DE3824948C2 - - Google Patents

Info

Publication number
DE3824948C2
DE3824948C2 DE19883824948 DE3824948A DE3824948C2 DE 3824948 C2 DE3824948 C2 DE 3824948C2 DE 19883824948 DE19883824948 DE 19883824948 DE 3824948 A DE3824948 A DE 3824948A DE 3824948 C2 DE3824948 C2 DE 3824948C2
Authority
DE
Germany
Prior art keywords
output
input
amplifier
capacitor
eddy current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE19883824948
Other languages
German (de)
English (en)
Other versions
DE3824948A1 (de
Inventor
Valerij Valentinovic Riga Su Gavrilin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
FIZIKO-ENERGETICESKIJ INSTITUT AKADEMII NAUK LATVIJSKOJ SSR RIGA SU
Original Assignee
FIZIKO-ENERGETICESKIJ INSTITUT AKADEMII NAUK LATVIJSKOJ SSR RIGA SU
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by FIZIKO-ENERGETICESKIJ INSTITUT AKADEMII NAUK LATVIJSKOJ SSR RIGA SU filed Critical FIZIKO-ENERGETICESKIJ INSTITUT AKADEMII NAUK LATVIJSKOJ SSR RIGA SU
Priority to DE19883824948 priority Critical patent/DE3824948A1/de
Publication of DE3824948A1 publication Critical patent/DE3824948A1/de
Application granted granted Critical
Publication of DE3824948C2 publication Critical patent/DE3824948C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
DE19883824948 1988-07-22 1988-07-22 Wirbelstrom-einrichtung zur zerstoerungsfreien pruefung Granted DE3824948A1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19883824948 DE3824948A1 (de) 1988-07-22 1988-07-22 Wirbelstrom-einrichtung zur zerstoerungsfreien pruefung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19883824948 DE3824948A1 (de) 1988-07-22 1988-07-22 Wirbelstrom-einrichtung zur zerstoerungsfreien pruefung

Publications (2)

Publication Number Publication Date
DE3824948A1 DE3824948A1 (de) 1990-01-25
DE3824948C2 true DE3824948C2 (en, 2012) 1991-01-31

Family

ID=6359330

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19883824948 Granted DE3824948A1 (de) 1988-07-22 1988-07-22 Wirbelstrom-einrichtung zur zerstoerungsfreien pruefung

Country Status (1)

Country Link
DE (1) DE3824948A1 (en, 2012)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19908360A1 (de) * 1998-12-18 2000-06-29 Micro Epsilon Messtechnik Verfahren zum Betreiben eines Wirbelstromsensors und Wirbelstromsensor

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2043347A1 (en) * 1990-05-30 1991-12-01 Yukio Kohmura Method and system for inspection of electroconductive film using eddy current and process and system for production of optical fibres using method and system
GB9922426D0 (en) * 1999-09-23 1999-11-24 Apv Ltd Apparatus and method for detecting cracks in metal articles
CN120326199A (zh) * 2025-06-10 2025-07-18 苏州星祥益精密制造有限公司 一种基于非接触电阻测量的飞秒激光加工测控系统

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU508734A1 (ru) * 1973-12-04 1976-03-30 Предприятие П/Я А-1857 Вихретоковый накладной преобразователь
SU538213A1 (ru) * 1975-06-03 1976-12-05 Предприятие П/Я Р-6303 Электромагнитный толщиномер
SU862063A1 (ru) * 1978-04-11 1981-09-07 Физико-Энергетический Институт Ан Латвийской Сср Способ измерени сопротивлени тонких провод щих покрытий и устройство дл его реализации
DE3005915C2 (de) * 1980-02-16 1985-01-10 Skf Kugellagerfabriken Gmbh, 8720 Schweinfurt Wirbelstromprüfgerät für Oberflächenfehler

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19908360A1 (de) * 1998-12-18 2000-06-29 Micro Epsilon Messtechnik Verfahren zum Betreiben eines Wirbelstromsensors und Wirbelstromsensor

Also Published As

Publication number Publication date
DE3824948A1 (de) 1990-01-25

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee