DE3871257D1 - Reflektometrie im zeitbereich (otdr) zum pruefen von optischen fasern. - Google Patents

Reflektometrie im zeitbereich (otdr) zum pruefen von optischen fasern.

Info

Publication number
DE3871257D1
DE3871257D1 DE8888901977T DE3871257T DE3871257D1 DE 3871257 D1 DE3871257 D1 DE 3871257D1 DE 8888901977 T DE8888901977 T DE 8888901977T DE 3871257 T DE3871257 T DE 3871257T DE 3871257 D1 DE3871257 D1 DE 3871257D1
Authority
DE
Germany
Prior art keywords
otdr
reflectometry
optical fibers
time range
testing optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8888901977T
Other languages
English (en)
Other versions
DE3871257T (de
Inventor
Moshe Nazarathy
A Newton
Haines Foster
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Application granted granted Critical
Publication of DE3871257T publication Critical patent/DE3871257T/de
Publication of DE3871257D1 publication Critical patent/DE3871257D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3109—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR
    • G01M11/3118—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR using coded light-pulse sequences
DE8888901977T 1987-01-21 1988-01-21 Reflektometrie im zeitbereich (otdr) zum pruefen von optischen fasern. Expired - Lifetime DE3871257D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/005,993 US4812038A (en) 1987-01-21 1987-01-21 Adaptive selection of OTDR test parameters and the fusion of data taken from successively shrinking measurement spans

Publications (2)

Publication Number Publication Date
DE3871257T DE3871257T (de) 1992-06-25
DE3871257D1 true DE3871257D1 (de) 1992-06-25

Family

ID=21718747

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8888901977T Expired - Lifetime DE3871257D1 (de) 1987-01-21 1988-01-21 Reflektometrie im zeitbereich (otdr) zum pruefen von optischen fasern.

Country Status (6)

Country Link
US (1) US4812038A (de)
EP (1) EP0298118B1 (de)
JP (1) JP2674817B2 (de)
DE (1) DE3871257D1 (de)
DK (1) DK521988A (de)
WO (1) WO1988005531A1 (de)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01169408A (ja) * 1987-12-21 1989-07-04 Fujikura Ltd シングルモード光ファイバ接続部の判定法
US4958926A (en) * 1988-10-31 1990-09-25 Reliance Comm/Tec Corporation Closed loop control system for laser
US4928232A (en) * 1988-12-16 1990-05-22 Laser Precision Corporation Signal averaging for optical time domain relectometers
EP0379609B1 (de) * 1989-01-24 1993-07-28 Hewlett-Packard GmbH Verfahren und Vorrichtung zum Anwenden von optischen Zeitbereichsreflektometern
US5155439A (en) * 1989-12-12 1992-10-13 Tektronix, Inc. Method of detecting and characterizing anomalies in a propagative medium
US5069544A (en) * 1990-04-12 1991-12-03 Minnesota Mining And Manufacturing Company Adaptive pulse width optical fault finder
JP2977091B2 (ja) * 1990-09-28 1999-11-10 安藤電気株式会社 ヘテロダイン受光を用いた光パルス試験器
US5353110A (en) * 1991-07-12 1994-10-04 Tektronix, Inc. Method and apparatus for carrying out optical time domain reflectometry using weighing techniques
US5485264A (en) * 1993-12-14 1996-01-16 Antel Optronics, Inc. High dynamic range OTDR data acquisition circuit
US5465143A (en) * 1994-01-27 1995-11-07 Antel Optronics Inc. ADP switch and adjustable data acquisition window
US5552881A (en) * 1994-03-17 1996-09-03 Teradyne, Inc. Method and apparatus for scanning a fiber optic network
US5491548A (en) * 1994-03-18 1996-02-13 Tektronix, Inc. Optical signal measurement instrument and wide dynamic range optical receiver for use therein
US5528356A (en) * 1995-03-20 1996-06-18 Tektronix, Inc. Apparatus and method for displaying multiple sample spacing waveform segments
DE19631423B4 (de) * 1996-08-06 2005-11-03 Forschungszentrum Karlsruhe Gmbh Verfahren zum ortsaufgelösten Substanznachweis
JPH10111212A (ja) * 1996-10-09 1998-04-28 Ando Electric Co Ltd 光パルス試験器
JP2004514145A (ja) * 2000-11-17 2004-05-13 レクロイ　コーポレイション 制御変数
JP4688231B2 (ja) * 2006-07-03 2011-05-25 アンリツ株式会社 オプチカルタイムドメインリフレクトメータ及び光パルスを用いる光ファイバの試験方法
US8077314B2 (en) 2007-10-15 2011-12-13 Schlumberger Technology Corporation Measuring a characteristic of a multimode optical fiber
KR101536375B1 (ko) * 2008-06-02 2015-07-13 스미토모 덴키 고교 가부시키가이샤 광 선로 감시 장치 및 광 선로 감시 시스템
DE102008044317B4 (de) * 2008-12-03 2011-02-10 Universität Potsdam Vorrichtung und Verfahren zur Konzentrationsbestimmung von Sauerstoff
CN101917226B (zh) * 2010-08-23 2016-03-02 中兴通讯股份有限公司 一种在无源光网络中进行光纤故障诊断的方法及光线路终端
US9752955B2 (en) 2014-07-31 2017-09-05 Ii-Vi Incorporated Edge propagating optical time domain reflectometer and method of using the same
US9341543B2 (en) 2014-10-16 2016-05-17 Texas Instruments Incorporated Method and OTDR apparatus for optical cable defect location with reduced memory requirement
KR20160112079A (ko) * 2015-03-17 2016-09-28 한국전자통신연구원 광분배망에서의 광선로 검사 방법 및 그에 따른 검사 장치
US10101240B1 (en) 2017-04-27 2018-10-16 Viavi Solutions France SAS Optical time-domain reflectometer device including combined trace display

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4158505A (en) * 1976-12-27 1979-06-19 International Business Machines Corporation Spectrum analyzing system with photodiode array
DK538681A (da) * 1981-12-07 1983-07-29 Re Instr As Apparat til maaling af lyslederes transmissionsegenskaber

Also Published As

Publication number Publication date
JPH01501970A (ja) 1989-07-06
DE3871257T (de) 1992-06-25
EP0298118A1 (de) 1989-01-11
WO1988005531A1 (en) 1988-07-28
DK521988D0 (da) 1988-09-20
US4812038A (en) 1989-03-14
JP2674817B2 (ja) 1997-11-12
DK521988A (da) 1988-09-20
EP0298118B1 (de) 1992-05-20

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee