DE60013696D1 - Achromatisches optisches Interferometer mit kontinuierlich einstellbarer Empfindlichkeit - Google Patents

Achromatisches optisches Interferometer mit kontinuierlich einstellbarer Empfindlichkeit

Info

Publication number
DE60013696D1
DE60013696D1 DE60013696T DE60013696T DE60013696D1 DE 60013696 D1 DE60013696 D1 DE 60013696D1 DE 60013696 T DE60013696 T DE 60013696T DE 60013696 T DE60013696 T DE 60013696T DE 60013696 D1 DE60013696 D1 DE 60013696D1
Authority
DE
Germany
Prior art keywords
continuously adjustable
optical interferometer
adjustable sensitivity
achromatic optical
achromatic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60013696T
Other languages
English (en)
Other versions
DE60013696T2 (de
Inventor
Jerome M Primot
Nicolas M Guerineau
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Office National dEtudes et de Recherches Aerospatiales ONERA
Original Assignee
Office National dEtudes et de Recherches Aerospatiales ONERA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Office National dEtudes et de Recherches Aerospatiales ONERA filed Critical Office National dEtudes et de Recherches Aerospatiales ONERA
Publication of DE60013696D1 publication Critical patent/DE60013696D1/de
Application granted granted Critical
Publication of DE60013696T2 publication Critical patent/DE60013696T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J9/0215—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods by shearing interferometric methods

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
DE60013696T 1999-06-17 2000-06-08 Achromatisches optisches Interferometer mit kontinuierlich einstellbarer Empfindlichkeit Expired - Lifetime DE60013696T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR9907804 1999-06-17
FR9907804A FR2795175B1 (fr) 1999-06-17 1999-06-17 Interferometre optique achromatique, du type a sensibilite continument reglable

Publications (2)

Publication Number Publication Date
DE60013696D1 true DE60013696D1 (de) 2004-10-21
DE60013696T2 DE60013696T2 (de) 2005-02-24

Family

ID=9547029

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60013696T Expired - Lifetime DE60013696T2 (de) 1999-06-17 2000-06-08 Achromatisches optisches Interferometer mit kontinuierlich einstellbarer Empfindlichkeit

Country Status (5)

Country Link
US (1) US6577403B1 (de)
EP (1) EP1061349B1 (de)
JP (1) JP4834211B2 (de)
DE (1) DE60013696T2 (de)
FR (1) FR2795175B1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2827380B1 (fr) * 2001-07-12 2003-11-07 Imagine Optic Dispositif d'analyse d'un front d'onde a resolution amelioree
JP2005077966A (ja) * 2003-09-03 2005-03-24 Dainippon Printing Co Ltd 回折光学素子
FR2879288B1 (fr) * 2004-12-09 2007-03-02 Phasics Sa Dispositif compact de large dynamique et de sensibilite ajustable pour l'analyse et la mesure de phase d'une onde lumineuse
FR2896583B1 (fr) * 2006-01-20 2008-10-17 Onera (Off Nat Aerospatiale) Interferometre optique achromatique et compact, du type a decalage trilateral
FR2897426B1 (fr) 2006-02-16 2012-07-27 Onera (Off Nat Aerospatiale) Procede d'analyse de surface d'onde par interferometrie multilaterale a difference de frequences
FR2930336B1 (fr) 2008-04-22 2010-05-14 Onera (Off Nat Aerospatiale) Procede, reseau de phase et dispositif d'analyse de surface d'onde d'un faisceau de lumiere
FR2951269A1 (fr) 2009-10-08 2011-04-15 Phasics Procede et systeme d'analyse structurelle d'un objet par mesure de front d'onde
CN104111120B (zh) * 2014-07-25 2017-05-31 中国科学院上海光学精密机械研究所 基于朗奇剪切干涉仪的相位提取方法
FR3057064B1 (fr) 2016-09-30 2021-04-23 Phasics Procede et dispositif d'analyse d'une onde electromagnetique en haute definition
FR3062476B1 (fr) * 2017-01-27 2020-12-25 Imagine Optic Methode d'evaluation de la qualite de la mesure d'un front d'onde et systemes mettant en œuvre une telle methode
IL251636B (en) 2017-04-06 2018-02-28 Yoav Berlatzky A system and method for a coherent camera
US10830709B2 (en) * 2018-09-28 2020-11-10 Onto Innovation Inc. Interferometer with pixelated phase shift mask
CN111428618B (zh) * 2020-03-20 2023-11-17 华为技术有限公司 一种显示模组和电子设备
TWI800942B (zh) * 2021-10-06 2023-05-01 國立中央大學 光學計算方法
FR3132947B1 (fr) 2022-02-21 2024-02-23 Imagine Optic Systèmes et procédés d’analyse de la qualité de surface d’une lame à faces parallèles

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3829219A (en) * 1973-03-30 1974-08-13 Itek Corp Shearing interferometer
JP2968080B2 (ja) * 1991-04-30 1999-10-25 ジェイエスアール株式会社 高分解能光学顕微鏡および照射スポット光作成用マスク
FR2682761B1 (fr) * 1991-10-18 1994-05-06 Onera Procede et dispositif pour l'analyse d'une surface d'onde lumineuse.
FR2712978B1 (fr) * 1993-11-24 1996-02-02 Onera (Off Nat Aerospatiale) Interféromètre optique achromatique, du type à décalage trilatéral.
JPH07221005A (ja) * 1994-02-08 1995-08-18 Hitachi Ltd ホトマスクおよび位相差測定方法
JP3398472B2 (ja) * 1994-06-14 2003-04-21 株式会社日立製作所 検査方法および検査装置
JP3080024B2 (ja) * 1997-02-20 2000-08-21 日本電気株式会社 露光方法および球面収差量の測定方法
JP2000292904A (ja) * 1999-04-12 2000-10-20 Hitachi Ltd 位相シフトマスクの位相差測定方法および装置

Also Published As

Publication number Publication date
JP2001050819A (ja) 2001-02-23
JP4834211B2 (ja) 2011-12-14
FR2795175A1 (fr) 2000-12-22
US6577403B1 (en) 2003-06-10
DE60013696T2 (de) 2005-02-24
FR2795175B1 (fr) 2001-07-27
EP1061349B1 (de) 2004-09-15
EP1061349A1 (de) 2000-12-20

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