DE3779360D1 - Optische analysenmethode und vorrichtung mit programmierbarem raschen zugriff zu beliebigen wellenlaengen. - Google Patents
Optische analysenmethode und vorrichtung mit programmierbarem raschen zugriff zu beliebigen wellenlaengen.Info
- Publication number
- DE3779360D1 DE3779360D1 DE8787303386T DE3779360T DE3779360D1 DE 3779360 D1 DE3779360 D1 DE 3779360D1 DE 8787303386 T DE8787303386 T DE 8787303386T DE 3779360 T DE3779360 T DE 3779360T DE 3779360 D1 DE3779360 D1 DE 3779360D1
- Authority
- DE
- Germany
- Prior art keywords
- wavelength
- aotf
- optical
- analog converter
- tuned
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000004204 optical analysis method Methods 0.000 title 1
- 238000005259 measurement Methods 0.000 abstract 2
- 230000003287 optical effect Effects 0.000 abstract 2
- 238000004458 analytical method Methods 0.000 abstract 1
- 239000000835 fiber Substances 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 abstract 1
- 238000002834 transmittance Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/85—Investigating moving fluids or granular solids
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/1256—Generating the spectrum; Monochromators using acousto-optic tunable filter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J2001/4242—Modulated light, e.g. for synchronizing source and detector circuit
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J4/00—Measuring polarisation of light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N2021/1738—Optionally different kinds of measurements; Method being valid for different kinds of measurement
- G01N2021/1742—Optionally different kinds of measurements; Method being valid for different kinds of measurement either absorption or reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N21/474—Details of optical heads therefor, e.g. using optical fibres
- G01N2021/4742—Details of optical heads therefor, e.g. using optical fibres comprising optical fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4785—Standardising light scatter apparatus; Standards therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/065—Integrating spheres
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S359/00—Optical: systems and elements
- Y10S359/90—Methods
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Spectrometry And Color Measurement (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Optical Recording Or Reproduction (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/856,289 US4883963A (en) | 1986-04-28 | 1986-04-28 | Optical analysis method and apparatus having programmable rapid random wavelength access |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE3779360D1 true DE3779360D1 (de) | 1992-07-02 |
Family
ID=25323256
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE8787303386T Expired - Lifetime DE3779360D1 (de) | 1986-04-28 | 1987-04-16 | Optische analysenmethode und vorrichtung mit programmierbarem raschen zugriff zu beliebigen wellenlaengen. |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US4883963A (de) |
| EP (1) | EP0250070B1 (de) |
| JP (1) | JPS6333643A (de) |
| AT (1) | ATE76687T1 (de) |
| AU (1) | AU598252B2 (de) |
| BR (1) | BR8702030A (de) |
| CA (1) | CA1311367C (de) |
| DE (1) | DE3779360D1 (de) |
| ES (1) | ES2032441T3 (de) |
Families Citing this family (74)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR960013995B1 (ko) * | 1988-07-15 | 1996-10-11 | 도오교오 에레구토론 가부시끼가이샤 | 반도체 웨이퍼 기판의 표면온도 측정 방법 및 열처리 장치 |
| JPH0816747B2 (ja) * | 1988-07-19 | 1996-02-21 | 富士写真フイルム株式会社 | 光スペクトラムアナライザー |
| JPH02163304A (ja) * | 1988-12-15 | 1990-06-22 | Kubota Ltd | アルミニウム基急冷凝固粉末材製押出パイプの製造方法 |
| US5191215A (en) * | 1989-01-13 | 1993-03-02 | Iowa State University Research Foundation, Inc. | Apparatus and method for transient thermal infrared spectrometry of flowable enclosed materials |
| US4997280A (en) * | 1989-09-27 | 1991-03-05 | Nirsystems Incorporated | Spectrophotometric instrument with rapid scanning distortion correction |
| US5047639A (en) * | 1989-12-22 | 1991-09-10 | Wong Jacob Y | Concentration detector |
| US5039855A (en) * | 1990-03-05 | 1991-08-13 | Bran+Luebbe Analyzing Technologies, Inc. | Dual beam acousto-optic tunable spectrometer |
| US5120961A (en) * | 1990-03-16 | 1992-06-09 | Infrared Fiber Systems, Inc. | High sensitivity acousto-optic tunable filter spectrometer |
| GB9107796D0 (en) * | 1991-04-12 | 1991-05-29 | Nat Res Dev | Methods of and apparatus for measurement using acousto-optic devices |
| GB2254693B (en) * | 1991-04-12 | 1995-10-25 | British Tech Group | Methods of and apparatus for measuring using acousto-optic devices |
| US5583643A (en) * | 1991-04-12 | 1996-12-10 | British Technology Group Ltd. | Methods of and apparatus for measurement using acousto-optic devices |
| US5448069A (en) * | 1991-04-23 | 1995-09-05 | Buhler Ag Maschinenfabrik | Infrared measurement of constituents of particulate foodstuffs |
| SE468334B (sv) † | 1991-04-23 | 1992-12-14 | Peter Perten | Saett och anordning foer infraroedanalys, speciellt avseende livsmedel |
| DK165391D0 (da) * | 1991-09-27 | 1991-09-27 | Foss Electric As | Ir-maalesystem |
| US5636035A (en) * | 1991-09-30 | 1997-06-03 | The Trustees Of The Stevens Institute Of Technology | Method and apparatus for dual modulation laser spectroscopy |
| US5267019A (en) * | 1991-09-30 | 1993-11-30 | Consortium For Surface Processing, Inc. | Method and apparatus for reducing fringe interference in laser spectroscopy |
| US5258825A (en) * | 1991-11-13 | 1993-11-02 | Perten Instruments North America, Inc. | Optical compositional analyzer apparatus and method for detection of ash in wheat and milled wheat products |
| US5416575A (en) * | 1991-11-18 | 1995-05-16 | Schwartz; Mark | Method and system for calibrating an optical density measurement apparatus |
| US5216484A (en) * | 1991-12-09 | 1993-06-01 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Real-time imaging spectrometer |
| US5317379A (en) * | 1992-02-11 | 1994-05-31 | Rosemount Analytical Inc. | Chemical species optical analyzer with multiple fiber channels |
| US5406082A (en) * | 1992-04-24 | 1995-04-11 | Thiokol Corporation | Surface inspection and characterization system and process |
| US5541413A (en) * | 1992-04-24 | 1996-07-30 | Thiokol Corporation | Acousto-optic tunable filter-based surface scanning system and process |
| DE69330010T2 (de) * | 1992-05-29 | 2001-09-13 | Eastman Kodak Co., Rochester | Vorrichtung und Verfahren zur Beschichtungsdichteanalyse mittels Bildverarbeitung |
| US5436867A (en) * | 1993-03-08 | 1995-07-25 | Northrop Grumman Corporation | Holographic random access memory |
| US5615052A (en) * | 1993-04-16 | 1997-03-25 | Bruce W. McCaul | Laser diode/lens assembly |
| US5448071A (en) * | 1993-04-16 | 1995-09-05 | Bruce W. McCaul | Gas spectroscopy |
| US5625189A (en) * | 1993-04-16 | 1997-04-29 | Bruce W. McCaul | Gas spectroscopy |
| US5500768A (en) * | 1993-04-16 | 1996-03-19 | Bruce McCaul | Laser diode/lens assembly |
| US5435309A (en) * | 1993-08-10 | 1995-07-25 | Thomas; Edward V. | Systematic wavelength selection for improved multivariate spectral analysis |
| AU7828694A (en) * | 1993-08-24 | 1995-03-22 | Mark R. Robinson | A robust accurate non-invasive analyte monitor |
| US5444528A (en) * | 1994-07-27 | 1995-08-22 | The Titan Corporation | Tunable spectrometer with acousto-optical tunable filter |
| US5504332A (en) * | 1994-08-26 | 1996-04-02 | Merck & Co., Inc. | Method and system for determining the homogeneity of tablets |
| US5477321A (en) * | 1994-08-31 | 1995-12-19 | Bayer Corporation | Dual beam tunable spectrometer |
| US6031233A (en) * | 1995-08-31 | 2000-02-29 | Infrared Fiber Systems, Inc. | Handheld infrared spectrometer |
| EP0847524A4 (de) * | 1995-08-31 | 1999-10-13 | Infrared Fiber Syst Inc | Handinfrarotspektrometer |
| JP3654458B2 (ja) * | 1995-10-31 | 2005-06-02 | アークレイ株式会社 | 光源装置 |
| JPH09122128A (ja) | 1995-10-31 | 1997-05-13 | Kdk Corp | 測定条件再現具ならびに測定条件再現方法およびそれ を利用した生体情報測定装置 |
| JPH09133629A (ja) | 1995-11-08 | 1997-05-20 | Kdk Corp | 分光測定におけるスペクトルの処理方法およびそれを 用いた定量方法 |
