DE3876726D1 - Temperaturpegeldetektorschaltung. - Google Patents

Temperaturpegeldetektorschaltung.

Info

Publication number
DE3876726D1
DE3876726D1 DE8888402171T DE3876726T DE3876726D1 DE 3876726 D1 DE3876726 D1 DE 3876726D1 DE 8888402171 T DE8888402171 T DE 8888402171T DE 3876726 T DE3876726 T DE 3876726T DE 3876726 D1 DE3876726 D1 DE 3876726D1
Authority
DE
Germany
Prior art keywords
detector circuit
level detector
temperature level
temperature
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8888402171T
Other languages
English (en)
Other versions
DE3876726T2 (de
Inventor
Serge Fruhauf
Eric Mattera
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
SGS Thomson Microelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS Thomson Microelectronics SA filed Critical SGS Thomson Microelectronics SA
Publication of DE3876726D1 publication Critical patent/DE3876726D1/de
Application granted granted Critical
Publication of DE3876726T2 publication Critical patent/DE3876726T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K3/00—Thermometers giving results other than momentary value of temperature
    • G01K3/005—Circuits arrangements for indicating a predetermined temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Amplifiers (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Memories (AREA)
  • Read Only Memory (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
DE8888402171T 1987-08-31 1988-08-26 Temperaturpegeldetektorschaltung. Expired - Fee Related DE3876726T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8712070A FR2619958B1 (fr) 1987-08-31 1987-08-31 Circuit de detection de seuil de temperature

Publications (2)

Publication Number Publication Date
DE3876726D1 true DE3876726D1 (de) 1993-01-28
DE3876726T2 DE3876726T2 (de) 1993-04-22

Family

ID=9354502

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8888402171T Expired - Fee Related DE3876726T2 (de) 1987-08-31 1988-08-26 Temperaturpegeldetektorschaltung.

Country Status (5)

Country Link
US (1) US4924212A (de)
EP (1) EP0306396B1 (de)
JP (1) JP2781793B2 (de)
DE (1) DE3876726T2 (de)
FR (1) FR2619958B1 (de)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5070322A (en) * 1989-07-19 1991-12-03 Fuji Electric Co., Ltd. An overheating detection circuit including a reversely biased junction having a temperature dependent reverse leakage current for detecting overheating of a power integrated circuit
FR2651881B1 (fr) * 1989-09-12 1994-01-07 Sgs Thomson Microelectronics Sa Circuit de detection de seuil de temperature.
FR2655737B1 (fr) * 1989-12-08 1992-06-12 Sgs Thomson Microelectronics Detecteur de variation rapide d'alimentation de circuit integre.
FR2660795B1 (fr) * 1990-04-10 1994-01-07 Sgs Thomson Microelectronics Sa Circuit de detection de fusible.
US5355123A (en) * 1990-07-17 1994-10-11 Fuji Electric Co., Ltd. Overheating detection circuit for detecting overheating of a power device
US5349336A (en) * 1990-07-17 1994-09-20 Fuji Electric Co., Ltd. Overheating detection circuit for detecting overheating of a power device
DE69132345T2 (de) * 1990-11-26 2001-03-29 Fuji Electric Co., Ltd. Überhitzungsdetektionsschaltung zum Detektieren eines Überhitzens einer Leistungsschaltung
US5196833A (en) * 1991-08-13 1993-03-23 Ford Motor Company Low voltage detector circuit
US5213416A (en) * 1991-12-13 1993-05-25 Unisys Corporation On chip noise tolerant temperature sensing circuit
US5710515A (en) * 1993-08-27 1998-01-20 Texas Instruments Incorporated Non-volatile memory in power and linear integrated circuits
US5875142A (en) * 1997-06-17 1999-02-23 Micron Technology, Inc. Integrated circuit with temperature detector
GB9716838D0 (en) * 1997-08-08 1997-10-15 Philips Electronics Nv Temperature sensing circuits
US6342997B1 (en) * 1998-02-11 2002-01-29 Therm-O-Disc, Incorporated High sensitivity diode temperature sensor with adjustable current source
DE10103991C1 (de) * 2001-01-30 2002-06-06 Infineon Technologies Ag Verfahren zur Ermittlung der Temperatur eines Halbleiterbauelements insbesondere beim Fehlertest
JP3868756B2 (ja) * 2001-04-10 2007-01-17 シャープ株式会社 半導体装置の内部電源電圧発生回路
US6959258B2 (en) * 2003-02-18 2005-10-25 Lsi Logic Corporation Methods and structure for IC temperature self-monitoring
US7406397B2 (en) * 2004-09-02 2008-07-29 International Business Machines Corporation Self heating monitor for SiGe and SOI CMOS devices
JP4641164B2 (ja) * 2004-09-14 2011-03-02 ルネサスエレクトロニクス株式会社 過熱検出回路
US7969228B2 (en) * 2009-06-22 2011-06-28 International Business Machines Corporation Thermal switch for integrated circuits, design structure, and method of sensing temperature
KR101276947B1 (ko) * 2011-06-27 2013-06-19 엘에스산전 주식회사 저전력, 고정밀, 넓은 온도범위의 온도 센서
US9939335B2 (en) * 2014-12-17 2018-04-10 Nxp Usa, Inc. Over-temperature detector with test mode
CN107063487B (zh) * 2017-06-13 2019-09-20 京东方科技集团股份有限公司 温度传感器、显示面板和显示装置
CN115291070B (zh) * 2022-07-29 2024-03-19 杭州中安电子有限公司 基于动态的hdrb及hdgb测试方法和装置

