JPS5533626A - Analysis of quantity of coating of of fundamental surface plate or not with the use of fluorescent x ray - Google Patents
Analysis of quantity of coating of of fundamental surface plate or not with the use of fluorescent x rayInfo
- Publication number
- JPS5533626A JPS5533626A JP10628978A JP10628978A JPS5533626A JP S5533626 A JPS5533626 A JP S5533626A JP 10628978 A JP10628978 A JP 10628978A JP 10628978 A JP10628978 A JP 10628978A JP S5533626 A JPS5533626 A JP S5533626A
- Authority
- JP
- Japan
- Prior art keywords
- ray
- fluorescent
- coating
- metered
- gradient
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: To make it possible to obtain the accurate quantity of a coating by compensating the influence upon the measured value the intensity of the fluorescent X ray of the special element, which is influenced from the content of a special element in a fundamental body and from the thickness of the plated layer.
CONSTITUTION: A test piece 3 of a Zn-plated steel plate treated with chromate is exposed to the primary X ray of a radiation source 1 so that the fluorescent X ray 4 of Cr irradiated goes through a spectroscopic crystal 5 and a solar slit 6 into a detector 7 connected with a high voltage power source 7a. The output pulses go through a preamplifier 8, a waveform shaping amplifier 9 and a crest analyzer 10 into a counting device 11 which is controlled by a timer 12. The counted value is fed to a computer 13 so that the gradient h of the metered ray indicating the relationship of the counted percentage of the X ray to the quantity S of the coating of Cr, the content C of Cr in the steel plate, the gradient k of the metered ray thereto, the absorption coefficient a of Cr to the Zn of the fluorescent X ray, and the thickness d of the plated layer are used to calculate the quantity S of the coating, which is displayed in a display 14.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10628978A JPS5533626A (en) | 1978-09-01 | 1978-09-01 | Analysis of quantity of coating of of fundamental surface plate or not with the use of fluorescent x ray |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10628978A JPS5533626A (en) | 1978-09-01 | 1978-09-01 | Analysis of quantity of coating of of fundamental surface plate or not with the use of fluorescent x ray |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5533626A true JPS5533626A (en) | 1980-03-08 |
Family
ID=14429890
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10628978A Pending JPS5533626A (en) | 1978-09-01 | 1978-09-01 | Analysis of quantity of coating of of fundamental surface plate or not with the use of fluorescent x ray |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5533626A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01244346A (en) * | 1987-11-03 | 1989-09-28 | Uk Government | Monitoring of heat generation process |
| JPH05264481A (en) * | 1992-03-19 | 1993-10-12 | Nkk Corp | On-line measuring method for amount of adhered cr to chromate-treated film on plated steel plate |
-
1978
- 1978-09-01 JP JP10628978A patent/JPS5533626A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01244346A (en) * | 1987-11-03 | 1989-09-28 | Uk Government | Monitoring of heat generation process |
| JPH05264481A (en) * | 1992-03-19 | 1993-10-12 | Nkk Corp | On-line measuring method for amount of adhered cr to chromate-treated film on plated steel plate |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE3279479D1 (en) | Apparatus for measuring thickness | |
| JPS5533626A (en) | Analysis of quantity of coating of of fundamental surface plate or not with the use of fluorescent x ray | |
| JPS52105877A (en) | Measurement of water content trapped in granular body | |
| Oyama et al. | Experimental results for phase II of the JAERI/USDOE collaborative program on fusion blanket neutronics | |
| JPS6441810A (en) | Method for measuring applied film on metal thickness | |
| JPS57131036A (en) | Light scattering type floating particle counting | |
| Mayer et al. | A scintillation counter technique for the X-ray determination of bone mineral content | |
| Fassel et al. | Flame emission spectrometric determination of aluminum, cobalt, chromium, copper, manganese, niobium, and vanadium in low and high alloy steel | |
| JPS54685A (en) | Simultaneously measurement of florescent x ray and diffracted x ray of minute area | |
| JPS57197409A (en) | Measuring method for film thickness of magnetic substance coated on both sides of high polymer film | |
| JPS5722542A (en) | Simple x-ray image processing device | |
| JPS57190205A (en) | Method for measuring thickness of painted film by fluorescent x ray | |
| JPS5558438A (en) | Device for measuring concentration by infrared ray | |
| EP0317339A3 (en) | Method and apparatus for gauging material loss due to corrosion and/or erosion | |
| JPS55164341A (en) | On-line measuring method of austenite ouantity in rolled steel plate | |
| JPS52110656A (en) | Dimension measuring method | |
| JPS53142295A (en) | Fluorescent x-ray analyzer | |
| JPS57211004A (en) | Method and device for measuring thickness of glassy thin film | |
| SU749203A1 (en) | Radiation method of measuring moisture content of loose materials | |
| SU1408213A1 (en) | Method of measuring mass surface density or thickness | |
| JPS55158545A (en) | Online measuring method of austenite value in rolled steel plate | |
| JPS5421868A (en) | Measuring instrument for pipe wall thickness and its usage | |
| JPS54143184A (en) | Temperature measurement | |
| JPS533884A (en) | Stress measuring apparatus x-ray | |
| JPS53139591A (en) | Radiation measuring apparatus |