DE3882767D1 - Bandpass-digitaloszilloskop. - Google Patents

Bandpass-digitaloszilloskop.

Info

Publication number
DE3882767D1
DE3882767D1 DE8888300963T DE3882767T DE3882767D1 DE 3882767 D1 DE3882767 D1 DE 3882767D1 DE 8888300963 T DE8888300963 T DE 8888300963T DE 3882767 T DE3882767 T DE 3882767T DE 3882767 D1 DE3882767 D1 DE 3882767D1
Authority
DE
Germany
Prior art keywords
digitaloscilloscope
bandpass
bandpass digitaloscilloscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8888300963T
Other languages
English (en)
Other versions
DE3882767T2 (de
Inventor
Victor Lee Hansen
Shiv Kumar Balakkrishnan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of DE3882767D1 publication Critical patent/DE3882767D1/de
Application granted granted Critical
Publication of DE3882767T2 publication Critical patent/DE3882767T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/345—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Complex Calculations (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Analogue/Digital Conversion (AREA)
DE88300963T 1987-04-03 1988-02-05 Bandpass-Digitaloszilloskop. Expired - Fee Related DE3882767T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/034,312 US4802098A (en) 1987-04-03 1987-04-03 Digital bandpass oscilloscope

Publications (2)

Publication Number Publication Date
DE3882767D1 true DE3882767D1 (de) 1993-09-09
DE3882767T2 DE3882767T2 (de) 1994-02-03

Family

ID=21875635

Family Applications (1)

Application Number Title Priority Date Filing Date
DE88300963T Expired - Fee Related DE3882767T2 (de) 1987-04-03 1988-02-05 Bandpass-Digitaloszilloskop.

Country Status (4)

Country Link
US (1) US4802098A (de)
EP (1) EP0285238B1 (de)
JP (1) JPH0635990B2 (de)
DE (1) DE3882767T2 (de)

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JPH07117562B2 (ja) * 1988-10-18 1995-12-18 株式会社ケンウッド スペクトラムアナライザ
US4983906A (en) * 1989-08-17 1991-01-08 Hewlett-Packard Company Frequency estimation system
US5068813A (en) * 1989-11-07 1991-11-26 Mts Systems Corporation Phased digital filtering in multichannel environment
US5153501A (en) * 1990-03-19 1992-10-06 Yokogawa Electric Corporation Waveform measuring device
US5072168A (en) * 1990-11-09 1991-12-10 Hewlett-Packard Company Automatic scaling for display of modulation domain measurements
US5162723A (en) * 1991-02-11 1992-11-10 Hewlett-Packard Company Sampling signal analyzer
GB2252829B (en) * 1991-02-15 1994-10-19 Crystal Semiconductor Corp Method and apparatus for decreasing the interference and noise sensitivity of a ratiometric converter type of circuit
US5122731A (en) * 1991-02-25 1992-06-16 The United States Of America As Represented By The Administrator, National Aeronautics And Space Adnministration Method and apparatus for frequency spectrum analysis
US5233546A (en) * 1991-08-14 1993-08-03 Hewlett-Packard Company Anti-alias filtering apparatus for frequency domain measurements
US5363311A (en) * 1992-09-04 1994-11-08 Hughes Aircraft Company Data compression system using response waveform discrimination
US5532936A (en) * 1992-10-21 1996-07-02 Perry; John W. Transform method and spectrograph for displaying characteristics of speech
US5375067A (en) * 1992-12-11 1994-12-20 Nicolet Instrument Corporation Method and apparatus for adjustment of acquisition parameters in a data acquisition system such as a digital oscilloscope
US5594655A (en) * 1993-08-20 1997-01-14 Nicolet Instrument Corporation Method and apparatus for frequency triggering in digital oscilloscopes and the like
JP3359251B2 (ja) 1996-12-11 2002-12-24 ソニー・テクトロニクス株式会社 リアルタイム信号アナライザ
JP3377391B2 (ja) * 1997-02-12 2003-02-17 日本テクトロニクス株式会社 リアルタイム信号アナライザ
JP3406493B2 (ja) * 1997-10-22 2003-05-12 安藤電気株式会社 電気光学プローブの信号処理回路
US6301547B2 (en) * 1998-11-02 2001-10-09 Agilent Technologies Inc. Method and apparatus for automatically acquiring a waveform measurement
US6490535B1 (en) * 1999-04-15 2002-12-03 Tektronix, Inc. Method and apparatus for calibrating an instrument
DE60045611D1 (de) * 1999-12-21 2011-03-24 Tektronix Inc Frequenzbereich-Analysesystem für ein Zeitbereich-Messinstrument
US6681191B1 (en) * 1999-12-21 2004-01-20 Tektronix, Inc. Frequency domain analysis system for a time domain measurement instrument
US6377260B1 (en) * 2000-01-24 2002-04-23 The United States Of America As Represented By The National Security Agency Method of displaying real and imaginary components of a waveform
US6615148B2 (en) * 2000-05-17 2003-09-02 Tektronix, Inc. Streaming distributed test and measurement instrument
US7480328B2 (en) * 2001-05-18 2009-01-20 Rohde & Schwarz Gmbh & Co. Kg Signal generator with display unit
US6693576B2 (en) * 2002-05-23 2004-02-17 Tektronix, Inc. Methods and apparatus providing multiple concurrent acquisition modes in a digitizing measurement instrument
US6768430B1 (en) * 2003-03-19 2004-07-27 Agilent Technologies, Inc. System and method for establishing a subsampling rate for repetitive signals
US20040196286A1 (en) * 2003-04-01 2004-10-07 Microsoft Corporation Progressive scale graph
US20070027675A1 (en) * 2005-07-26 2007-02-01 Lecroy Corporation Spectrum analyzer control in an oscilloscope
DE102006042114A1 (de) 2006-09-07 2008-03-27 Rohde & Schwarz Gmbh & Co. Kg Vorrichtung und Verfahren zur Analyse eines über ein Mehrkanalsystem übertragenen Messsignals
US8374813B2 (en) * 2008-06-10 2013-02-12 Advantest Corporation Sampling apparatus, sampling method and recording medium
US8271222B2 (en) * 2008-06-10 2012-09-18 Advantest Corporation Sampling apparatus and sampling method
US8229706B2 (en) * 2008-06-10 2012-07-24 Advantest Corporation Sampling apparatus, sampling method and recording medium
AR073128A1 (es) * 2008-08-26 2010-10-13 Spx Corp Modulo de osciloscopio digital
AR073129A1 (es) * 2008-08-26 2010-10-13 Spx Corp Modulo de osciloscopio digital con deteccion de fallas en la recepcion de la senal.
US9297834B2 (en) * 2010-08-13 2016-03-29 Tektronix, Inc. Time-domain searching in a test and measurement instrument
US8521460B2 (en) * 2010-09-28 2013-08-27 Tektronix, Inc. Multi-domain test and measurement instrument
US8675719B2 (en) 2010-09-28 2014-03-18 Tektronix, Inc. Multi-domain test and measurement instrument
US8615382B2 (en) * 2011-01-27 2013-12-24 Tektronix, Inc. Test and measurement instrument with common presentation of time domain data
US9026390B2 (en) * 2011-09-06 2015-05-05 Tektronix, Inc. Interleaved RF triggering on a test and measurement instrument
CN103389413B (zh) * 2013-07-09 2016-02-24 中国电子科技集团公司第四十一研究所 一种频谱直方图的实时统计方法
US10228394B2 (en) * 2016-02-29 2019-03-12 Keysight Technologies, Inc. Measurement system that stores pre- and post-qualification signal data
CN106296609B (zh) * 2016-08-09 2023-09-12 广东盈动高科自动化有限公司 用于容栅的全波和数字滤波去噪方法和电路

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JPS5020392A (de) * 1973-06-21 1975-03-04
US4104725A (en) * 1976-03-26 1978-08-01 Norland Corporation Programmed calculating input signal module for waveform measuring and analyzing instrument
JPS52119274A (en) * 1976-03-31 1977-10-06 Tdk Corp Signal analyzing system
DE2758154C3 (de) * 1977-12-27 1980-09-04 Siemens Ag, 1000 Berlin Und 8000 Muenchen Meßeinrichtung für eine Frequenzanalyse von Signalpegeln innerhalb eines großen Dynamikbereiches
GB2039432B (en) * 1978-10-02 1983-01-26 Lloyd Instr Electronic memory unit
US4225940A (en) * 1978-10-02 1980-09-30 Tektronix, Inc. Oscilloscope system for acquiring, processing, and displaying information
US4251754A (en) * 1979-09-04 1981-02-17 Tektronix, Inc. Digital oscilloscope with reduced jitter due to sample uncertainty
US4507740A (en) * 1981-09-08 1985-03-26 Grumman Aerospace Corporation Programmable signal analyzer
IT1155558B (it) * 1982-07-19 1987-01-28 Cselt Centro Studi Lab Telecom Procedimento e strumento per la misura dell ampiezza di un segnale periodico fortemente affetto da rumore e senza riferimento di fase
JPS5975156A (ja) * 1982-10-21 1984-04-27 テクトロニクス・インコ−ポレイテツド デジタル・ストレ−ジ・オシロスコ−プ
US4585975A (en) * 1983-04-21 1986-04-29 Tektronix, Inc. High speed Boolean logic trigger oscilloscope vertical amplifier with edge sensitivity and nested trigger
US4621217A (en) * 1984-09-21 1986-11-04 Tektronix, Inc. Anti-aliasing filter circuit for oscilloscopes
US4656598A (en) * 1984-11-06 1987-04-07 Hewlett Packard Company Alias detector for digital oscilloscopes
US4694402A (en) * 1985-05-28 1987-09-15 Basic Measuring Instruments Waveform disturbance detection apparatus and method
JPH0619390B2 (ja) * 1985-08-08 1994-03-16 横河・ヒユ−レツト・パツカ−ド株式会社 デイジタル・フ−リエ変換の後処理方法
US4654584A (en) * 1985-12-12 1987-03-31 Analogic Corporation High-speed precision equivalent time sampling A/D converter and method

Also Published As

Publication number Publication date
EP0285238B1 (de) 1993-08-04
US4802098A (en) 1989-01-31
JPS63261166A (ja) 1988-10-27
JPH0635990B2 (ja) 1994-05-11
DE3882767T2 (de) 1994-02-03
EP0285238A1 (de) 1988-10-05

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee