DE3785403D1 - Verfahren zur konzentrationsmessung eines oberflaechenbeschichtigungsklebemittels. - Google Patents
Verfahren zur konzentrationsmessung eines oberflaechenbeschichtigungsklebemittels.Info
- Publication number
- DE3785403D1 DE3785403D1 DE8787306870T DE3785403T DE3785403D1 DE 3785403 D1 DE3785403 D1 DE 3785403D1 DE 8787306870 T DE8787306870 T DE 8787306870T DE 3785403 T DE3785403 T DE 3785403T DE 3785403 D1 DE3785403 D1 DE 3785403D1
- Authority
- DE
- Germany
- Prior art keywords
- surface coating
- coating adhesive
- concentrating
- measurement
- concentrating measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000853 adhesive Substances 0.000 title 1
- 230000001070 adhesive effect Effects 0.000 title 1
- 239000011248 coating agent Substances 0.000 title 1
- 238000000576 coating method Methods 0.000 title 1
- 238000005259 measurement Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/33—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
- G01J1/1626—Arrangements with two photodetectors, the signals of which are compared
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
- G01N2021/8427—Coatings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18306786 | 1986-08-04 | ||
JP62169506A JPH087145B2 (ja) | 1986-08-04 | 1987-07-07 | コ−ト層表面の接着剤濃度の測定方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3785403D1 true DE3785403D1 (de) | 1993-05-19 |
DE3785403T2 DE3785403T2 (de) | 1993-07-29 |
Family
ID=26492802
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8787306870T Expired - Lifetime DE3785403T2 (de) | 1986-08-04 | 1987-08-03 | Verfahren zur konzentrationsmessung eines oberflaechenbeschichtigungsklebemittels. |
Country Status (4)
Country | Link |
---|---|
US (1) | US4831264A (de) |
EP (1) | EP0256742B1 (de) |
JP (1) | JPH087145B2 (de) |
DE (1) | DE3785403T2 (de) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2866382B2 (ja) * | 1988-05-18 | 1999-03-08 | 大日本印刷株式会社 | 連続シートの糊付け加工における糊付け検知方法及び装置 |
JPH0232234A (ja) * | 1988-07-22 | 1990-02-02 | Yuutesu:Kk | 紫外線反射・透過率計 |
US4966455A (en) * | 1988-12-05 | 1990-10-30 | Union Camp Corporation | Real time mottle measuring device and method |
JPH0652240B2 (ja) * | 1989-02-16 | 1994-07-06 | 日本製紙株式会社 | 地合測定方法および地合測定装置 |
JPH0420845A (ja) * | 1990-05-15 | 1992-01-24 | Jujo Paper Co Ltd | 光沢むらの測定方法 |
US5521393A (en) * | 1994-06-27 | 1996-05-28 | Brunswick Bowling & Billiards Corporation | Lane monitor for monitoring dressing on the surface of a bowling lane |
AT408278B (de) * | 2000-03-27 | 2001-10-25 | Theurl Leimholzbau Gmbh | Verfahren zur automatisierten überwachung des klebstoffauftrags auf holz und holzwerkstoffen |
US6282950B1 (en) * | 2000-08-18 | 2001-09-04 | M. E. Taylor Engineering, Inc. | Method and apparatus for testing the bond strength of materials |
JP4210466B2 (ja) | 2002-04-22 | 2009-01-21 | 日立オムロンターミナルソリューションズ株式会社 | 判別装置 |
EP2278269B1 (de) * | 2005-11-07 | 2016-07-27 | Cardinal CG Company | Verfahren zum Identifizieren von fotokatalytischen Beschichtungen |
US8816295B2 (en) | 2012-10-05 | 2014-08-26 | Pitney Bowes Inc. | Adhesive detection system for mailpiece creation system |
CN113720854B (zh) * | 2021-08-20 | 2023-07-11 | 东风汽车集团股份有限公司 | 一种低光泽度车身油漆涂层外观检测方法 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3325649A (en) * | 1964-08-28 | 1967-06-13 | Polaroid Corp | Radiation responsive apparatus for monitoring a web |
US3405268A (en) * | 1965-03-12 | 1968-10-08 | Brun Sensor Systems Inc | Radiant energy absorption gage for measuring the weight of a base material and the content of a material sorbed by the base material |
US3395278A (en) * | 1965-07-14 | 1968-07-30 | Armstrong Cork Co | Method of measuring the coating thickness on articles |
JPS5425436B1 (de) * | 1970-07-04 | 1979-08-28 | ||
NL8103492A (nl) * | 1981-07-23 | 1983-02-16 | Thomassen & Drijver | Werkwijze voor het controleren van de bekleding van een metalen oppervlak, alsmede inrichting voor het uitvoeren van die werkwijze. |
JPS61209339A (ja) * | 1985-03-13 | 1986-09-17 | Chino Works Ltd | 光学的測定装置 |
-
1987
- 1987-07-07 JP JP62169506A patent/JPH087145B2/ja not_active Expired - Lifetime
- 1987-07-31 US US07/080,079 patent/US4831264A/en not_active Expired - Lifetime
- 1987-08-03 DE DE8787306870T patent/DE3785403T2/de not_active Expired - Lifetime
- 1987-08-03 EP EP87306870A patent/EP0256742B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE3785403T2 (de) | 1993-07-29 |
EP0256742A3 (en) | 1989-11-02 |
JPS63158442A (ja) | 1988-07-01 |
JPH087145B2 (ja) | 1996-01-29 |
EP0256742A2 (de) | 1988-02-24 |
US4831264A (en) | 1989-05-16 |
EP0256742B1 (de) | 1993-04-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: NIPPON PAPER INDUSTRIES CO. LTD., TOKIO/TOKYO, JP |