DE3788508D1 - Röntgen-Mikroskop. - Google Patents

Röntgen-Mikroskop.

Info

Publication number
DE3788508D1
DE3788508D1 DE87117658T DE3788508T DE3788508D1 DE 3788508 D1 DE3788508 D1 DE 3788508D1 DE 87117658 T DE87117658 T DE 87117658T DE 3788508 T DE3788508 T DE 3788508T DE 3788508 D1 DE3788508 D1 DE 3788508D1
Authority
DE
Germany
Prior art keywords
ray microscope
microscope
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE87117658T
Other languages
English (en)
Inventor
Guenter Prof Dr Schmahl
Dietbert Dr Rudolph
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Carl Zeiss SMT GmbH
Carl Zeiss AG
Original Assignee
Carl Zeiss SMT GmbH
Carl Zeiss AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss SMT GmbH, Carl Zeiss AG filed Critical Carl Zeiss SMT GmbH
Priority to DE87117658T priority Critical patent/DE3788508D1/de
Application granted granted Critical
Publication of DE3788508D1 publication Critical patent/DE3788508D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K7/00—Gamma- or X-ray microscopes
DE87117658T 1986-12-12 1987-11-28 Röntgen-Mikroskop. Expired - Fee Related DE3788508D1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE87117658T DE3788508D1 (de) 1986-12-12 1987-11-28 Röntgen-Mikroskop.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19863642457 DE3642457A1 (de) 1986-12-12 1986-12-12 Roentgen-mikroskop
DE87117658T DE3788508D1 (de) 1986-12-12 1987-11-28 Röntgen-Mikroskop.

Publications (1)

Publication Number Publication Date
DE3788508D1 true DE3788508D1 (de) 1994-01-27

Family

ID=6316038

Family Applications (2)

Application Number Title Priority Date Filing Date
DE19863642457 Withdrawn DE3642457A1 (de) 1986-12-12 1986-12-12 Roentgen-mikroskop
DE87117658T Expired - Fee Related DE3788508D1 (de) 1986-12-12 1987-11-28 Röntgen-Mikroskop.

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE19863642457 Withdrawn DE3642457A1 (de) 1986-12-12 1986-12-12 Roentgen-mikroskop

Country Status (5)

Country Link
US (1) US4870674A (de)
EP (1) EP0270968B1 (de)
JP (1) JPH0814640B2 (de)
DE (2) DE3642457A1 (de)
DK (1) DK174016B1 (de)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH678663A5 (de) * 1988-06-09 1991-10-15 Zeiss Carl Fa
US5199057A (en) * 1989-08-09 1993-03-30 Nikon Corporation Image formation-type soft X-ray microscopic apparatus
JP2775949B2 (ja) * 1990-01-10 1998-07-16 株式会社ニコン Ｘ線光学素子保持枠
US5022061A (en) * 1990-04-30 1991-06-04 The United States Of America As Represented By The United States Department Of Energy An image focusing means by using an opaque object to diffract x-rays
US5204887A (en) * 1990-06-01 1993-04-20 Canon Kabushiki Kaisha X-ray microscope
DE4027285A1 (de) * 1990-08-29 1992-03-05 Zeiss Carl Fa Roentgenmikroskop
US5432607A (en) * 1993-02-22 1995-07-11 International Business Machines Corporation Method and apparatus for inspecting patterned thin films using diffracted beam ellipsometry
US5432349A (en) * 1993-03-15 1995-07-11 The United State Of America As Represented By The Secretary Of The Navy Fourier transform microscope for x-ray and/or gamma-ray imaging
DE4432811B4 (de) * 1993-09-15 2006-04-13 Carl Zeiss Phasenkontrast-Röntgenmikroskop
JP3741411B2 (ja) * 1999-10-01 2006-02-01 株式会社リガク Ｘ線集光装置及びｘ線装置
KR100689308B1 (ko) * 2002-03-05 2007-03-26 아부베케로비츠 쿠마크호브 무라딘 엑스선 현미경
US7245696B2 (en) * 2002-05-29 2007-07-17 Xradia, Inc. Element-specific X-ray fluorescence microscope and method of operation
US7365909B2 (en) * 2002-10-17 2008-04-29 Xradia, Inc. Fabrication methods for micro compounds optics
US7119953B2 (en) * 2002-12-27 2006-10-10 Xradia, Inc. Phase contrast microscope for short wavelength radiation and imaging method
DE10352741B4 (de) * 2003-11-12 2012-08-16 Austriamicrosystems Ag Strahlungsdetektierendes optoelektronisches Bauelement, Verfahren zu dessen Herstellung und Verwendung
US20050211910A1 (en) * 2004-03-29 2005-09-29 Jmar Research, Inc. Morphology and Spectroscopy of Nanoscale Regions using X-Rays Generated by Laser Produced Plasma
GB0409572D0 (en) * 2004-04-29 2004-06-02 Univ Sheffield High resolution imaging
US7302043B2 (en) * 2004-07-27 2007-11-27 Gatan, Inc. Rotating shutter for laser-produced plasma debris mitigation
US7466796B2 (en) * 2004-08-05 2008-12-16 Gatan, Inc. Condenser zone plate illumination for point X-ray sources
US7452820B2 (en) * 2004-08-05 2008-11-18 Gatan, Inc. Radiation-resistant zone plates and method of manufacturing thereof
US8001862B2 (en) * 2007-11-20 2011-08-23 Harley-Davidson Motor Company Group, Inc. Reverse drive assembly for a motorcycle
US9269471B2 (en) 2009-03-27 2016-02-23 Koninklijke Philips N.V. Differential phase-contrast imaging with circular gratings
US9291578B2 (en) 2012-08-03 2016-03-22 David L. Adler X-ray photoemission microscope for integrated devices
US9129715B2 (en) 2012-09-05 2015-09-08 SVXR, Inc. High speed x-ray inspection microscope
JP2022069273A (ja) * 2020-10-23 2022-05-11 株式会社リガク 結像型ｘ線顕微鏡

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49300A (de) * 1972-03-15 1974-01-05
US4105289A (en) * 1976-04-29 1978-08-08 University Patents, Inc. Apparatus and method for image sampling
JPS6049300A (ja) * 1983-08-29 1985-03-18 日本電子株式会社 Ｘ線顕微鏡

Also Published As

Publication number Publication date
DK652287D0 (da) 1987-12-11
EP0270968A2 (de) 1988-06-15
EP0270968B1 (de) 1993-12-15
EP0270968A3 (en) 1989-08-02
JPS63163300A (ja) 1988-07-06
DK174016B1 (da) 2002-04-15
DE3642457A1 (de) 1988-06-30
JPH0814640B2 (ja) 1996-02-14
US4870674A (en) 1989-09-26
DK652287A (da) 1988-06-13

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee