TWI800942B - 光學計算方法 - Google Patents
光學計算方法 Download PDFInfo
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- TWI800942B TWI800942B TW110137249A TW110137249A TWI800942B TW I800942 B TWI800942 B TW I800942B TW 110137249 A TW110137249 A TW 110137249A TW 110137249 A TW110137249 A TW 110137249A TW I800942 B TWI800942 B TW I800942B
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TW110137249A TWI800942B (zh) | 2021-10-06 | 2021-10-06 | 光學計算方法 |
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TW110137249A TWI800942B (zh) | 2021-10-06 | 2021-10-06 | 光學計算方法 |
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TW202316094A TW202316094A (zh) | 2023-04-16 |
TWI800942B true TWI800942B (zh) | 2023-05-01 |
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TW110137249A TWI800942B (zh) | 2021-10-06 | 2021-10-06 | 光學計算方法 |
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6577403B1 (en) * | 1999-06-17 | 2003-06-10 | Onera (Office National D'etudes Et De Recherches Aerospatiales) | Achromatic optical interferometer with continuously adjustable sensitivity |
CN106052583A (zh) * | 2016-05-24 | 2016-10-26 | 中国人民解放军国防科学技术大学 | 基于可变补偿透镜的非球面面形干涉测量方法及装置 |
CN113049228A (zh) * | 2021-03-22 | 2021-06-29 | 中国科学院上海光学精密机械研究所 | 一种物镜波像差检测装置及检测方法 |
CN113260844A (zh) * | 2019-12-06 | 2021-08-13 | 法国圣戈班玻璃厂 | 用于测量镶玻璃的给定区域的光学质量的测量方法、相关测量装置 |
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2021
- 2021-10-06 TW TW110137249A patent/TWI800942B/zh active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6577403B1 (en) * | 1999-06-17 | 2003-06-10 | Onera (Office National D'etudes Et De Recherches Aerospatiales) | Achromatic optical interferometer with continuously adjustable sensitivity |
CN106052583A (zh) * | 2016-05-24 | 2016-10-26 | 中国人民解放军国防科学技术大学 | 基于可变补偿透镜的非球面面形干涉测量方法及装置 |
CN113260844A (zh) * | 2019-12-06 | 2021-08-13 | 法国圣戈班玻璃厂 | 用于测量镶玻璃的给定区域的光学质量的测量方法、相关测量装置 |
CN113049228A (zh) * | 2021-03-22 | 2021-06-29 | 中国科学院上海光学精密机械研究所 | 一种物镜波像差检测装置及检测方法 |
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