| DE19601923C1 (de) * | 1996-01-12 | 1997-07-24 | Inst Chemo Biosensorik | Verfahren und Vorrichtung zum Erkennen organischer Substanzen |
| JPH09203916A (ja) * | 1996-01-25 | 1997-08-05 | Ando Electric Co Ltd | 光周波数掃引信号発生装置 |
| US5703364A (en) * | 1996-02-15 | 1997-12-30 | Futrex, Inc. | Method and apparatus for near-infrared quantitative analysis |
| US5796512A (en) * | 1996-02-16 | 1998-08-18 | Carnegie Mellon University | Subicron imaging system having an acousto-optic tunable filter |
| US5841577A (en) * | 1996-02-16 | 1998-11-24 | Carnegie Mellon University | Light microscope having acousto-optic tunable filters |
| US5652654A (en) * | 1996-08-12 | 1997-07-29 | Asimopoulos; George | Dual beam spectrophotometer |
| DE19644871A1 (de) * | 1996-10-29 | 1998-05-07 | Bran & Luebbe | Verfahren und Vorrichtung zur Bereitstellung von Schüttgutproben für die Analyse von Inhaltsstoffen |
| US6483583B1 (en) * | 1997-02-27 | 2002-11-19 | Textron Systems Corporation | Near infrared spectrometry for real time analysis of substances |
| US6064488A (en) * | 1997-06-06 | 2000-05-16 | Monitor Labs, Inc. | Method and apparatus for in situ gas concentration measurement |
| US6184528B1 (en) | 1998-08-27 | 2001-02-06 | Vought Aircraft Industries, Inc. | Method of spectral nondestructive evaluation |
| US6751576B2 (en) | 2000-03-10 | 2004-06-15 | Cognis Corporation | On-site agricultural product analysis system and method of analyzing |
| US6534768B1 (en) | 2000-10-30 | 2003-03-18 | Euro-Oeltique, S.A. | Hemispherical detector |
| US7277636B1 (en) | 2001-01-26 | 2007-10-02 | Gazdzinski Robert F | Optical communication apparatus and methods using pulses having modified propagation speeds |
| US7194369B2 (en) * | 2001-07-23 | 2007-03-20 | Cognis Corporation | On-site analysis system with central processor and method of analyzing |
| DE10137158B4 (de) * | 2001-07-30 | 2005-08-04 | Leica Microsystems Heidelberg Gmbh | Verfahren zur Scanmikroskopie und Scanmikroskop |
| JP2003106996A (ja) * | 2001-09-28 | 2003-04-09 | Jasco Corp | 加熱測定装置 |
| AU2002224970A1 (en) * | 2001-12-07 | 2003-06-17 | Discovision Associates | A solid state microoptical electromechanical system (moens) for reading a photonics diffractive memory |
| WO2003065022A1 (de) * | 2002-01-31 | 2003-08-07 | Haw-Ingenieure Gbr | Verfahren zur bestimmung von donzentration, groede und art von partikeln in dispersionen |
| CN100406872C (zh) * | 2002-11-04 | 2008-07-30 | 天津市先石光学技术有限公司 | 复合光谱测量方法及其光谱检测仪器 |
| US20050106876A1 (en) * | 2003-10-09 | 2005-05-19 | Taylor Charles A.Ii | Apparatus and method for real time measurement of substrate temperatures for use in semiconductor growth and wafer processing |
| US7291856B2 (en) * | 2005-04-28 | 2007-11-06 | Honeywell International Inc. | Sensor and methods for measuring select components in moving sheet products |
| US7859668B2 (en) | 2005-12-15 | 2010-12-28 | Honeywell International Inc. | Apparatus and method for illuminator-independent color measurements |
| US8017927B2 (en) | 2005-12-16 | 2011-09-13 | Honeywell International Inc. | Apparatus, system, and method for print quality measurements using multiple adjustable sensors |
| US7688447B2 (en) | 2005-12-29 | 2010-03-30 | Honeywell International Inc. | Color sensor |
| US7573575B2 (en) | 2005-12-29 | 2009-08-11 | Honeywell International Inc. | System and method for color measurements or other spectral measurements of a material |
| US20080010019A1 (en) * | 2006-07-06 | 2008-01-10 | Thomas Richard A | High speed spectrum analyzer |
| DE102007032849A1 (de) * | 2007-03-16 | 2008-09-18 | Biocomfort Diagnostics Gmbh | Messeinrichtung und Verfahren zur optischen Konzentrationsbestimmung von Blutzucker und/oder Laktat in biologischen Systemen |
| US8049892B2 (en) * | 2008-01-22 | 2011-11-01 | Honeywell International Inc. | Apparatus and method for camera-based color measurements |
| US7592608B2 (en) * | 2008-01-22 | 2009-09-22 | Honeywell International Inc. | Apparatus and method for measuring and/or controlling ultraviolet-activated materials in a paper-making process |
| DE102008011123B4 (de) * | 2008-02-26 | 2012-09-06 | Eads Deutschland Gmbh | Verfahren zur Bestimmung der Entfernung eines eine IR-Signatur emittierenden Objekts |
| US8401809B2 (en) | 2010-07-12 | 2013-03-19 | Honeywell International Inc. | System and method for adjusting an on-line appearance sensor system |
| US8786855B2 (en) * | 2011-01-25 | 2014-07-22 | Ocean Optics, Inc. | Shaped input apertures to improve resolution in grating spectrometers |
| CN106802186B (zh) * | 2017-02-24 | 2019-01-01 | 中国科学院上海技术物理研究所 | 基于声光调制激光波长跟随滤光的智能型窄带滤光系统 |
| DE102019104556A1 (de) * | 2019-02-22 | 2020-08-27 | Technische Universität Wien | Verfahren sowie eine Vorrichtung zur Bestimmung optischer Eigenschaften eines Probenmaterials |
| CN112285042A (zh) * | 2020-10-13 | 2021-01-29 | 上海中科航谱光电技术有限公司 | 一种测量光学材料透射光谱特性的光谱探测仪及其方法 |
| CN116659668A (zh) * | 2023-06-02 | 2023-08-29 | 徐州光引科技发展有限公司 | 一种光谱仪、光谱重构方法、及计算机设备 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3520614A (en) * | 1966-06-30 | 1970-07-14 | Phoenix Precision Instr Co | Spectrophotometer and process |
| US3679288A (en) * | 1970-11-13 | 1972-07-25 | Chromatix | Tunable acousto-optic method and apparatus |
| US3828173A (en) * | 1972-08-01 | 1974-08-06 | Dickey John Corp | Grain analysis computer circuit |
| US3861788A (en) * | 1972-08-24 | 1975-01-21 | Neotec Corp | Optical analyzer for agricultural products |
| JPS5340460B2 (de) * | 1973-07-03 | 1978-10-27 | ||
| JPS5431816B2 (de) * | 1973-12-14 | 1979-10-09 | ||
| JPS5340462B2 (de) * | 1973-08-30 | 1978-10-27 | ||
| US4052121A (en) * | 1975-09-10 | 1977-10-04 | Itek Corporation | Noncollinear tunable acousto-optic filter |
| US4082464A (en) * | 1976-10-07 | 1978-04-04 | Neotec Corporation | Optical analysis system having rotating filters |
| US4264205A (en) * | 1977-08-16 | 1981-04-28 | Neotec Corporation | Rapid scan spectral analysis system utilizing higher order spectral reflections of holographic diffraction gratings |
| US4285596A (en) * | 1977-08-16 | 1981-08-25 | Neotec Corporation | Holographic diffraction grating system for rapid scan spectral analysis |
| US4236076A (en) * | 1979-02-26 | 1980-11-25 | Technicon Instruments Corporation | Infrared analyzer |
| US4286327A (en) * | 1979-09-10 | 1981-08-25 | Trebor Industries, Inc. | Apparatus for near infrared quantitative analysis |
| US4342502A (en) * | 1980-06-12 | 1982-08-03 | Itek Corporation | Transverse tunable acousto-optic filter |
| US4404642A (en) * | 1981-05-15 | 1983-09-13 | Trebor Industries, Inc. | Apparatus for near infrared quantitative analysis with temperature variation correction |
| US4490845A (en) * | 1982-02-02 | 1984-12-25 | Westinghouse Electric Corp. | Automated acousto-optic infrared analyzer system |
| US4540282A (en) * | 1983-03-21 | 1985-09-10 | Isaac Landa | Apparatus for optically analyzing a sample |
| US4602342A (en) * | 1983-10-04 | 1986-07-22 | Westinghouse Electric Corp. | Acousto-optic tunable filter |
| US4663961A (en) * | 1985-09-17 | 1987-05-12 | Westinghouse Electric Corp. | System for remote chemical analysis |
-
1986
- 1986-04-28 US US06/856,289 patent/US4883963A/en not_active Expired - Fee Related
-
1987
- 1987-04-16 DE DE8787303386T patent/DE3779360D1/de not_active Expired - Lifetime
- 1987-04-16 ES ES198787303386T patent/ES2032441T3/es not_active Expired - Lifetime
- 1987-04-16 EP EP87303386A patent/EP0250070B1/de not_active Expired - Lifetime
- 1987-04-16 AT AT87303386T patent/ATE76687T1/de active
- 1987-04-27 CA CA000535660A patent/CA1311367C/en not_active Expired - Lifetime
- 1987-04-27 BR BR8702030A patent/BR8702030A/pt unknown
- 1987-04-28 JP JP62106138A patent/JPS6333643A/ja active Pending
- 1987-04-28 AU AU72123/87A patent/AU598252B2/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| EP0250070A1 (de) | 1987-12-23 |
| US4883963A (en) | 1989-11-28 |
| AU598252B2 (en) | 1990-06-21 |
| ES2032441T3 (es) | 1993-02-16 |
| AU7212387A (en) | 1987-10-29 |
| ATE76687T1 (de) | 1992-06-15 |
| BR8702030A (pt) | 1988-02-09 |
| JPS6333643A (ja) | 1988-02-13 |
| EP0250070B1 (de) | 1992-05-27 |
| CA1311367C (en) | 1992-12-15 |
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