DE60015555T2 - Abbildungsmethode mittels thermischer Resonanz - Google Patents
Abbildungsmethode mittels thermischer Resonanz Download PDFInfo
- Publication number
- DE60015555T2 DE60015555T2 DE60015555T DE60015555T DE60015555T2 DE 60015555 T2 DE60015555 T2 DE 60015555T2 DE 60015555 T DE60015555 T DE 60015555T DE 60015555 T DE60015555 T DE 60015555T DE 60015555 T2 DE60015555 T2 DE 60015555T2
- Authority
- DE
- Germany
- Prior art keywords
- data
- time
- thickness
- value
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- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000003384 imaging method Methods 0.000 title description 10
- 238000000034 method Methods 0.000 claims description 33
- 230000001052 transient effect Effects 0.000 claims description 25
- 238000001931 thermography Methods 0.000 claims description 22
- 239000000463 material Substances 0.000 claims description 14
- 210000003127 knee Anatomy 0.000 claims description 7
- 238000010438 heat treatment Methods 0.000 claims description 6
- 230000004907 flux Effects 0.000 claims description 5
- 238000013508 migration Methods 0.000 claims description 3
- 230000005012 migration Effects 0.000 claims description 3
- 238000010792 warming Methods 0.000 claims description 2
- 230000001131 transforming effect Effects 0.000 claims 1
- 229910052751 metal Inorganic materials 0.000 description 13
- 230000004044 response Effects 0.000 description 13
- 239000002184 metal Substances 0.000 description 11
- 238000004458 analytical method Methods 0.000 description 10
- 230000006870 function Effects 0.000 description 9
- 238000005259 measurement Methods 0.000 description 8
- 230000007547 defect Effects 0.000 description 7
- 230000003287 optical effect Effects 0.000 description 7
- 230000005855 radiation Effects 0.000 description 5
- 238000004090 dissolution Methods 0.000 description 4
- 150000002739 metals Chemical class 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 238000002604 ultrasonography Methods 0.000 description 4
- 238000010521 absorption reaction Methods 0.000 description 3
- 238000013459 approach Methods 0.000 description 3
- 238000004364 calculation method Methods 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 3
- 238000011156 evaluation Methods 0.000 description 3
- 238000009659 non-destructive testing Methods 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 239000002131 composite material Substances 0.000 description 2
- 239000007822 coupling agent Substances 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 230000001066 destructive effect Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229910052755 nonmetal Inorganic materials 0.000 description 2
- 150000002843 nonmetals Chemical class 0.000 description 2
- 239000005304 optical glass Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- RZVAJINKPMORJF-UHFFFAOYSA-N Acetaminophen Chemical compound CC(=O)NC1=CC=C(O)C=C1 RZVAJINKPMORJF-UHFFFAOYSA-N 0.000 description 1
- 238000009529 body temperature measurement Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000007405 data analysis Methods 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 238000005206 flow analysis Methods 0.000 description 1
- 239000005350 fused silica glass Substances 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 230000003116 impacting effect Effects 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 239000005297 pyrex Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000000191 radiation effect Effects 0.000 description 1
- 238000001454 recorded image Methods 0.000 description 1
- 238000012552 review Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/72—Investigating presence of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
- G01B21/085—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness using thermal means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Radiation Pyrometers (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US14488599P | 1999-07-21 | 1999-07-21 | |
| US144885P | 1999-07-21 | ||
| US09/568,052 US6367968B1 (en) | 1999-07-21 | 2000-05-10 | Thermal resonance imaging method |
| US568052 | 2000-05-10 | ||
| PCT/US2000/016173 WO2001007867A1 (en) | 1999-07-21 | 2000-06-13 | Thermal resonance imaging method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE60015555D1 DE60015555D1 (de) | 2004-12-09 |
| DE60015555T2 true DE60015555T2 (de) | 2005-12-08 |
Family
ID=26842456
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE60015555T Expired - Fee Related DE60015555T2 (de) | 1999-07-21 | 2000-06-13 | Abbildungsmethode mittels thermischer Resonanz |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US6367968B1 (https=) |
| EP (1) | EP1203199B1 (https=) |
| JP (1) | JP2003505683A (https=) |
| KR (1) | KR100697477B1 (https=) |
| BR (1) | BR0012644A (https=) |
| DE (1) | DE60015555T2 (https=) |
| TR (1) | TR200200140T2 (https=) |
| TW (1) | TW463047B (https=) |
| WO (1) | WO2001007867A1 (https=) |
Families Citing this family (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7690840B2 (en) * | 1999-12-22 | 2010-04-06 | Siemens Energy, Inc. | Method and apparatus for measuring on-line failure of turbine thermal barrier coatings |
| US6517238B2 (en) * | 2001-01-18 | 2003-02-11 | The United States Of America As Represented By The United States Department Of Energy | Thermal imaging measurement of lateral diffusivity and non-invasive material defect detection |
| EP1262765A1 (de) * | 2001-05-28 | 2002-12-04 | Solectron GmbH | Verfahren und Vorrichtung zur Detektion von defekten Leiterplattenrohlingen |
| US6712502B2 (en) * | 2002-04-10 | 2004-03-30 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Synchronized electronic shutter system and method for thermal nondestructive evaluation |
| US20050018748A1 (en) * | 2003-07-24 | 2005-01-27 | Ringermacher Harry Israel | Actively quenched lamp, infrared thermography imaging system, and method for actively controlling flash duration |
| AU2003279935A1 (en) * | 2003-08-29 | 2005-04-14 | Nielsen Media Research, Inc. | Methods and apparatus for embedding and recovering an image for use with video content |
| US7419298B2 (en) * | 2005-05-24 | 2008-09-02 | United Technologies Corporation | Thermal imaging method and apparatus |
| US7388204B2 (en) * | 2005-12-07 | 2008-06-17 | Meyer Tool, Inc. | Apparatus and method for analyzing relative outward flow characterizations of fabricated features |
| FR2895688B1 (fr) * | 2005-12-30 | 2010-08-27 | Pellenc Selective Technologies | Procede et machine automatiques d'inspection et de tri d'objets non metalliques |
| US7432505B2 (en) * | 2006-05-04 | 2008-10-07 | Siemens Power Generation, Inc. | Infrared-based method and apparatus for online detection of cracks in steam turbine components |
| US7671338B2 (en) * | 2006-06-14 | 2010-03-02 | Meyer Tool, Inc. | Apparatus and method for analyzing relative outward flow characterizations of fabricated features |
| DE102006043339B4 (de) * | 2006-09-15 | 2010-11-11 | Siemens Ag | Verfahren und Vorrichtung zur Bestimmung von Bauteilwandstärken mittels Thermographie |
| DE102006044443A1 (de) * | 2006-09-21 | 2008-04-03 | Robert Bosch Gmbh | Automatische Erkennung von Beschichtungsfehlern |
| GB2442744B (en) * | 2006-10-12 | 2009-07-08 | Rolls Royce Plc | A test apparatus and method |
| US7516663B2 (en) * | 2006-11-03 | 2009-04-14 | General Electric Company | Systems and method for locating failure events in samples under load |
| US7549789B2 (en) * | 2007-06-20 | 2009-06-23 | General Electric Company | Method and apparatus for thermographic nondestructive evaluation of an object |
| US8393784B2 (en) * | 2008-03-31 | 2013-03-12 | General Electric Company | Characterization of flaws in composites identified by thermography |
| WO2010070383A1 (en) | 2008-12-16 | 2010-06-24 | Sabanci Universitesi | A 3d scanner |
| US8577120B1 (en) | 2009-11-05 | 2013-11-05 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Methods and systems for characterization of an anomaly using infrared flash thermography |
| US9066028B1 (en) | 2010-01-08 | 2015-06-23 | The United States Of America As Represented By The Administator Of The National Aeronautics And Space Administration | Methods and systems for measurement and estimation of normalized contrast in infrared thermography |
| DE102010020874B4 (de) * | 2010-05-18 | 2014-04-03 | Dcg Systems, Inc. | Verfahren zur Messzeitreduktion bei der thermografischen Prüfung eines Bauteils |
| US8692887B2 (en) * | 2010-08-27 | 2014-04-08 | General Electric Company | Thermal imaging method and apparatus for evaluating coatings |
| US9007466B2 (en) * | 2011-04-27 | 2015-04-14 | General Electric Company | System and method for thermographic inspection |
| US9357204B2 (en) * | 2012-03-19 | 2016-05-31 | Fittingbox | Method for constructing images of a pair of glasses |
| US10343211B2 (en) | 2016-08-25 | 2019-07-09 | Honda Motor Co., Ltd. | Thermal camera system for die-cast machine |
| CN110741136B (zh) * | 2017-06-20 | 2022-04-12 | 西门子能源全球两合公司 | 暴露至使用中的腐蚀损伤的动力涡轮盘的寿命延长 |
| KR101877480B1 (ko) | 2017-11-24 | 2018-08-07 | 한국과학기술원 | 도막 두께 분포 시각화 방법 및 이를 위한 능동형 열화상 장치 |
| JP7308577B2 (ja) * | 2020-06-01 | 2023-07-14 | ヤマハロボティクスホールディングス株式会社 | 音響式不良検出装置及び不良検出方法 |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4854724A (en) | 1984-07-09 | 1989-08-08 | Lockheed Corporation | Method of and apparatus for thermographic evaluation of spot welds |
| GB8431928D0 (en) | 1984-12-18 | 1985-01-30 | Stevenson G M | Non-destructively testing heat shrinkable sleeves |
| JPS62172249A (ja) | 1986-01-25 | 1987-07-29 | Kajima Corp | 煙突の劣化診断方法及び装置 |
| US4792683A (en) * | 1987-01-16 | 1988-12-20 | Hughes Aircraft Company | Thermal technique for simultaneous testing of circuit board solder joints |
| US4872762A (en) | 1987-08-25 | 1989-10-10 | Nkk Corporation | Method and apparatus for detecting defective portion on inner surface of pipe |
| GB8813423D0 (en) | 1988-06-07 | 1988-07-13 | Atomic Energy Authority Uk | Coating inspection |
| US5032727A (en) | 1990-09-14 | 1991-07-16 | Digital Equipment Corporation | Product defect detection using thermal ratio analysis |
| US5250809A (en) | 1992-01-24 | 1993-10-05 | Shuji Nakata | Method and device for checking joint of electronic component |
| US5201582A (en) * | 1992-05-15 | 1993-04-13 | Stress Photonics, Inc. | Differential temperature stress measurement employing array sensor with local offset |
| US5246291A (en) | 1992-06-01 | 1993-09-21 | Motorola, Inc. | Bond inspection technique for a semiconductor chip |
| US5292195A (en) | 1992-09-09 | 1994-03-08 | Martin Marietta Corporation | Thermographic evaluation technique |
| US5376793A (en) | 1993-09-15 | 1994-12-27 | Stress Photonics, Inc. | Forced-diffusion thermal imaging apparatus and method |
| US5539656A (en) | 1994-10-11 | 1996-07-23 | United Technologies Corporation | Crack monitoring apparatus |
| US5683181A (en) | 1995-05-12 | 1997-11-04 | Thermal Wave Imaging, Inc. | Method and apparatus for enhancing thermal wave imaging of reflective low-emissivity solids |
| US5631465A (en) | 1996-02-29 | 1997-05-20 | Shepard; Steven M. | Method of interpreting thermographic data for non-destructive evaluation |
| WO1998005921A1 (de) | 1996-07-31 | 1998-02-12 | Siemens Aktiengesellschaft | Verfahren zur wanddickenbestimmung an einer turbinenschaufel und vorrichtung zur durchführung des verfahrens |
| WO1998005949A1 (de) | 1996-07-31 | 1998-02-12 | Siemens Aktiengesellschaft | Verfahren und vorrichtung zur delaminationsprüfung bei beschichtungen auf substraten, insbesondere bei vps-beschichtungen auf gasturbinenschaufeln |
| US5711603A (en) | 1996-10-30 | 1998-01-27 | United Technologies Corporation | Nondestructive testing: transient depth thermography |
| JPH10274675A (ja) | 1997-03-31 | 1998-10-13 | Shimadzu Corp | 放射線検出器 |
-
2000
- 2000-05-10 US US09/568,052 patent/US6367968B1/en not_active Expired - Fee Related
- 2000-06-13 EP EP00942767A patent/EP1203199B1/en not_active Expired - Lifetime
- 2000-06-13 BR BR0012644-6A patent/BR0012644A/pt not_active IP Right Cessation
- 2000-06-13 KR KR1020027000845A patent/KR100697477B1/ko not_active Expired - Fee Related
- 2000-06-13 WO PCT/US2000/016173 patent/WO2001007867A1/en not_active Ceased
- 2000-06-13 TR TR2002/00140T patent/TR200200140T2/xx unknown
- 2000-06-13 DE DE60015555T patent/DE60015555T2/de not_active Expired - Fee Related
- 2000-06-13 JP JP2001512251A patent/JP2003505683A/ja not_active Withdrawn
- 2000-07-10 TW TW089113696A patent/TW463047B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| KR100697477B1 (ko) | 2007-03-20 |
| JP2003505683A (ja) | 2003-02-12 |
| TR200200140T2 (tr) | 2002-06-21 |
| EP1203199A1 (en) | 2002-05-08 |
| KR20020035105A (ko) | 2002-05-09 |
| EP1203199B1 (en) | 2004-11-03 |
| WO2001007867A1 (en) | 2001-02-01 |
| US6367968B1 (en) | 2002-04-09 |
| DE60015555D1 (de) | 2004-12-09 |
| BR0012644A (pt) | 2002-04-09 |
| TW463047B (en) | 2001-11-11 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8364 | No opposition during term of opposition | ||
| 8328 | Change in the person/name/address of the agent |
Representative=s name: ROEGER UND KOLLEGEN, 73728 ESSLINGEN |
|
| 8339 | Ceased/non-payment of the annual fee |