DE60035586D1 - Empfindlichkeiterhöhung eines bildsensors mittels fluoreszierenden phosphor - Google Patents

Empfindlichkeiterhöhung eines bildsensors mittels fluoreszierenden phosphor

Info

Publication number
DE60035586D1
DE60035586D1 DE60035586T DE60035586T DE60035586D1 DE 60035586 D1 DE60035586 D1 DE 60035586D1 DE 60035586 T DE60035586 T DE 60035586T DE 60035586 T DE60035586 T DE 60035586T DE 60035586 D1 DE60035586 D1 DE 60035586D1
Authority
DE
Germany
Prior art keywords
image sensor
sensitivity increase
phosphorus
fluorescent
fluorescent phosphorus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60035586T
Other languages
English (en)
Other versions
DE60035586T2 (de
Inventor
Lawrence A Booth
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Intel Corp
Original Assignee
Intel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp filed Critical Intel Corp
Publication of DE60035586D1 publication Critical patent/DE60035586D1/de
Application granted granted Critical
Publication of DE60035586T2 publication Critical patent/DE60035586T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/1462—Coatings
    • H01L27/14621—Colour filter arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14625—Optical elements or arrangements associated with the device
    • H01L27/14627—Microlenses
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H01L27/14645—Colour imagers
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Signal Processing (AREA)
  • Multimedia (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
DE60035586T 1999-06-02 2000-05-17 Empfindlichkeiterhöhung eines bildsensors mittels fluoreszierenden phosphor Expired - Fee Related DE60035586T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US325005 1999-06-02
US09/325,005 US6597398B1 (en) 1999-06-02 1999-06-02 Image sensor response enhancement using fluorescent phosphors
PCT/US2000/013718 WO2000074140A1 (en) 1999-06-02 2000-05-17 Image sensor response enhancement using fluorescent phosphors

Publications (2)

Publication Number Publication Date
DE60035586D1 true DE60035586D1 (de) 2007-08-30
DE60035586T2 DE60035586T2 (de) 2008-04-17

Family

ID=23266043

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60035586T Expired - Fee Related DE60035586T2 (de) 1999-06-02 2000-05-17 Empfindlichkeiterhöhung eines bildsensors mittels fluoreszierenden phosphor

Country Status (9)

Country Link
US (1) US6597398B1 (de)
EP (1) EP1183733B1 (de)
JP (1) JP4426139B2 (de)
KR (1) KR20020059254A (de)
AU (1) AU4857200A (de)
CA (1) CA2373595C (de)
DE (1) DE60035586T2 (de)
TW (1) TW492256B (de)
WO (1) WO2000074140A1 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE60008877T2 (de) * 2000-10-13 2005-03-03 Applied Scintillation Technologies Ltd. Infrarotkamera mit phosphorbeschichteten CCD
US7139028B2 (en) * 2000-10-17 2006-11-21 Canon Kabushiki Kaisha Image pickup apparatus
TWI229539B (en) * 2003-02-27 2005-03-11 Elecvision Inc Small image sensing device and image sensing element thereof
US7277602B1 (en) * 2003-03-17 2007-10-02 Biomorphic Vlsi, Inc. Method and system for pixel bus signaling in CMOS image sensors
JP4950541B2 (ja) * 2006-04-05 2012-06-13 キヤノン株式会社 固体撮像素子
US7541596B2 (en) * 2006-07-05 2009-06-02 Omnivision Technologies, Inc. Method and apparatus for increasing light absorption in an image sensor using energy conversion layer
US20080074505A1 (en) * 2006-07-26 2008-03-27 Intematix Corporation Phosphors for enhancing sensor responsivity in short wavelength regions of the visible spectrum
US7830434B2 (en) * 2006-08-16 2010-11-09 Intematix Corporation Semiconductor color image sensor responsive at shorter wavelengths
TW200915551A (en) * 2007-05-10 2009-04-01 Koninkl Philips Electronics Nv Spectrum detector and manufacturing method therefore
DE102007053307A1 (de) * 2007-11-08 2009-05-14 Robert Bosch Gmbh Kamera zur Erfassung eines Fahrzeugumfeldes
CN102341716A (zh) * 2009-03-01 2012-02-01 拓科学股份有限公司 利用固态光源的高速量子效率测量装置
KR101686079B1 (ko) * 2010-12-27 2016-12-13 삼성전자주식회사 깊이 영상 생성 장치 및 방법
US9635325B2 (en) * 2015-05-29 2017-04-25 Semiconductor Components Industries, Llc Systems and methods for detecting ultraviolet light using image sensors
EP3270125A1 (de) * 2016-07-12 2018-01-17 ams AG Optischer sensor, spektrometer und verfahren für ein spektrometer
US11061119B2 (en) * 2018-10-10 2021-07-13 Sensors Unlimited, Inc. Pixels for time of flight (TOF) imaging
US20220052090A1 (en) * 2020-08-17 2022-02-17 Au Optronics Corporation Sensing device

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4603259A (en) * 1983-04-08 1986-07-29 General Electric Company X-ray image converter devices using rare earth oxyhalide phosphors
JPH02276996A (ja) * 1989-04-18 1990-11-13 Seiko Instr Inc Ｘ線イメージセンサー
JPH04322467A (ja) 1991-04-22 1992-11-12 Olympus Optical Co Ltd 固体撮像装置
JPH04326763A (ja) 1991-04-26 1992-11-16 Olympus Optical Co Ltd 固体撮像装置
JPH06205768A (ja) * 1992-08-18 1994-07-26 Philips Electron Nv Ｘ線検査装置
EP0656555B1 (de) * 1993-12-01 2003-03-19 Sharp Kabushiki Kaisha Display für dreidimensionale Bilder
US5631704A (en) * 1994-10-14 1997-05-20 Lucent Technologies, Inc. Active pixel sensor and imaging system having differential mode
EP0878007B1 (de) 1996-01-22 2005-05-11 California Institute Of Technology Aktive bildelementsensormatrix mit elektronischer überblendung
US5990506A (en) * 1996-03-20 1999-11-23 California Institute Of Technology Active pixel sensors with substantially planarized color filtering elements
JPH10149776A (ja) * 1996-11-18 1998-06-02 Kasei Optonix Co Ltd プラズマディスプレイ用蛍光膜
JP3003597B2 (ja) * 1996-11-18 2000-01-31 日本電気株式会社 固体撮像素子
US5976411A (en) * 1997-12-16 1999-11-02 M.A. Hannacolor Laser marking of phosphorescent plastic articles
US6208393B1 (en) * 1998-09-30 2001-03-27 Intel Corporation Liquid crystal color filter with integrated infrared blocking

Also Published As

Publication number Publication date
US6597398B1 (en) 2003-07-22
CA2373595A1 (en) 2000-12-07
EP1183733B1 (de) 2007-07-18
AU4857200A (en) 2000-12-18
WO2000074140A1 (en) 2000-12-07
TW492256B (en) 2002-06-21
KR20020059254A (ko) 2002-07-12
CA2373595C (en) 2006-01-10
JP2003529955A (ja) 2003-10-07
DE60035586T2 (de) 2008-04-17
JP4426139B2 (ja) 2010-03-03
EP1183733A1 (de) 2002-03-06
US20030133029A1 (en) 2003-07-17

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: HEYER, V., DIPL.-PHYS. DR.RER.NAT., PAT.-ANW., 806

8339 Ceased/non-payment of the annual fee