DE3856296D1 - Tunnelstromkodierer - Google Patents
TunnelstromkodiererInfo
- Publication number
- DE3856296D1 DE3856296D1 DE3856296T DE3856296T DE3856296D1 DE 3856296 D1 DE3856296 D1 DE 3856296D1 DE 3856296 T DE3856296 T DE 3856296T DE 3856296 T DE3856296 T DE 3856296T DE 3856296 D1 DE3856296 D1 DE 3856296D1
- Authority
- DE
- Germany
- Prior art keywords
- tunnel current
- current encoder
- encoder
- tunnel
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
- G01D5/244—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/003—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring position, not involving coordinate determination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
- G01D5/244—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains
- G01D5/245—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains using a variable number of pulses in a train
- G01D5/2451—Incremental encoders
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
- G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
- G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
- G11B9/1418—Disposition or mounting of heads or record carriers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
- G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
- G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
- G11B9/1418—Disposition or mounting of heads or record carriers
- G11B9/1427—Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
- G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
- G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
- G11B9/1463—Record carriers for recording or reproduction involving the use of microscopic probe means
- G11B9/1472—Record carriers for recording or reproduction involving the use of microscopic probe means characterised by the form
- G11B9/1481—Auxiliary features, e.g. reference or indexing surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
- G01Q10/04—Fine scanning or positioning
- G01Q10/06—Circuits or algorithms therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/10—STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
- G01Q60/16—Probes, their manufacture, or their related instrumentation, e.g. holders
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q80/00—Applications, other than SPM, of scanning-probe techniques
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
- G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
- G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
- G11B9/1463—Record carriers for recording or reproduction involving the use of microscopic probe means
- G11B9/1472—Record carriers for recording or reproduction involving the use of microscopic probe means characterised by the form
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/85—Scanning probe control process
- Y10S977/851—Particular movement or positioning of scanning tip
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/86—Scanning probe structure
- Y10S977/861—Scanning tunneling probe
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/902—Specified use of nanostructure
- Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
- Y10S977/943—Information storage or retrieval using nanostructure
- Y10S977/947—Information storage or retrieval using nanostructure with scanning probe instrument
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Transmission And Conversion Of Sensor Element Output (AREA)
Applications Claiming Priority (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62212153A JP2603270B2 (ja) | 1987-08-25 | 1987-08-25 | 記録装置および再生装置 |
JP62212154A JP2632862B2 (ja) | 1987-08-25 | 1987-08-25 | 位置検出装置 |
JP62305747A JP2547333B2 (ja) | 1987-12-04 | 1987-12-04 | 位置検出装置 |
JP62305748A JP2547334B2 (ja) | 1987-12-04 | 1987-12-04 | 位置検出装置 |
JP62309421A JP2559048B2 (ja) | 1987-12-09 | 1987-12-09 | 相対変位量測定装置 |
JP20130688A JP2670448B2 (ja) | 1988-08-12 | 1988-08-12 | 記録再生装置 |
JP63201307A JP2851855B2 (ja) | 1988-08-12 | 1988-08-12 | 記録再生装置 |
JP20130888A JP2692879B2 (ja) | 1988-08-12 | 1988-08-12 | 相対変位量測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3856296D1 true DE3856296D1 (de) | 1999-02-25 |
DE3856296T2 DE3856296T2 (de) | 1999-07-15 |
Family
ID=27573426
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE3856296T Expired - Fee Related DE3856296T2 (de) | 1987-08-25 | 1988-08-24 | Tunnelstromkodierer |
DE3854173T Expired - Fee Related DE3854173T2 (de) | 1987-08-25 | 1988-08-24 | Codiereinrichtung. |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE3854173T Expired - Fee Related DE3854173T2 (de) | 1987-08-25 | 1988-08-24 | Codiereinrichtung. |
Country Status (3)
Country | Link |
---|---|
US (2) | US5519686A (de) |
EP (2) | EP0304893B1 (de) |
DE (2) | DE3856296T2 (de) |
Families Citing this family (82)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3856296T2 (de) * | 1987-08-25 | 1999-07-15 | Canon K.K., Tokio/Tokyo | Tunnelstromkodierer |
JP2714211B2 (ja) * | 1989-03-16 | 1998-02-16 | キヤノン株式会社 | 記録及び再生装置 |
US5241527A (en) * | 1989-03-16 | 1993-08-31 | Canon Kabushiki Kaisha | Recording and reproducing apparatus and method using a recording layer having a positioning region |
DE69002503T2 (de) * | 1989-03-29 | 1994-03-03 | Canon Kk | Kantendetektor. |
US5304924A (en) * | 1989-03-29 | 1994-04-19 | Canon Kabushiki Kaisha | Edge detector |
JP2775464B2 (ja) * | 1989-04-27 | 1998-07-16 | キヤノン株式会社 | 位置検出装置 |
JP2686645B2 (ja) * | 1989-05-08 | 1997-12-08 | キヤノン株式会社 | 走査型トンネル電流検出装置 |
DE69012644T2 (de) * | 1989-05-17 | 1995-04-06 | Canon Kk | Vorrichtung zur Ermittlung einer Position. |
DE3921756C1 (de) * | 1989-07-01 | 1991-01-03 | Teldix Gmbh, 6900 Heidelberg, De | |
EP0416920B1 (de) * | 1989-09-07 | 1996-01-03 | Canon Kabushiki Kaisha | Informationsverarbeitungsverfahren und -vorrichtung |
JP2996748B2 (ja) * | 1990-02-09 | 2000-01-11 | キヤノン株式会社 | 位置ずれ検出装置および方法 |
JP2945090B2 (ja) * | 1990-07-09 | 1999-09-06 | キヤノン株式会社 | エンコーダ |
US5441804A (en) * | 1991-02-12 | 1995-08-15 | Mitsubishi Plastics Industries Limited | Magneto-optical recording medium and method for production thereof |
JP2983876B2 (ja) * | 1994-03-22 | 1999-11-29 | 徹雄 大原 | リアルタイムかつナノメータスケールの位置測定方法および装置 |
US6339217B1 (en) * | 1995-07-28 | 2002-01-15 | General Nanotechnology Llc | Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements |
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US5751683A (en) * | 1995-07-24 | 1998-05-12 | General Nanotechnology, L.L.C. | Nanometer scale data storage device and associated positioning system |
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JP3625530B2 (ja) * | 1995-06-12 | 2005-03-02 | ヒューレット・パッカード・カンパニー | 位置検出装置及び位置検出方法 |
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US6507553B2 (en) | 1995-07-24 | 2003-01-14 | General Nanotechnology Llc | Nanometer scale data storage device and associated positioning system |
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US5744799A (en) * | 1996-05-20 | 1998-04-28 | Ohara; Tetsuo | Apparatus for and method of real-time nanometer-scale position measurement of the sensor of a scanning tunneling microscope or other sensor scanning atomic or other undulating surfaces |
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US5856967A (en) * | 1997-08-27 | 1999-01-05 | International Business Machines Corporation | Atomic force microscopy data storage system with tracking servo from lateral force-sensing cantilever |
US6195313B1 (en) * | 1997-08-29 | 2001-02-27 | Canon Kabushiki Kaisha | Tracking mechanism and method using probes for information recording/reproducing apparatus |
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US6923044B1 (en) | 2001-03-08 | 2005-08-02 | General Nanotechnology Llc | Active cantilever for nanomachining and metrology |
US7196328B1 (en) | 2001-03-08 | 2007-03-27 | General Nanotechnology Llc | Nanomachining method and apparatus |
US6802646B1 (en) * | 2001-04-30 | 2004-10-12 | General Nanotechnology Llc | Low-friction moving interfaces in micromachines and nanomachines |
US6787768B1 (en) | 2001-03-08 | 2004-09-07 | General Nanotechnology Llc | Method and apparatus for tool and tip design for nanomachining and measurement |
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EP3262425A1 (de) | 2015-02-26 | 2018-01-03 | Xallent, LLC | Systeme und verfahren zur herstellung von nano-elektromechanischen systemsonden |
WO2016138373A1 (en) * | 2015-02-26 | 2016-09-01 | Xallent, LLC | Multiple integrated tips scanning probe microscope |
KR20220067593A (ko) * | 2020-11-16 | 2022-05-25 | 삼성전자주식회사 | 근접장 검출용 프로브 및 이를 포함하는 근접장 검출 시스템 |
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US2715830A (en) * | 1952-07-12 | 1955-08-23 | Gen Motors Corp | Specimen for calibrating surface roughness measuring apparatus |
CH643397A5 (de) * | 1979-09-20 | 1984-05-30 | Ibm | Raster-tunnelmikroskop. |
US4575822A (en) * | 1983-02-15 | 1986-03-11 | The Board Of Trustees Of The Leland Stanford Junior University | Method and means for data storage using tunnel current data readout |
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JPS63304103A (ja) * | 1987-06-05 | 1988-12-12 | Hitachi Ltd | 走査表面顕微鏡 |
DE3856296T2 (de) * | 1987-08-25 | 1999-07-15 | Canon K.K., Tokio/Tokyo | Tunnelstromkodierer |
US4814622A (en) * | 1987-11-06 | 1989-03-21 | Bell Communications Research, Inc. | High speed scanning tunneling microscope |
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US4987303A (en) * | 1989-04-07 | 1991-01-22 | Olympus Optical Co., Inc. | Micro-displacement detector device, piezo-actuator provided with the micro-displacement detector device and scanning probe microscope provided with the piezo-actuator |
JP2775464B2 (ja) * | 1989-04-27 | 1998-07-16 | キヤノン株式会社 | 位置検出装置 |
-
1988
- 1988-08-24 DE DE3856296T patent/DE3856296T2/de not_active Expired - Fee Related
- 1988-08-24 EP EP88113794A patent/EP0304893B1/de not_active Expired - Lifetime
- 1988-08-24 EP EP94120561A patent/EP0646913B1/de not_active Expired - Lifetime
- 1988-08-24 DE DE3854173T patent/DE3854173T2/de not_active Expired - Fee Related
-
1995
- 1995-05-08 US US08/438,079 patent/US5519686A/en not_active Expired - Lifetime
-
1996
- 1996-01-22 US US08/589,473 patent/US5721721A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US5721721A (en) | 1998-02-24 |
EP0304893A2 (de) | 1989-03-01 |
EP0304893B1 (de) | 1995-07-19 |
EP0646913A3 (de) | 1996-08-21 |
DE3854173T2 (de) | 1995-11-30 |
DE3854173D1 (de) | 1995-08-24 |
DE3856296T2 (de) | 1999-07-15 |
EP0646913B1 (de) | 1999-01-13 |
EP0304893A3 (de) | 1993-04-07 |
US5519686A (en) | 1996-05-21 |
EP0646913A2 (de) | 1995-04-05 |
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