noburu Shiraga
Shinya Utsumi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Chemical Co Ltd
Original Assignee
Sumitomo Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Chemical Co Ltd filed Critical Sumitomo Chemical Co Ltd
Application granted granted Critical
Publication of DE60128420D1 publication Critical patent/DE60128420D1/de
Publication of DE60128420T2 publication Critical patent/DE60128420T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens
    • G02B21/08Condensers
    • G02B21/14Condensers affording illumination for phase-contrast observation
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens
    • G02B21/08Condensers
    • G02B21/086Condensers for transillumination only
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G02B27/46Systems using spatial filters

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE60128420T 2000-03-17 2001-03-19 Beobachtungsverfahren für ein optisches Mikroskop mit konvergentem Beleuchtungsstrahl Expired - Lifetime DE60128420T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2000076454A JP3544914B2 (ja) 2000-03-17 2000-03-17 光学顕微鏡装置および顕微鏡観察方法。
JP2000076454 2000-03-17

Publications (2)

Publication Number Publication Date
DE60128420D1 true DE60128420D1 (de) 2007-06-28
DE60128420T2 DE60128420T2 (de) 2007-09-06

Family

ID=18594192

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60128420T Expired - Lifetime DE60128420T2 (de) 2000-03-17 2001-03-19 Beobachtungsverfahren für ein optisches Mikroskop mit konvergentem Beleuchtungsstrahl

Country Status (4)

Country Link
US (1) US7304791B2 (de)
EP (1) EP1139140B1 (de)
JP (1) JP3544914B2 (de)
DE (1) DE60128420T2 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8198105B2 (en) * 2003-07-30 2012-06-12 Texas Instruments Incorporated Monitor for variation of critical dimensions (CDs) of reticles
DE102006011615A1 (de) * 2006-03-14 2007-09-20 Carl Zeiss Nts Gmbh Phasenkontrast-Elektronenmikroskop
JP4851871B2 (ja) * 2006-07-05 2012-01-11 住友化学株式会社 光学顕微鏡装置及び顕微鏡観察方法
US9232117B2 (en) * 2013-03-12 2016-01-05 Metrolaser, Inc. Digital Schlieren imaging
JP6704049B2 (ja) * 2016-07-11 2020-06-03 オリンパス株式会社 観察装置および標本観察方法
WO2021193177A1 (ja) * 2020-03-27 2021-09-30 ソニーグループ株式会社 顕微鏡システム、撮像方法、および撮像装置
CN112596222A (zh) * 2020-12-03 2021-04-02 崔亚君 一种单、双折射性植物组织共同显像的显微拍摄方法
CN112965261B (zh) * 2021-02-23 2022-10-28 山东仕达思生物产业有限公司 一种快速有效的基于机器视觉的智能校正显微镜光轴的方法及其实现系统

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US421036A (en) * 1890-02-11 weaver
US2601175A (en) * 1947-08-05 1952-06-17 Smith Francis Hughes Interference microscope
PL68411A6 (de) * 1969-05-26 1973-02-28
US3646608A (en) * 1969-06-10 1972-02-29 Raytheon Co Phase contrast microscope illuminator
US3947123A (en) * 1974-05-13 1976-03-30 The Board Of Regents Of The University Of Washington Coherent optical analyzer
NL7509671A (nl) * 1975-08-14 1977-02-16 Philips Nv Lichtmicroscoop.
US4255014A (en) * 1977-07-20 1981-03-10 Research Corporation Edge enhancement of phase phenomena
US4213036A (en) * 1977-12-27 1980-07-15 Grumman Aerospace Corporation Method for classifying biological cells
US4947413A (en) * 1988-07-26 1990-08-07 At&T Bell Laboratories Resolution doubling lithography technique
JPH0426812A (ja) * 1990-05-22 1992-01-30 Olympus Optical Co Ltd 偏光観察装置
JP3014158B2 (ja) * 1991-03-28 2000-02-28 オリンパス光学工業株式会社 実体顕微鏡
US5305139A (en) * 1991-04-19 1994-04-19 Unimat (Usa) Corporation, Formerly United Holdings, Inc. Illumination system and method for a high definition 3-D light microscope
US5592328A (en) * 1991-04-19 1997-01-07 Edge Scientific Instrument Company Llc Illumination system and method for a high definition light microscope
DE69224514T2 (de) * 1992-03-23 1998-06-18 Erland Torbjoern Sandstroem Verfahren und Vorrichtung zur Erzeugung eines Bildes
JP2588473B2 (ja) 1994-02-18 1997-03-05 株式会社城東アンカー 壁つなぎ
JPH07244241A (ja) 1994-03-04 1995-09-19 Nippon Telegr & Teleph Corp <Ntt> 光学顕微鏡における凹凸強調観察法及び光学顕微鏡
AU6711294A (en) 1994-04-21 1995-11-16 Edge Scientific Instrument Corporation Illumination system and method for a high definition light microscope
US5684626A (en) * 1994-10-25 1997-11-04 Edge Scientific Instrument Company Llc Center masking illumination system and method
US6043475A (en) * 1996-04-16 2000-03-28 Olympus Optical Co., Ltd. Focal point adjustment apparatus and method applied to microscopes
IL118130A (en) * 1996-05-03 1998-10-30 Yeda Res & Dev Apparatus and method for scanning laser microscopy
US5854710A (en) * 1996-09-09 1998-12-29 University Of Massachusetts Optical fourier processing
JP3708246B2 (ja) 1996-09-19 2005-10-19 オリンパス株式会社 光制御部材を有する光学顕微鏡
CN1145820C (zh) * 1997-08-29 2004-04-14 奥林巴斯光学工业株式会社 显微镜透过明视野照明装置
JP3886619B2 (ja) * 1997-10-16 2007-02-28 住友化学株式会社 物体の欠陥の検査方法および検査装置
CA2342868C (en) * 1998-09-02 2009-01-06 W. Barry Piekos Method and apparatus for producing diffracted-light contrast enhancement in microscopes

Also Published As

Publication number Publication date
EP1139140A3 (de) 2004-03-24
EP1139140A2 (de) 2001-10-04
DE60128420T2 (de) 2007-09-06
JP3544914B2 (ja) 2004-07-21
US7304791B2 (en) 2007-12-04
EP1139140B1 (de) 2007-05-16
US20030043458A1 (en) 2003-03-06
JP2001264638A (ja) 2001-09-26

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