DE60128420D1 - Beobachtungsverfahren für ein optisches Mikroskop mit konvergentem Beleuchtungsstrahl - Google Patents
Beobachtungsverfahren für ein optisches Mikroskop mit konvergentem BeleuchtungsstrahlInfo
- Publication number
- DE60128420D1 DE60128420D1 DE60128420T DE60128420T DE60128420D1 DE 60128420 D1 DE60128420 D1 DE 60128420D1 DE 60128420 T DE60128420 T DE 60128420T DE 60128420 T DE60128420 T DE 60128420T DE 60128420 D1 DE60128420 D1 DE 60128420D1
- Authority
- DE
- Germany
- Prior art keywords
- optical microscope
- illumination beam
- observation method
- beam optical
- convergent illumination
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
- G02B21/08—Condensers
- G02B21/14—Condensers affording illumination for phase-contrast observation
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
- G02B21/08—Condensers
- G02B21/086—Condensers for transillumination only
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/46—Systems using spatial filters
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Microscoopes, Condenser (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000076454A JP3544914B2 (ja) | 2000-03-17 | 2000-03-17 | 光学顕微鏡装置および顕微鏡観察方法。 |
JP2000076454 | 2000-03-17 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60128420D1 true DE60128420D1 (de) | 2007-06-28 |
DE60128420T2 DE60128420T2 (de) | 2007-09-06 |
Family
ID=18594192
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60128420T Expired - Lifetime DE60128420T2 (de) | 2000-03-17 | 2001-03-19 | Beobachtungsverfahren für ein optisches Mikroskop mit konvergentem Beleuchtungsstrahl |
Country Status (4)
Country | Link |
---|---|
US (1) | US7304791B2 (de) |
EP (1) | EP1139140B1 (de) |
JP (1) | JP3544914B2 (de) |
DE (1) | DE60128420T2 (de) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8198105B2 (en) * | 2003-07-30 | 2012-06-12 | Texas Instruments Incorporated | Monitor for variation of critical dimensions (CDs) of reticles |
DE102006011615A1 (de) * | 2006-03-14 | 2007-09-20 | Carl Zeiss Nts Gmbh | Phasenkontrast-Elektronenmikroskop |
JP4851871B2 (ja) * | 2006-07-05 | 2012-01-11 | 住友化学株式会社 | 光学顕微鏡装置及び顕微鏡観察方法 |
US9232117B2 (en) * | 2013-03-12 | 2016-01-05 | Metrolaser, Inc. | Digital Schlieren imaging |
JP6704049B2 (ja) * | 2016-07-11 | 2020-06-03 | オリンパス株式会社 | 観察装置および標本観察方法 |
WO2021193177A1 (ja) * | 2020-03-27 | 2021-09-30 | ソニーグループ株式会社 | 顕微鏡システム、撮像方法、および撮像装置 |
CN112596222A (zh) * | 2020-12-03 | 2021-04-02 | 崔亚君 | 一种单、双折射性植物组织共同显像的显微拍摄方法 |
CN112965261B (zh) * | 2021-02-23 | 2022-10-28 | 山东仕达思生物产业有限公司 | 一种快速有效的基于机器视觉的智能校正显微镜光轴的方法及其实现系统 |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US421036A (en) * | 1890-02-11 | weaver | ||
US2601175A (en) * | 1947-08-05 | 1952-06-17 | Smith Francis Hughes | Interference microscope |
PL68411A6 (de) * | 1969-05-26 | 1973-02-28 | ||
US3646608A (en) * | 1969-06-10 | 1972-02-29 | Raytheon Co | Phase contrast microscope illuminator |
US3947123A (en) * | 1974-05-13 | 1976-03-30 | The Board Of Regents Of The University Of Washington | Coherent optical analyzer |
NL7509671A (nl) * | 1975-08-14 | 1977-02-16 | Philips Nv | Lichtmicroscoop. |
US4255014A (en) * | 1977-07-20 | 1981-03-10 | Research Corporation | Edge enhancement of phase phenomena |
US4213036A (en) * | 1977-12-27 | 1980-07-15 | Grumman Aerospace Corporation | Method for classifying biological cells |
US4947413A (en) * | 1988-07-26 | 1990-08-07 | At&T Bell Laboratories | Resolution doubling lithography technique |
JPH0426812A (ja) * | 1990-05-22 | 1992-01-30 | Olympus Optical Co Ltd | 偏光観察装置 |
JP3014158B2 (ja) * | 1991-03-28 | 2000-02-28 | オリンパス光学工業株式会社 | 実体顕微鏡 |
US5305139A (en) * | 1991-04-19 | 1994-04-19 | Unimat (Usa) Corporation, Formerly United Holdings, Inc. | Illumination system and method for a high definition 3-D light microscope |
US5592328A (en) * | 1991-04-19 | 1997-01-07 | Edge Scientific Instrument Company Llc | Illumination system and method for a high definition light microscope |
DE69224514T2 (de) * | 1992-03-23 | 1998-06-18 | Erland Torbjoern Sandstroem | Verfahren und Vorrichtung zur Erzeugung eines Bildes |
JP2588473B2 (ja) | 1994-02-18 | 1997-03-05 | 株式会社城東アンカー | 壁つなぎ |
JPH07244241A (ja) | 1994-03-04 | 1995-09-19 | Nippon Telegr & Teleph Corp <Ntt> | 光学顕微鏡における凹凸強調観察法及び光学顕微鏡 |
AU6711294A (en) | 1994-04-21 | 1995-11-16 | Edge Scientific Instrument Corporation | Illumination system and method for a high definition light microscope |
US5684626A (en) * | 1994-10-25 | 1997-11-04 | Edge Scientific Instrument Company Llc | Center masking illumination system and method |
US6043475A (en) * | 1996-04-16 | 2000-03-28 | Olympus Optical Co., Ltd. | Focal point adjustment apparatus and method applied to microscopes |
IL118130A (en) * | 1996-05-03 | 1998-10-30 | Yeda Res & Dev | Apparatus and method for scanning laser microscopy |
US5854710A (en) * | 1996-09-09 | 1998-12-29 | University Of Massachusetts | Optical fourier processing |
JP3708246B2 (ja) | 1996-09-19 | 2005-10-19 | オリンパス株式会社 | 光制御部材を有する光学顕微鏡 |
CN1145820C (zh) * | 1997-08-29 | 2004-04-14 | 奥林巴斯光学工业株式会社 | 显微镜透过明视野照明装置 |
JP3886619B2 (ja) * | 1997-10-16 | 2007-02-28 | 住友化学株式会社 | 物体の欠陥の検査方法および検査装置 |
CA2342868C (en) * | 1998-09-02 | 2009-01-06 | W. Barry Piekos | Method and apparatus for producing diffracted-light contrast enhancement in microscopes |
-
2000
- 2000-03-17 JP JP2000076454A patent/JP3544914B2/ja not_active Expired - Fee Related
-
2001
- 2001-03-19 US US09/810,523 patent/US7304791B2/en not_active Expired - Fee Related
- 2001-03-19 EP EP01106833A patent/EP1139140B1/de not_active Expired - Lifetime
- 2001-03-19 DE DE60128420T patent/DE60128420T2/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP1139140A3 (de) | 2004-03-24 |
EP1139140A2 (de) | 2001-10-04 |
DE60128420T2 (de) | 2007-09-06 |
JP3544914B2 (ja) | 2004-07-21 |
US7304791B2 (en) | 2007-12-04 |
EP1139140B1 (de) | 2007-05-16 |
US20030043458A1 (en) | 2003-03-06 |
JP2001264638A (ja) | 2001-09-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |