DE60031876D1 - Verfahren und vorrichtung zur entfernung des verschiebestroms aus strommessungen in einem plasmabehandlungssystem - Google Patents

Verfahren und vorrichtung zur entfernung des verschiebestroms aus strommessungen in einem plasmabehandlungssystem

Info

Publication number
DE60031876D1
DE60031876D1 DE60031876T DE60031876T DE60031876D1 DE 60031876 D1 DE60031876 D1 DE 60031876D1 DE 60031876 T DE60031876 T DE 60031876T DE 60031876 T DE60031876 T DE 60031876T DE 60031876 D1 DE60031876 D1 DE 60031876D1
Authority
DE
Germany
Prior art keywords
measurements
treatment system
plasma treatment
shifting current
shifting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60031876T
Other languages
English (en)
Inventor
J Goeckner
Wagoner E Van
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Varian Semiconductor Equipment Associates Inc
Original Assignee
Varian Semiconductor Equipment Associates Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Varian Semiconductor Equipment Associates Inc filed Critical Varian Semiconductor Equipment Associates Inc
Application granted granted Critical
Publication of DE60031876D1 publication Critical patent/DE60031876D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32412—Plasma immersion ion implantation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
    • G01R19/0061—Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents; Measuring in plasmas
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32917—Plasma diagnostics
    • H01J37/32935—Monitoring and controlling tubes by information coming from the object and/or discharge
DE60031876T 1999-10-27 2000-09-20 Verfahren und vorrichtung zur entfernung des verschiebestroms aus strommessungen in einem plasmabehandlungssystem Expired - Lifetime DE60031876D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/428,264 US6433553B1 (en) 1999-10-27 1999-10-27 Method and apparatus for eliminating displacement current from current measurements in a plasma processing system
PCT/US2000/025750 WO2001031681A1 (en) 1999-10-27 2000-09-20 Method and apparatus for eliminating displacement current from current measurements in a plasma processing system

Publications (1)

Publication Number Publication Date
DE60031876D1 true DE60031876D1 (de) 2006-12-28

Family

ID=23698172

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60031876T Expired - Lifetime DE60031876D1 (de) 1999-10-27 2000-09-20 Verfahren und vorrichtung zur entfernung des verschiebestroms aus strommessungen in einem plasmabehandlungssystem

Country Status (7)

Country Link
US (1) US6433553B1 (de)
EP (1) EP1224684B1 (de)
JP (1) JP4817574B2 (de)
KR (1) KR100631443B1 (de)
DE (1) DE60031876D1 (de)
TW (1) TW490704B (de)
WO (1) WO2001031681A1 (de)

Families Citing this family (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6868289B2 (en) * 2002-10-02 2005-03-15 Standen Ltd. Apparatus for treating a tumor or the like and articles incorporating the apparatus for treatment of the tumor
US6939434B2 (en) 2000-08-11 2005-09-06 Applied Materials, Inc. Externally excited torroidal plasma source with magnetic control of ion distribution
US7037813B2 (en) * 2000-08-11 2006-05-02 Applied Materials, Inc. Plasma immersion ion implantation process using a capacitively coupled plasma source having low dissociation and low minimum plasma voltage
US7094316B1 (en) 2000-08-11 2006-08-22 Applied Materials, Inc. Externally excited torroidal plasma source
US7430984B2 (en) * 2000-08-11 2008-10-07 Applied Materials, Inc. Method to drive spatially separate resonant structure with spatially distinct plasma secondaries using a single generator and switching elements
US7137354B2 (en) * 2000-08-11 2006-11-21 Applied Materials, Inc. Plasma immersion ion implantation apparatus including a plasma source having low dissociation and low minimum plasma voltage
US6518113B1 (en) * 2001-02-06 2003-02-11 Advanced Micro Devices, Inc. Doping of thin amorphous silicon work function control layers of MOS gate electrodes
US6714033B1 (en) * 2001-07-11 2004-03-30 Lam Research Corporation Probe for direct wafer potential measurements
US6774569B2 (en) * 2002-07-11 2004-08-10 Fuji Photo Film B.V. Apparatus for producing and sustaining a glow discharge plasma under atmospheric conditions
US20060043958A1 (en) * 2002-09-18 2006-03-02 Koninklijke Philips Electronics N.V. Beam current measurement
US6828794B2 (en) * 2002-10-24 2004-12-07 Cambustion Limited Electrostatic particle measurement
US7189980B2 (en) * 2003-05-09 2007-03-13 Varian Semiconductor Equipment Associates, Inc. Methods and systems for optimizing ion implantation uniformity control
JP4668208B2 (ja) * 2003-12-22 2011-04-13 フジフィルム マニュファクチャリング ユーロプ ビー．ブイ． 大気圧グロープラズマを用いて基板表面から汚物を除去する方法及び装置
EP1548795A1 (de) * 2003-12-22 2005-06-29 Fuji Photo Film B.V. Procédé et dispositif de stabilisation d'un plasma à décharge luminescente sous conditions atmosphériques
US7695590B2 (en) 2004-03-26 2010-04-13 Applied Materials, Inc. Chemical vapor deposition plasma reactor having plural ion shower grids
FR2871934B1 (fr) * 2004-06-16 2006-09-22 Ion Beam Services Sa Alimentation d'implanteur ionique prevue pour une limitation de l'effet de charge
US7878145B2 (en) * 2004-06-02 2011-02-01 Varian Semiconductor Equipment Associates, Inc. Monitoring plasma ion implantation systems for fault detection and process control
FR2871812B1 (fr) * 2004-06-16 2008-09-05 Ion Beam Services Sa Implanteur ionique fonctionnant en mode plasma pulse
US7767561B2 (en) 2004-07-20 2010-08-03 Applied Materials, Inc. Plasma immersion ion implantation reactor having an ion shower grid
US8058156B2 (en) 2004-07-20 2011-11-15 Applied Materials, Inc. Plasma immersion ion implantation reactor having multiple ion shower grids
ATE348497T1 (de) * 2004-08-13 2007-01-15 Fuji Photo Film Bv Verfahren und vorrichtung zur steuerung eines glühentladungsplasmas unter atmosphärischem druck
US7666464B2 (en) 2004-10-23 2010-02-23 Applied Materials, Inc. RF measurement feedback control and diagnostics for a plasma immersion ion implantation reactor
JP5102615B2 (ja) * 2005-04-04 2012-12-19 パナソニック株式会社 プラズマ処理方法及び装置
US20060236931A1 (en) * 2005-04-25 2006-10-26 Varian Semiconductor Equipment Associates, Inc. Tilted Plasma Doping
US7428915B2 (en) * 2005-04-26 2008-09-30 Applied Materials, Inc. O-ringless tandem throttle valve for a plasma reactor chamber
US7312162B2 (en) * 2005-05-17 2007-12-25 Applied Materials, Inc. Low temperature plasma deposition process for carbon layer deposition
US7927948B2 (en) 2005-07-20 2011-04-19 Micron Technology, Inc. Devices with nanocrystals and methods of formation
US7429532B2 (en) * 2005-08-08 2008-09-30 Applied Materials, Inc. Semiconductor substrate process using an optically writable carbon-containing mask
US7335611B2 (en) * 2005-08-08 2008-02-26 Applied Materials, Inc. Copper conductor annealing process employing high speed optical annealing with a low temperature-deposited optical absorber layer
US7312148B2 (en) * 2005-08-08 2007-12-25 Applied Materials, Inc. Copper barrier reflow process employing high speed optical annealing
US7323401B2 (en) * 2005-08-08 2008-01-29 Applied Materials, Inc. Semiconductor substrate process using a low temperature deposited carbon-containing hard mask
US20070170867A1 (en) * 2006-01-24 2007-07-26 Varian Semiconductor Equipment Associates, Inc. Plasma Immersion Ion Source With Low Effective Antenna Voltage
US20080132046A1 (en) * 2006-12-04 2008-06-05 Varian Semiconductor Equipment Associates, Inc. Plasma Doping With Electronically Controllable Implant Angle
US20080169183A1 (en) * 2007-01-16 2008-07-17 Varian Semiconductor Equipment Associates, Inc. Plasma Source with Liner for Reducing Metal Contamination
WO2008089168A2 (en) * 2007-01-19 2008-07-24 Applied Materials, Inc. Plasma immersion chamber
US7820533B2 (en) * 2007-02-16 2010-10-26 Varian Semiconductor Equipment Associates, Inc. Multi-step plasma doping with improved dose control
WO2010033427A1 (en) * 2008-09-19 2010-03-25 Brooks Automation, Inc. Ionization gauge with emission current and bias potential control
US8389962B2 (en) * 2011-05-31 2013-03-05 Applied Materials Israel, Ltd. System and method for compensating for magnetic noise
FR2980911B1 (fr) * 2011-10-04 2013-11-22 Ion Beam Services Module de commande pour implanteur ionique
KR102085496B1 (ko) * 2012-08-28 2020-03-05 에이이에스 글로벌 홀딩스 피티이 리미티드 넓은 다이내믹 레인지 이온 에너지 바이어스 제어； 고속 이온 에너지 스위칭； 이온 에너지 제어와 펄스동작 바이어스 서플라이； 및 가상 전면 패널
US9996654B2 (en) * 2014-12-22 2018-06-12 Wallace W Lin Transistor plasma charging evaluator
US10553411B2 (en) 2015-09-10 2020-02-04 Taiwan Semiconductor Manufacturing Co., Ltd. Ion collector for use in plasma systems
US11398369B2 (en) * 2019-06-25 2022-07-26 Applied Materials, Inc. Method and apparatus for actively tuning a plasma power source
CN113484702B (zh) * 2021-06-17 2022-02-01 南京航空航天大学 一种脉冲放电的位移电流预测方法

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2075759B (en) * 1980-03-27 1984-10-03 Masuda Senichi Particle charging apparatus
DE3014151C2 (de) * 1980-04-12 1982-11-18 Kernforschungszentrum Karlsruhe Gmbh, 7500 Karlsruhe Generator für gepulste Elektronenstrahlen
US4402762A (en) * 1981-06-02 1983-09-06 John Puthenveetil K Method of making highly stable modified amorphous silicon and germanium films
US4587430A (en) * 1983-02-10 1986-05-06 Mission Research Corporation Ion implantation source and device
US4764394A (en) 1987-01-20 1988-08-16 Wisconsin Alumni Research Foundation Method and apparatus for plasma source ion implantation
US5017876A (en) 1989-10-30 1991-05-21 The Simco Company, Inc. Corona current monitoring apparatus and circuitry for A.C. air ionizers including capacitive current elimination
JP2915170B2 (ja) * 1991-06-05 1999-07-05 三菱電機株式会社 薄膜形成装置及び薄膜形成方法
US5354381A (en) * 1993-05-07 1994-10-11 Varian Associates, Inc. Plasma immersion ion implantation (PI3) apparatus
US5572038A (en) 1993-05-07 1996-11-05 Varian Associates, Inc. Charge monitor for high potential pulse current dose measurement apparatus and method
US5410425A (en) * 1993-05-10 1995-04-25 The United States Of America As Represented By The United States Department Of Energy Magnetron cathodes in plasma electrode pockels cells
JPH07130496A (ja) * 1993-11-02 1995-05-19 Hitachi Ltd イオン打込み装置
JPH08273584A (ja) * 1995-03-31 1996-10-18 Nec Yamagata Ltd イオン注入装置
US5711812A (en) 1995-06-06 1998-01-27 Varian Associates, Inc. Apparatus for obtaining dose uniformity in plasma doping (PLAD) ion implantation processes
JPH0963979A (ja) * 1995-08-25 1997-03-07 Sony Corp 注入イオン量計数装置
TW487983B (en) * 1996-04-26 2002-05-21 Hitachi Ltd Manufacturing method for semiconductor device
DE19621874C2 (de) * 1996-05-31 2000-10-12 Karlsruhe Forschzent Quelle zur Erzeugung von großflächigen, gepulsten Ionen- und Elektronenstrahlen
US5897753A (en) * 1997-05-28 1999-04-27 Advanced Energy Industries, Inc. Continuous deposition of insulating material using multiple anodes alternated between positive and negative voltages
EP1003847A4 (de) * 1997-09-04 2005-04-06 Science Res Lab Inc Zelltrennung mittels elektrischer felder
JP2000068227A (ja) * 1998-08-24 2000-03-03 Nissin Electric Co Ltd 表面処理方法および装置
US6050218A (en) 1998-09-28 2000-04-18 Eaton Corporation Dosimetry cup charge collection in plasma immersion ion implantation

Also Published As

Publication number Publication date
JP4817574B2 (ja) 2011-11-16
US6433553B1 (en) 2002-08-13
WO2001031681A8 (en) 2001-09-27
KR100631443B1 (ko) 2006-10-09
TW490704B (en) 2002-06-11
WO2001031681A1 (en) 2001-05-03
KR20020047293A (ko) 2002-06-21
JP2003513439A (ja) 2003-04-08
EP1224684A1 (de) 2002-07-24
EP1224684B1 (de) 2006-11-15

Similar Documents

Publication Publication Date Title
DE60031876D1 (de) Verfahren und vorrichtung zur entfernung des verschiebestroms aus strommessungen in einem plasmabehandlungssystem
DE69935321D1 (de) Verfahren und vorrichtung zur ionisierten physikalischen dampfabscheidung
DE60032481D1 (de) Verfahren und vorrichtung zur threadumschaltung in einem multithreadprozessor
DE60033866D1 (de) Vorrichtung und Verfahren zur Planarisierung
DE50206588D1 (de) Verfahren und vorrichtung zur erkennung und behebung einer umkippgefahr
DE60110311D1 (de) Verfahren und Vorrichtung zur Mehrfachsendung
DE60008102D1 (de) Verfahren und vorrichtung zur mehrfachsendung
DE60100249D1 (de) Vorrichtung und Verfahren zur Fahrzeugerfassung
DE10084820T1 (de) Verfahren und Vorrichtung zur Reinigung von sauerstoffhaltigem Gas
DE60119706D1 (de) Verfahren und vorrichtung zur handhabung von rohrförmigen elementen
DE60139851D1 (de) Vorrichtung und Verfahren zur Reifenzustandüberwachung
DE60239438D1 (de) Verfahren und Vorrichtung zur Flimmerentfernung aus Bildern
DE60132763D1 (de) Verfahren und vorrichtung zur reinigung durch sublimation
DE69938403D1 (de) Verfahren und Vorrichtung zur Routenberechnung
DE60037220D1 (de) Verfahren und Vorrichtung zur Reiningung eines Partikelfilters
DE60021601D1 (de) Verfahren und vorrichtung zur mehrstufigen flüssigkeitsfiltration
DE60142605D1 (de) Verfahren und Vorrichtung zur Plasma-Behandlung
DE60021312D1 (de) Verfahren und Vorrichtung zur Filterreinigung
ATA15599A (de) Verfahren und vorrichtung zur querstromfiltration
DE60109404D1 (de) Vorrichtung und Verfahren zur Reifenzustandsüberwachung
DE69934740D1 (de) Verfahren und Vorrichtung zur Überwachung des Ladungsneutralizierungsvorgangs
DE69924024D1 (de) Verfahren und vorrichtung zum entfernen von gussgraten
DE60016639D1 (de) Verfahren und Vorrichtung zur Pfadsuche
DE59901000D1 (de) Verfahren und vorrichtung zur reinigung eines erzeugnisses
DE60114383D1 (de) Verfahren und vorrichtung zur plasmabeschichtung

Legal Events

Date Code Title Description
8332 No legal effect for de