ES2032441T3 - Metodo de analisis optico y aparato teniendo acceso programable rapido al azar de longitud de onda. - Google Patents

Metodo de analisis optico y aparato teniendo acceso programable rapido al azar de longitud de onda.

Info

Publication number
ES2032441T3
ES2032441T3 ES198787303386T ES87303386T ES2032441T3 ES 2032441 T3 ES2032441 T3 ES 2032441T3 ES 198787303386 T ES198787303386 T ES 198787303386T ES 87303386 T ES87303386 T ES 87303386T ES 2032441 T3 ES2032441 T3 ES 2032441T3
Authority
ES
Spain
Prior art keywords
aotf
optical
analog converter
tuned
wavelength
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES198787303386T
Other languages
English (en)
Inventor
Gabor J. Kemeny
David L. Wetzel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SPX Flow Technology Germany GmbH
Original Assignee
Bran und Luebbe GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=25323256&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ES2032441(T3) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Bran und Luebbe GmbH filed Critical Bran und Luebbe GmbH
Application granted granted Critical
Publication of ES2032441T3 publication Critical patent/ES2032441T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/1256—Generating the spectrum; Monochromators using acousto-optic tunable filter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4242—Modulated light, e.g. for synchronizing source and detector circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1738—Optionally different kinds of measurements; Method being valid for different kinds of measurement
    • G01N2021/1742—Optionally different kinds of measurements; Method being valid for different kinds of measurement either absorption or reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G01N2021/4742—Details of optical heads therefor, e.g. using optical fibres comprising optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4785—Standardising light scatter apparatus; Standards therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/065—Integrating spheres
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S359/00—Optical: systems and elements
    • Y10S359/90—Methods

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Optical Recording Or Reproduction (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

EL ANALIZADOR DE CONCENTRACION DE TRANSMITANCIA O REFLECTANCIA INCLUYE UN FILTRO SINTONIZABLE ACUSTICO-OPTICO (AOTF) CON UN PAR DE POLARIZADORES (3,5) CRUZADOS PARA SELECCIONAR UNO DE LOS HACES DE LUZ MONOCROMATICA SINTONIZADO QUE PASA DESDE UNA FUENTE DE LUZ (1) A TRAVES DEL AOTF. EL AOTF SE SINTONIZA MEDIANTE UN CONVERTIDOR DIGITAL-ANALOGICO (12) CONTROLADO POR COMPUTADOR A TRAVES DE UN OSCILADOR SINTONIZABLE (11). PARA OBTENER EL CAMBIO DE LONGITUD DE ONDA RAPIDO CON PICADO ELECTRONICO O MODULACION DE LONGITUD DE ONDA, LA SALIDA DEL CONVERTIDOR DIGITAL-ANALOGICO SE AÑADE A LA SALIDA DE UN GENERADOR (18) DE SEÑAL DE ALTA VELOCIDAD. LA LUZ MODULADA SE CONDUCE DIRECTAMENTE O A TRAVES DE UN CABLE DE FIBRA OPTICA AL LUGAR DE MEDIDA OPTICO E INCIDE SOBRE LA MUESTRA DONDE SE REFLEJA O SE TRANSMITE. LA LUZ EMERGENTE SE DIRIGE SOBRE LOS DETECTORES (10). EL INTERVALO DE TIEMPO DE MEDIDA SE PUEDE DISTRIBUIR ENTRE LAS LONGITUDES DE ONDA REQUERIDAS O LOS PARES DE LONGITUD DE ONDA A UN ESQUEMA DIFERENTE PARA DISMINUIR EL ERROR DEL RESULTADO EN UNA ECUACION DE CALIBRACION. EL APARATO ES PARTICULARMENTE ADAPTABLE PARA SU USO COMO UN MONITOR DE CONCENTRACION EN LINEA EN CONTROLES DE PROCESOS INDUSTRIALES YA QUE SU ESTABILIDAD, EFICIENCIA Y CAPACIDAD PUEDEN REALIZAR ANALISIS RAPIDOS.
ES198787303386T 1986-04-28 1987-04-16 Metodo de analisis optico y aparato teniendo acceso programable rapido al azar de longitud de onda. Expired - Lifetime ES2032441T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/856,289 US4883963A (en) 1986-04-28 1986-04-28 Optical analysis method and apparatus having programmable rapid random wavelength access

Publications (1)

Publication Number Publication Date
ES2032441T3 true ES2032441T3 (es) 1993-02-16

Family

ID=25323256

Family Applications (1)

Application Number Title Priority Date Filing Date
ES198787303386T Expired - Lifetime ES2032441T3 (es) 1986-04-28 1987-04-16 Metodo de analisis optico y aparato teniendo acceso programable rapido al azar de longitud de onda.

Country Status (9)

Country Link
US (1) US4883963A (es)
EP (1) EP0250070B1 (es)
JP (1) JPS6333643A (es)
AT (1) ATE76687T1 (es)
AU (1) AU598252B2 (es)
BR (1) BR8702030A (es)
CA (1) CA1311367C (es)
DE (1) DE3779360D1 (es)
ES (1) ES2032441T3 (es)

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Also Published As

Publication number Publication date
JPS6333643A (ja) 1988-02-13
EP0250070A1 (en) 1987-12-23
BR8702030A (pt) 1988-02-09
AU598252B2 (en) 1990-06-21
AU7212387A (en) 1987-10-29
US4883963A (en) 1989-11-28
ATE76687T1 (de) 1992-06-15
CA1311367C (en) 1992-12-15
EP0250070B1 (en) 1992-05-27
DE3779360D1 (de) 1992-07-02

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