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2929968A (en) * 1956-04-30 1960-03-22 Sylvania Electric Prod Thermal switches
DE1141805B (de) * 1956-12-29 1962-12-27 Reich Robert W Elektrisches Tastthermometer
US3453887A (en) * 1967-02-08 1969-07-08 Corning Glass Works Temperature change measuring device
US3491596A (en) * 1967-10-02 1970-01-27 Vito Charles P De Temperature sensing device
US3540283A (en) * 1968-12-23 1970-11-17 Vito Charles P De Temperature sensor
DE2519335C2 (de) * 1975-04-30 1977-05-18 Siemens Ag Elektronischer temperaturabnehmer, vorzugsweise zur messung von koerpertemperaturen
US4121461A (en) * 1977-11-17 1978-10-24 General Electric Company Electronic temperature sensor
JPS54143183A (en) * 1978-04-07 1979-11-08 Seiko Epson Corp Temperature detecting circuit
DE2933874C2 (de) * 1978-08-24 1986-07-17 Hochiki Corp., Tokio/Tokyo Fühlvorrichtung zur Wahrnehmung von Temperaturunterschieden zwischen zwei Punkten
US4313082A (en) * 1980-06-30 1982-01-26 Motorola, Inc. Positive temperature coefficient current source and applications
JPS57148221A (en) * 1981-03-10 1982-09-13 Citizen Watch Co Ltd Temperature detecting device
JPS59107226A (ja) * 1982-12-10 1984-06-21 Citizen Watch Co Ltd 温度検出器
DE3430712A1 (de) * 1984-08-21 1986-03-06 Hoechst Ag, 6230 Frankfurt Verfahren zur reduzierung von unterstrahlungen bei der bestrahlung von reproduktionsschichten
JPS61233330A (ja) * 1985-04-09 1986-10-17 Nec Corp 温度センサ回路
US4625128A (en) * 1985-09-23 1986-11-25 Gte Communication Systems Corp. Integrated circuit temperature sensor
US4760433A (en) * 1986-01-31 1988-07-26 Harris Corporation ESD protection transistors
US4730228A (en) * 1986-03-21 1988-03-08 Siemens Aktiengesellschaft Overtemperature detection of power semiconductor components

Also Published As

Publication number Publication date
FR2619958B1 (fr) 1992-02-21
JPH0198931A (ja) 1989-04-17
EP0306396B1 (de) 1992-12-16
US4924212A (en) 1990-05-08
EP0306396A1 (de) 1989-03-08
FR2619958A1 (fr) 1989-03-03
JP2781793B2 (ja) 1998-07-30
DE3876726T2 (de) 1993-04-22

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee