DE3853937D1 - Verfahren zur Überwachung von Hochtemperaturbehandlungsprozessen. - Google Patents
Verfahren zur Überwachung von Hochtemperaturbehandlungsprozessen.Info
- Publication number
- DE3853937D1 DE3853937D1 DE3853937T DE3853937T DE3853937D1 DE 3853937 D1 DE3853937 D1 DE 3853937D1 DE 3853937 T DE3853937 T DE 3853937T DE 3853937 T DE3853937 T DE 3853937T DE 3853937 D1 DE3853937 D1 DE 3853937D1
- Authority
- DE
- Germany
- Prior art keywords
- high temperature
- temperature treatment
- treatment processes
- monitoring high
- fume
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000034 method Methods 0.000 title abstract 3
- 238000012544 monitoring process Methods 0.000 title 1
- 239000003517 fume Substances 0.000 abstract 2
- 239000007789 gas Substances 0.000 abstract 2
- 238000010310 metallurgical process Methods 0.000 abstract 1
- 238000004886 process control Methods 0.000 abstract 1
- 230000001698 pyrogenic effect Effects 0.000 abstract 1
- 230000005855 radiation Effects 0.000 abstract 1
- 238000004876 x-ray fluorescence Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Immunology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Polyoxymethylene Polymers And Polymers With Carbon-To-Carbon Bonds (AREA)
- Waste-Gas Treatment And Other Accessory Devices For Furnaces (AREA)
- Control Of Heat Treatment Processes (AREA)
- Medicines Containing Antibodies Or Antigens For Use As Internal Diagnostic Agents (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Measuring Oxygen Concentration In Cells (AREA)
- Dental Preparations (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB878725741A GB8725741D0 (en) | 1987-11-03 | 1987-11-03 | Control of pyrometallurgical processes |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3853937D1 true DE3853937D1 (de) | 1995-07-13 |
DE3853937T2 DE3853937T2 (de) | 1995-12-14 |
Family
ID=10626367
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE3853937T Expired - Lifetime DE3853937T2 (de) | 1987-11-03 | 1988-11-02 | Verfahren zur Überwachung von Hochtemperaturbehandlungsprozessen. |
Country Status (8)
Country | Link |
---|---|
US (1) | US4921221A (de) |
EP (1) | EP0315436B1 (de) |
JP (1) | JP2749599B2 (de) |
AT (1) | ATE123573T1 (de) |
CA (1) | CA1301373C (de) |
DE (1) | DE3853937T2 (de) |
ES (1) | ES2073404T3 (de) |
GB (2) | GB8725741D0 (de) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB8725741D0 (en) | 1987-11-03 | 1987-12-09 | Secretary Trade Ind Brit | Control of pyrometallurgical processes |
JP6325338B2 (ja) * | 2014-05-20 | 2018-05-16 | 株式会社堀場製作所 | 分析装置及び校正方法 |
IT201700100060A1 (it) * | 2017-09-06 | 2019-03-06 | De Tec Tor S R L | Apparato di selezione di prodotti in base alla loro composizione tramite spettroscopia a fluorescenza a raggi x e relativo procedimento di selezione |
US20230323508A1 (en) * | 2022-04-08 | 2023-10-12 | Trevor Hawkins, JR. | System and method for beneficiating and collecting lithium using a fluidized bed reactor |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS49101094A (de) * | 1973-01-17 | 1974-09-25 | ||
JPS5017695A (de) * | 1973-06-14 | 1975-02-25 | ||
US4004921A (en) * | 1974-05-23 | 1977-01-25 | Du Pont Of Canada Limited | Treatment of lead sulphide |
JPS5139580U (de) * | 1974-09-18 | 1976-03-24 | ||
JPS51137487A (en) * | 1975-05-22 | 1976-11-27 | Mitsubishi Electric Corp | Fluorescent x-ray analyser |
FR2416269A1 (fr) * | 1978-01-31 | 1979-08-31 | Anvar | Procede de valorisation du plomb et du zinc contenus dans les boues d'epuration secondaire des gaz de hauts fourneaux |
JPS5533626A (en) * | 1978-09-01 | 1980-03-08 | Kawasaki Steel Corp | Analysis of quantity of coating of of fundamental surface plate or not with the use of fluorescent x ray |
DE2915986C2 (de) * | 1979-04-20 | 1982-04-08 | Kernforschungszentrum Karlsruhe Gmbh, 7500 Karlsruhe | Verfahren zur kontinuierlichen Messung von Elementgehalten |
JPS56145339A (en) * | 1980-04-15 | 1981-11-12 | Nisshin Steel Co Ltd | Measuring method for quantity of chlorine in polyvinyl chloride resin |
US4686694A (en) * | 1980-12-15 | 1987-08-11 | Ramsey Engineering Company | Probe for an apparatus for analyzing metals by X-ray fluorescence |
GB2089499A (en) * | 1980-12-15 | 1982-06-23 | Ramsey Eng Co | X-ray Radiation Analyser |
JPH0660879B2 (ja) * | 1984-05-10 | 1994-08-10 | 理学電機工業株式会社 | 被膜の厚みと組成の同時分析法 |
JPS6161003A (ja) * | 1984-09-03 | 1986-03-28 | Seiko Instr & Electronics Ltd | X線によるメツキ層の厚さ測定方法、及び測定装置 |
JPS6228157U (de) * | 1985-08-06 | 1987-02-20 | ||
JPH0637319Y2 (ja) * | 1985-12-31 | 1994-09-28 | 株式会社堀場製作所 | 螢光x線分析装置 |
JPS62240846A (ja) * | 1986-04-14 | 1987-10-21 | Seiko Instr & Electronics Ltd | 螢光x線測定装置の校正方法 |
GB8621983D0 (en) * | 1986-09-12 | 1986-10-22 | K X Technology Ltd | Ore analysis |
GB8725741D0 (en) | 1987-11-03 | 1987-12-09 | Secretary Trade Ind Brit | Control of pyrometallurgical processes |
-
1987
- 1987-11-03 GB GB878725741A patent/GB8725741D0/en active Pending
-
1988
- 1988-10-19 GB GB8824495A patent/GB2211930B/en not_active Expired
- 1988-11-01 US US07/265,708 patent/US4921221A/en not_active Expired - Lifetime
- 1988-11-02 AT AT88310320T patent/ATE123573T1/de not_active IP Right Cessation
- 1988-11-02 EP EP88310320A patent/EP0315436B1/de not_active Expired - Lifetime
- 1988-11-02 JP JP63278539A patent/JP2749599B2/ja not_active Expired - Fee Related
- 1988-11-02 CA CA000582016A patent/CA1301373C/en not_active Expired - Lifetime
- 1988-11-02 ES ES88310320T patent/ES2073404T3/es not_active Expired - Lifetime
- 1988-11-02 DE DE3853937T patent/DE3853937T2/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH01244346A (ja) | 1989-09-28 |
DE3853937T2 (de) | 1995-12-14 |
US4921221A (en) | 1990-05-01 |
EP0315436A3 (en) | 1990-07-11 |
ATE123573T1 (de) | 1995-06-15 |
EP0315436B1 (de) | 1995-06-07 |
ES2073404T3 (es) | 1995-08-16 |
JP2749599B2 (ja) | 1998-05-13 |
GB8824495D0 (en) | 1988-11-23 |
GB8725741D0 (en) | 1987-12-09 |
GB2211930B (en) | 1991-10-09 |
EP0315436A2 (de) | 1989-05-10 |
CA1301373C (en) | 1992-05-19 |
GB2211930A (en) | 1989-07-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |