ATE123573T1 - Verfahren zur überwachung von hochtemperaturbehandlungsprozessen. - Google Patents

Verfahren zur überwachung von hochtemperaturbehandlungsprozessen.

Info

Publication number
ATE123573T1
ATE123573T1 AT88310320T AT88310320T ATE123573T1 AT E123573 T1 ATE123573 T1 AT E123573T1 AT 88310320 T AT88310320 T AT 88310320T AT 88310320 T AT88310320 T AT 88310320T AT E123573 T1 ATE123573 T1 AT E123573T1
Authority
AT
Austria
Prior art keywords
high temperature
temperature treatment
treatment processes
monitoring high
fume
Prior art date
Application number
AT88310320T
Other languages
English (en)
Inventor
Douglas Flett
Gary Holt
Peter John Tily
Original Assignee
British Steel Plc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by British Steel Plc filed Critical British Steel Plc
Application granted granted Critical
Publication of ATE123573T1 publication Critical patent/ATE123573T1/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Control Of Heat Treatment Processes (AREA)
  • Medicines Containing Antibodies Or Antigens For Use As Internal Diagnostic Agents (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Polyoxymethylene Polymers And Polymers With Carbon-To-Carbon Bonds (AREA)
  • Waste-Gas Treatment And Other Accessory Devices For Furnaces (AREA)
  • Measuring Oxygen Concentration In Cells (AREA)
  • Dental Preparations (AREA)
AT88310320T 1987-11-03 1988-11-02 Verfahren zur überwachung von hochtemperaturbehandlungsprozessen. ATE123573T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB878725741A GB8725741D0 (en) 1987-11-03 1987-11-03 Control of pyrometallurgical processes

Publications (1)

Publication Number Publication Date
ATE123573T1 true ATE123573T1 (de) 1995-06-15

Family

ID=10626367

Family Applications (1)

Application Number Title Priority Date Filing Date
AT88310320T ATE123573T1 (de) 1987-11-03 1988-11-02 Verfahren zur überwachung von hochtemperaturbehandlungsprozessen.

Country Status (8)

Country Link
US (1) US4921221A (de)
EP (1) EP0315436B1 (de)
JP (1) JP2749599B2 (de)
AT (1) ATE123573T1 (de)
CA (1) CA1301373C (de)
DE (1) DE3853937T2 (de)
ES (1) ES2073404T3 (de)
GB (2) GB8725741D0 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8725741D0 (en) 1987-11-03 1987-12-09 Secretary Trade Ind Brit Control of pyrometallurgical processes
JP6325338B2 (ja) * 2014-05-20 2018-05-16 株式会社堀場製作所 分析装置及び校正方法
IT201700100060A1 (it) * 2017-09-06 2019-03-06 De Tec Tor S R L Apparato di selezione di prodotti in base alla loro composizione tramite spettroscopia a fluorescenza a raggi x e relativo procedimento di selezione
US20230323508A1 (en) * 2022-04-08 2023-10-12 Trevor Hawkins, JR. System and method for beneficiating and collecting lithium using a fluidized bed reactor

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49101094A (de) * 1973-01-17 1974-09-25
JPS5017695A (de) * 1973-06-14 1975-02-25
US4004921A (en) * 1974-05-23 1977-01-25 Du Pont Of Canada Limited Treatment of lead sulphide
JPS5139580U (de) * 1974-09-18 1976-03-24
JPS51137487A (en) * 1975-05-22 1976-11-27 Mitsubishi Electric Corp Fluorescent x-ray analyser
FR2416269A1 (fr) * 1978-01-31 1979-08-31 Anvar Procede de valorisation du plomb et du zinc contenus dans les boues d'epuration secondaire des gaz de hauts fourneaux
JPS5533626A (en) * 1978-09-01 1980-03-08 Kawasaki Steel Corp Analysis of quantity of coating of of fundamental surface plate or not with the use of fluorescent x ray
DE2915986C2 (de) * 1979-04-20 1982-04-08 Kernforschungszentrum Karlsruhe Gmbh, 7500 Karlsruhe Verfahren zur kontinuierlichen Messung von Elementgehalten
US4686694A (en) * 1980-12-15 1987-08-11 Ramsey Engineering Company Probe for an apparatus for analyzing metals by X-ray fluorescence
GB2089499A (en) * 1980-12-15 1982-06-23 Ramsey Eng Co X-ray Radiation Analyser
JPH0660879B2 (ja) * 1984-05-10 1994-08-10 理学電機工業株式会社 被膜の厚みと組成の同時分析法
JPS6161003A (ja) * 1984-09-03 1986-03-28 Seiko Instr & Electronics Ltd X線によるメツキ層の厚さ測定方法、及び測定装置
JPS6228157U (de) * 1985-08-06 1987-02-20
JPH0637319Y2 (ja) * 1985-12-31 1994-09-28 株式会社堀場製作所 螢光x線分析装置
JPS62240846A (ja) * 1986-04-14 1987-10-21 Seiko Instr & Electronics Ltd 螢光x線測定装置の校正方法
GB8621983D0 (en) * 1986-09-12 1986-10-22 K X Technology Ltd Ore analysis
GB8725741D0 (en) 1987-11-03 1987-12-09 Secretary Trade Ind Brit Control of pyrometallurgical processes

Also Published As

Publication number Publication date
JPH01244346A (ja) 1989-09-28
CA1301373C (en) 1992-05-19
GB2211930A (en) 1989-07-12
EP0315436B1 (de) 1995-06-07
GB2211930B (en) 1991-10-09
EP0315436A3 (en) 1990-07-11
EP0315436A2 (de) 1989-05-10
JP2749599B2 (ja) 1998-05-13
DE3853937T2 (de) 1995-12-14
GB8824495D0 (en) 1988-11-23
DE3853937D1 (de) 1995-07-13
ES2073404T3 (es) 1995-08-16
US4921221A (en) 1990-05-01
GB8725741D0 (en) 1987-12-09

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Legal Events

Date Code Title Description
UEP Publication of translation of european patent specification
EELA Cancelled due to lapse of time