DE4118978C2 - - Google Patents

Info

Publication number
DE4118978C2
DE4118978C2 DE19914118978 DE4118978A DE4118978C2 DE 4118978 C2 DE4118978 C2 DE 4118978C2 DE 19914118978 DE19914118978 DE 19914118978 DE 4118978 A DE4118978 A DE 4118978A DE 4118978 C2 DE4118978 C2 DE 4118978C2
Authority
DE
Germany
Prior art keywords
value
voltage
histogram
probability
amplitude
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE19914118978
Other languages
German (de)
English (en)
Other versions
DE4118978A1 (de
Inventor
Michael 8120 Weilheim De Holeczek
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohde and Schwarz GmbH and Co KG
Original Assignee
Rohde and Schwarz GmbH and Co KG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohde and Schwarz GmbH and Co KG filed Critical Rohde and Schwarz GmbH and Co KG
Priority to DE19914118978 priority Critical patent/DE4118978A1/de
Priority to EP92108814A priority patent/EP0518116A1/de
Priority to JP19128192A priority patent/JPH05196657A/ja
Publication of DE4118978A1 publication Critical patent/DE4118978A1/de
Application granted granted Critical
Publication of DE4118978C2 publication Critical patent/DE4118978C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations
    • G06F17/18—Complex mathematical operations for evaluating statistical data, e.g. average values, frequency distributions, probability functions, regression analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D1/00—Measuring arrangements giving results other than momentary value of variable, of general application
    • G01D1/14—Measuring arrangements giving results other than momentary value of variable, of general application giving a distribution function of a value, i.e. number of times the value comes within specified ranges of amplitude
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/04—Measuring peak values or amplitude or envelope of AC or of pulses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Data Mining & Analysis (AREA)
  • Mathematical Analysis (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Pure & Applied Mathematics (AREA)
  • Computational Mathematics (AREA)
  • Mathematical Optimization (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Evolutionary Biology (AREA)
  • Operations Research (AREA)
  • Probability & Statistics with Applications (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Algebra (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Databases & Information Systems (AREA)
  • Software Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measurement Of Current Or Voltage (AREA)
DE19914118978 1991-06-08 1991-06-08 Verfahren und anordnung zum messen der kennwerte wie spitzenwert, mittelwert oder effektivwert einer wechselspannung Granted DE4118978A1 (de)

Priority Applications (3)

Application Number Priority Date Filing Date Title
DE19914118978 DE4118978A1 (de) 1991-06-08 1991-06-08 Verfahren und anordnung zum messen der kennwerte wie spitzenwert, mittelwert oder effektivwert einer wechselspannung
EP92108814A EP0518116A1 (de) 1991-06-08 1992-05-26 Verfahren zum Messen des Spitzenwertes einer Wechselspannung
JP19128192A JPH05196657A (ja) 1991-06-08 1992-06-08 交流電圧のピーク値測定法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19914118978 DE4118978A1 (de) 1991-06-08 1991-06-08 Verfahren und anordnung zum messen der kennwerte wie spitzenwert, mittelwert oder effektivwert einer wechselspannung

Publications (2)

Publication Number Publication Date
DE4118978A1 DE4118978A1 (de) 1992-12-10
DE4118978C2 true DE4118978C2 (enrdf_load_stackoverflow) 1993-09-02

Family

ID=6433561

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19914118978 Granted DE4118978A1 (de) 1991-06-08 1991-06-08 Verfahren und anordnung zum messen der kennwerte wie spitzenwert, mittelwert oder effektivwert einer wechselspannung

Country Status (3)

Country Link
EP (1) EP0518116A1 (enrdf_load_stackoverflow)
JP (1) JPH05196657A (enrdf_load_stackoverflow)
DE (1) DE4118978A1 (enrdf_load_stackoverflow)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6418386B1 (en) 1999-12-06 2002-07-09 Koninklijke Philips Electronics N.V. High and low voltage measurement in waveform analysis
DE10002337A1 (de) 2000-01-20 2001-07-26 Rohde & Schwarz Verfahren und Anordnung zum Anzeigen der Amplitudenverzerrungen eines Übertragungskanals
US6694462B1 (en) 2000-08-09 2004-02-17 Teradyne, Inc. Capturing and evaluating high speed data streams
WO2003089948A2 (en) * 2002-04-15 2003-10-30 Toolz, Ltd. Constructing a waveform from multiple threshold samples
US7143323B2 (en) 2002-12-13 2006-11-28 Teradyne, Inc. High speed capture and averaging of serial data by asynchronous periodic sampling
US7149651B2 (en) * 2004-05-14 2006-12-12 Agilent Technologies, Inc. Confidence blanket for randomly-located measurements
GB2426066A (en) * 2005-05-13 2006-11-15 Agilent Technologies Inc Apparatus and method for generating a complementary cumulative distribution function (CCDF) curve
FR3009087B1 (fr) * 2013-07-24 2015-09-04 Commissariat Energie Atomique Procede et dispositif de mesure du module d'une impedance electrique.

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3132874A1 (de) * 1981-08-20 1983-03-03 Rainer Dipl.-Ing. 6500 Mainz Bermbach "stochastische effektivwertmessung"
DE3435627A1 (de) * 1984-09-28 1986-04-10 Rohde & Schwarz GmbH & Co KG, 8000 München Verfahren und anordnung zum messen des effektivwerts einer wechselspannung
US4817158A (en) * 1984-10-19 1989-03-28 International Business Machines Corporation Normalization of speech signals
DE3825884A1 (de) * 1988-07-29 1990-02-01 Texas Instruments Deutschland Verfahren zur erhoehung der aufloesung eines a/d-umsetzers

Also Published As

Publication number Publication date
DE4118978A1 (de) 1992-12-10
EP0518116A1 (de) 1992-12-16
JPH05196657A (ja) 1993-08-06

Similar Documents

Publication Publication Date Title
DE2061483C2 (de) Verfahren zur Durchführung des Verfahrens zum Prüfen elektronischer Einrichtungen und Vorrichtung
DE3408337C2 (enrdf_load_stackoverflow)
DE3001263A1 (de) Signalform-erfassungsschaltungsanordnung
DE19527651C2 (de) Binärbildprozessor
CH622916A5 (enrdf_load_stackoverflow)
DE2907990A1 (de) Verfahren und vorrichtung zum abtasten der amplitude eines signals
DE2124754B2 (de) Verfahren und Vorrichtung zur differentiellen Pulscodemodulation
DE4118978C2 (enrdf_load_stackoverflow)
DE3322705A1 (de) Verfahren und schaltungsanordnung zur videoschnellen bestimmung des medianwertes eines auswertefensters
EP0440931A1 (de) Wirbelstromprüfgerät
DD153458A5 (de) Verfahren zur umwandlung von digitalen chrominanz-signalen eines rechtwinkligen farbkoordinaten-systems in digitale farbton-signale und saettigungs-signale eines polaren farbkoordinaten-systems und transformationsschaltung
DE2539628A1 (de) Schaltungsanordnung
DE1105914B (de) Schaltung zur automatischen Regelung und/oder Begrenzung der Hoehe von Impulsfolgen
DE4435765C2 (de) Analog/Digital-Konverter
DE69112321T2 (de) Bildverbesserung.
DE2452949B2 (de) Schriftzeichensignalverarbeitungsanordnung
DE2354769A1 (de) Verfahren und anordnung zur quantitativen auswertung der objekte eines nach einem rasterverfahren aufgenommenen bildes
DE2837139C3 (de) Verfahren und Schaltungsanordnung zur Impulsaufsteilung
DE3120622C2 (de) Logikanalysator
DE3443794C2 (enrdf_load_stackoverflow)
EP0039882A2 (de) Verfahren und Vorrichtung zum automatischen Erkennen eines Bildmusters, insbesondere eines Linienmusters
DE3313820A1 (de) Einrichtung zum pruefen der oberflaeche eines metallischen pruefteiles
DE4009383C2 (enrdf_load_stackoverflow)
DE3852503T2 (de) Verfahren und vorrichtung zur digitalen datenübertragung.
DE4106431C1 (enrdf_load_stackoverflow)

Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee