JPS54143183A - Temperature detecting circuit - Google Patents

Temperature detecting circuit

Info

Publication number
JPS54143183A
JPS54143183A JP4093478A JP4093478A JPS54143183A JP S54143183 A JPS54143183 A JP S54143183A JP 4093478 A JP4093478 A JP 4093478A JP 4093478 A JP4093478 A JP 4093478A JP S54143183 A JPS54143183 A JP S54143183A
Authority
JP
Japan
Prior art keywords
temperature detecting
circuit
variation
detecting circuit
fets
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4093478A
Other languages
Japanese (ja)
Inventor
Mitsumasa Iwamoto
Tatsuji Asakawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Suwa Seikosha KK
Original Assignee
Seiko Epson Corp
Suwa Seikosha KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp, Suwa Seikosha KK filed Critical Seiko Epson Corp
Priority to JP4093478A priority Critical patent/JPS54143183A/en
Publication of JPS54143183A publication Critical patent/JPS54143183A/en
Pending legal-status Critical Current

Links

Landscapes

  • Measuring Temperature Or Quantity Of Heat (AREA)

Abstract

PURPOSE:To improve the performance of an integrated temperature detecting circuit by using the difference in temperature characteristics between two diodes or transistors as temperature detecting means. CONSTITUTION:A temperature detecting circuit is constructed to include temperature detecting diodes 211 and 212, FETs 213 and 214 and an operational circuit 215. The potential Vo at the output terminal 216 of the detecting circuit is varied with the rate of the currents flowing through the FETs 213 and 214. As a result, if the two FETs have beta1 and beta2 as beta, the potential Vo is controlled in accordance with the ratio of beta2/beta1 but is not dependent upon the variation in the voltage variation and variation in the threshold voltage value. In other words, the variation due to the fluctuations between the elements as the IC circuit can be eliminated. Transistors may be used in place of the diodes. Thus, it is possible to produce an integrated circuit which is free from the variation due to the fluctuations of the elements.
JP4093478A 1978-04-07 1978-04-07 Temperature detecting circuit Pending JPS54143183A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4093478A JPS54143183A (en) 1978-04-07 1978-04-07 Temperature detecting circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4093478A JPS54143183A (en) 1978-04-07 1978-04-07 Temperature detecting circuit

Publications (1)

Publication Number Publication Date
JPS54143183A true JPS54143183A (en) 1979-11-08

Family

ID=12594324

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4093478A Pending JPS54143183A (en) 1978-04-07 1978-04-07 Temperature detecting circuit

Country Status (1)

Country Link
JP (1) JPS54143183A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0198931A (en) * 1987-08-31 1989-04-17 Sgs Thomson Microelectron Sa Detection circuit for temperature threshold
US5639163A (en) * 1994-11-14 1997-06-17 International Business Machines Corporation On-chip temperature sensing system

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0198931A (en) * 1987-08-31 1989-04-17 Sgs Thomson Microelectron Sa Detection circuit for temperature threshold
US5639163A (en) * 1994-11-14 1997-06-17 International Business Machines Corporation On-chip temperature sensing system

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