DE60000882T2 - Gerät und Verfahren zur elektrischen Widerstandsmessung für gedruckte Schaltungen - Google Patents
Gerät und Verfahren zur elektrischen Widerstandsmessung für gedruckte SchaltungenInfo
- Publication number
- DE60000882T2 DE60000882T2 DE60000882T DE60000882T DE60000882T2 DE 60000882 T2 DE60000882 T2 DE 60000882T2 DE 60000882 T DE60000882 T DE 60000882T DE 60000882 T DE60000882 T DE 60000882T DE 60000882 T2 DE60000882 T2 DE 60000882T2
- Authority
- DE
- Germany
- Prior art keywords
- electrical resistance
- resistance measurement
- printed circuits
- printed
- circuits
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11047012A JP2000241485A (ja) | 1999-02-24 | 1999-02-24 | 回路基板の電気抵抗測定装置および方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60000882D1 DE60000882D1 (de) | 2003-01-16 |
DE60000882T2 true DE60000882T2 (de) | 2003-05-08 |
Family
ID=12763269
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60000882T Expired - Lifetime DE60000882T2 (de) | 1999-02-24 | 2000-02-23 | Gerät und Verfahren zur elektrischen Widerstandsmessung für gedruckte Schaltungen |
Country Status (6)
Country | Link |
---|---|
US (1) | US6297652B1 (de) |
EP (1) | EP1031840B1 (de) |
JP (1) | JP2000241485A (de) |
KR (1) | KR100330469B1 (de) |
DE (1) | DE60000882T2 (de) |
TW (1) | TW495613B (de) |
Families Citing this family (34)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6504378B1 (en) * | 1999-11-24 | 2003-01-07 | Micron Technology, Inc. | Apparatus for evaluating contact pin integrity of electronic components having multiple contact pins |
US6462568B1 (en) * | 2000-08-31 | 2002-10-08 | Micron Technology, Inc. | Conductive polymer contact system and test method for semiconductor components |
ATE284083T1 (de) * | 2000-09-25 | 2004-12-15 | Jsr Corp | Anisotropisches leitfähiges verbindungsblatt, herstellungsverfahren dafür und produkt davon |
JP4734706B2 (ja) | 2000-11-01 | 2011-07-27 | Jsr株式会社 | 電気抵抗測定用コネクター並びに回路基板の電気抵抗測定装置および測定方法 |
US6969622B1 (en) * | 2001-02-09 | 2005-11-29 | Jsr Corporation | Anisotropically conductive connector, its manufacture method and probe member |
JP3573120B2 (ja) * | 2001-08-31 | 2004-10-06 | Jsr株式会社 | 異方導電性コネクターおよびその製造方法並びにその応用製品 |
KR100454676B1 (ko) * | 2002-03-14 | 2004-11-05 | 엘지전선 주식회사 | 절연 내력의 다중 측정 장치 |
JP2003322665A (ja) * | 2002-05-01 | 2003-11-14 | Jsr Corp | 電気抵抗測定用コネクター並びに回路基板の電気抵抗測定装置および測定方法 |
US6904790B2 (en) * | 2002-08-06 | 2005-06-14 | Seagate Technology Llc | System and method for ECM land erosion metrology |
KR100721478B1 (ko) * | 2003-01-17 | 2007-05-23 | 제이에스알 가부시끼가이샤 | 회로 기판의 검사 장치 및 회로 기판의 검사 방법 |
CN100469218C (zh) * | 2003-01-17 | 2009-03-11 | Jsr株式会社 | 用于电路板的检查设备和用于电路板的检查方法 |
EP1607751A1 (de) * | 2003-03-26 | 2005-12-21 | JSR Corporation | Elektrischer widerstandsmessverbinder, elektrische widerstandsmessverbindereinrichtung und herstellungsverfahren dafür, elektrische widerstandsmesseinrichtung für schaltungssubstrate und messverfahren |
JP3714344B2 (ja) * | 2003-10-14 | 2005-11-09 | Jsr株式会社 | 回路基板検査装置 |
JP4469156B2 (ja) * | 2003-10-27 | 2010-05-26 | ウインテスト株式会社 | テスタ装置、検査装置及びそれに用いる中継基板収容ユニット |
US20060177971A1 (en) * | 2004-01-13 | 2006-08-10 | Jsr Corporation | Anisotropically conductive connector, production process thereof and application product thereof |
WO2006035856A1 (ja) * | 2004-09-30 | 2006-04-06 | Jsr Corporation | 回路装置検査用電極装置およびその製造方法並びに回路装置の検査装置 |
TWI254798B (en) * | 2004-10-28 | 2006-05-11 | Advanced Semiconductor Eng | Substrate testing apparatus with full contact configuration |
US20060139045A1 (en) * | 2004-12-29 | 2006-06-29 | Wesley Gallagher | Device and method for testing unpackaged semiconductor die |
TWI388846B (zh) * | 2005-07-14 | 2013-03-11 | Jsr Corp | An electrical impedance measuring device and a measuring method for connecting an electrical resistance measuring connector and a circuit board |
EP1936387A4 (de) * | 2005-10-11 | 2011-10-05 | Jsr Corp | Anisotroper leitfähiger verbinder und untersuchungsgeräte für eine schaltungsanordnung |
US7710389B2 (en) * | 2005-11-04 | 2010-05-04 | Xerox Corporation | Multi-layer display device using dot field applicators |
KR20080079670A (ko) * | 2005-12-22 | 2008-09-01 | 제이에스알 가부시끼가이샤 | 웨이퍼 검사용 회로 기판 장치, 프로브 카드 및 웨이퍼검사 장치 |
US7648130B2 (en) * | 2006-06-08 | 2010-01-19 | Research In Motion Limited | Use of magnets to provide resilience |
DE102006059429A1 (de) * | 2006-12-15 | 2008-06-26 | Atg Luther & Maelzer Gmbh | Modul für eine Prüfvorrichtung zum Testen von Leiterplatten |
JP5426365B2 (ja) * | 2007-03-14 | 2014-02-26 | 日本発條株式会社 | プローブカード |
US7759951B2 (en) * | 2007-05-29 | 2010-07-20 | Touchdown Technologies, Inc. | Semiconductor testing device with elastomer interposer |
US20090002002A1 (en) * | 2007-06-30 | 2009-01-01 | Wen-Bi Hsu | Electrical Testing System |
TWI383157B (zh) * | 2009-01-06 | 2013-01-21 | Nan Ya Printed Circuit Board | 印刷電路板之阻值量測模組及其量測方法 |
DE102011051607A1 (de) | 2011-07-06 | 2013-01-10 | Dtg International Gmbh | Adapter für eine Prüfvorrichtung und Prüfvorrichtung zum Testen von Leiterplatten |
KR101397887B1 (ko) | 2013-05-15 | 2014-05-20 | 주식회사 엘지씨엔에스 | 다수의 전지를 직렬 연결한 충방전 시스템에서의 전지접촉부 감시 장치 및 방법 |
CN104852172B (zh) * | 2014-02-19 | 2017-12-29 | 联想(北京)有限公司 | 一种电子设备和电路板连接方法 |
JP6297755B2 (ja) * | 2015-07-31 | 2018-03-20 | 住友理工株式会社 | 静電容量型センサ、センサシートおよび静電容量型センサの製造方法 |
US20190355277A1 (en) | 2018-05-18 | 2019-11-21 | Aidmics Biotechnology (Hk) Co., Limited | Hand-made circuit board |
CN111706633B (zh) * | 2020-06-29 | 2022-04-05 | 郑州轻工业大学 | 电磁力诱导绝缘弹性体电制动器面外制动的装置及方法 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3996514A (en) | 1975-11-21 | 1976-12-07 | Bell Telephone Laboratories, Incorporated | Circuit board contact resistance probe |
US4321533A (en) * | 1979-04-19 | 1982-03-23 | Fairchild Camera & Instrument Corp. | Printed circuit board test fixture having interchangeable card personalizers |
US4496903A (en) * | 1981-05-11 | 1985-01-29 | Burroughs Corporation | Circuit board test fixture |
US4471298A (en) * | 1981-12-11 | 1984-09-11 | Cirdyne, Inc. | Apparatus for automatically electrically testing printed circuit boards |
JPS5975162A (ja) * | 1982-10-25 | 1984-04-27 | Japan Synthetic Rubber Co Ltd | プリント基板の検査方法及び装置 |
US4626776A (en) * | 1984-06-07 | 1986-12-02 | O. B. Test Group, Inc. | Programmable test fixture |
DK291184D0 (da) * | 1984-06-13 | 1984-06-13 | Boeegh Petersen Allan | Fremgangsmaade og indretning til test af kredsloebsplader |
US4626779A (en) * | 1985-03-19 | 1986-12-02 | Pylon Company, Inc. | Spring-stops for a bi-level test fixture |
US4771236A (en) * | 1985-12-16 | 1988-09-13 | Banks Sherman M | Multilayered printed circuit board type resistor isolated tray for stress testing integrated circuits and method of making same |
ATE56280T1 (de) | 1986-06-25 | 1990-09-15 | Mania Gmbh | Verfahren und vorrichtung zum elektrischen pruefen von leiterplatten. |
FR2617977B1 (fr) | 1987-07-08 | 1990-01-05 | Centre Nat Rech Scient | Appareil de test de circuit imprime |
US5001604A (en) * | 1989-10-26 | 1991-03-19 | Lusby W Randolph | Embedded testing circuit and method for fabricating same |
US5491424A (en) * | 1994-08-12 | 1996-02-13 | At&T Corp. | System for measuring contamination resistance |
JP3276267B2 (ja) * | 1995-07-11 | 2002-04-22 | ジェイエスアール株式会社 | 電気抵抗測定装置および電気抵抗測定方法 |
US6118286A (en) * | 1995-10-10 | 2000-09-12 | Xilinx, Inc. | Semiconductor device tester-to-handler Interface board with large test area |
US6181149B1 (en) | 1996-09-26 | 2001-01-30 | Delaware Capital Formation, Inc. | Grid array package test contactor |
-
1999
- 1999-02-24 JP JP11047012A patent/JP2000241485A/ja not_active Withdrawn
-
2000
- 2000-02-16 TW TW089102646A patent/TW495613B/zh not_active IP Right Cessation
- 2000-02-22 US US09/510,673 patent/US6297652B1/en not_active Expired - Lifetime
- 2000-02-23 EP EP00103804A patent/EP1031840B1/de not_active Expired - Lifetime
- 2000-02-23 KR KR1020000008682A patent/KR100330469B1/ko not_active IP Right Cessation
- 2000-02-23 DE DE60000882T patent/DE60000882T2/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP1031840A3 (de) | 2000-12-20 |
JP2000241485A (ja) | 2000-09-08 |
US6297652B1 (en) | 2001-10-02 |
DE60000882D1 (de) | 2003-01-16 |
EP1031840B1 (de) | 2002-12-04 |
KR100330469B1 (ko) | 2002-04-01 |
TW495613B (en) | 2002-07-21 |
KR20000071372A (ko) | 2000-11-25 |
EP1031840A2 (de) | 2000-08-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |