DE3771162D1 - Anpassung analoger messsonden. - Google Patents
Anpassung analoger messsonden.Info
- Publication number
- DE3771162D1 DE3771162D1 DE8787308878T DE3771162T DE3771162D1 DE 3771162 D1 DE3771162 D1 DE 3771162D1 DE 8787308878 T DE8787308878 T DE 8787308878T DE 3771162 T DE3771162 T DE 3771162T DE 3771162 D1 DE3771162 D1 DE 3771162D1
- Authority
- DE
- Germany
- Prior art keywords
- adjustment
- measuring probe
- analog measuring
- analog
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
- G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/042—Calibration or calibration artifacts
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB868624191A GB8624191D0 (en) | 1986-10-08 | 1986-10-08 | Datuming of analogue measurement probes |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3771162D1 true DE3771162D1 (de) | 1991-08-08 |
Family
ID=10605460
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8787308878T Expired - Fee Related DE3771162D1 (de) | 1986-10-08 | 1987-10-07 | Anpassung analoger messsonden. |
Country Status (5)
Country | Link |
---|---|
US (1) | US4875177A (de) |
EP (1) | EP0264223B1 (de) |
JP (1) | JP2764103B2 (de) |
DE (1) | DE3771162D1 (de) |
GB (1) | GB8624191D0 (de) |
Families Citing this family (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2637364A1 (fr) * | 1988-10-03 | 1990-04-06 | Staffelbach Christian | Procede et appareil de determination des caracteristiques d'ensembles de points appartenant a un echantillon cylindrique rigide en rotation autour de son axe |
DE8813875U1 (de) * | 1988-11-05 | 1988-12-22 | Fa. Carl Zeiss, 7920 Heidenheim, De | |
JP2666512B2 (ja) * | 1990-03-30 | 1997-10-22 | トヨタ自動車株式会社 | 機械座標系補正装置 |
CA2082790A1 (en) * | 1991-12-02 | 1993-06-03 | R. David Hemmerle | Automated maintenance system for computer numerically controlled machines |
US5412880A (en) * | 1993-02-23 | 1995-05-09 | Faro Technologies Inc. | Method of constructing a 3-dimensional map of a measurable quantity using three dimensional coordinate measuring apparatus |
US5373222A (en) * | 1993-03-17 | 1994-12-13 | General Electric Company | Datuming device for measuring displacements not parallel with a displacement probe's line of travel |
SE501867C2 (sv) * | 1993-11-15 | 1995-06-12 | Asea Brown Boveri | Förfarande och system för kalibrering av en industrirobot utnyttjande en sfärisk kalibreringskropp |
US5796619A (en) * | 1996-02-15 | 1998-08-18 | The Boeing Company | Method and apparatus for numerically controlled probing |
DE19623192C2 (de) * | 1996-06-11 | 2000-08-03 | Aristo Graphic Systeme | Verfahren zur Ermittlung von Meßwerten aus einer abzutastenden Vorlage und Bearbeitungsplotter zu dessen Durchführung |
DE19720821A1 (de) * | 1997-05-16 | 1998-11-19 | Wolf & Beck Gmbh Dr | Kalibriernormal für berührend und für berührungslos optisch arbeitende Taster |
DE19861469B4 (de) * | 1998-03-06 | 2012-12-27 | Carl Zeiss Industrielle Messtechnik Gmbh | Verfahren zur Kalibrierung eines Tasters eines Koordinatenmessgerätes |
DE19809589B4 (de) * | 1998-03-06 | 2009-04-02 | Carl Zeiss Industrielle Messtechnik Gmbh | Verfahren zur Kalibrierung eines Tasters eines Koordinatenmeßgerätes |
US6417638B1 (en) * | 1998-07-17 | 2002-07-09 | Sensable Technologies, Inc. | Force reflecting haptic interface |
US6580964B2 (en) | 1998-10-24 | 2003-06-17 | Renishaw Plc | Calibrations of an analogue probe and error mapping |
GB9823228D0 (en) * | 1998-10-24 | 1998-12-16 | Renishaw Plc | Method of calibrating analogue probes |
US6225771B1 (en) * | 1999-12-01 | 2001-05-01 | General Electric Company | Probe chord error compensation |
DE10013769A1 (de) * | 2000-03-20 | 2001-10-11 | Wolf & Beck Gmbh Dr | Verfahren zur Kalibrierung geometrisch messender Sensoren auf Meß- und Digitalisiermaschinen |
JP3905771B2 (ja) * | 2001-03-02 | 2007-04-18 | 株式会社ミツトヨ | 測定機の校正方法及び装置 |
JP3827548B2 (ja) | 2001-10-04 | 2006-09-27 | 株式会社ミツトヨ | 倣いプローブの校正方法および校正プログラム |
GB0126232D0 (en) * | 2001-11-01 | 2002-01-02 | Renishaw Plc | Calibration of an analogue probe |
DE10329538A1 (de) * | 2003-06-30 | 2005-02-17 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren und Vorrichtung zur Erfassung geometrischer Größen an im wesentlichen kreiszylinder- oder kreiskegelförmigen Objekten oder Objektteilen |
US7411576B2 (en) | 2003-10-30 | 2008-08-12 | Sensable Technologies, Inc. | Force reflecting haptic interface |
JP4182006B2 (ja) * | 2004-01-22 | 2008-11-19 | Necパーソナルプロダクツ株式会社 | 座標オフセット調整方式及び座標オフセット調整方法 |
GB0417536D0 (en) * | 2004-08-06 | 2004-09-08 | Renishaw Plc | The use of surface measurement probes |
DE102005026022A1 (de) * | 2005-06-03 | 2006-12-07 | Werth Messtechnik Gmbh | Koordinatenmessgerät sowie Verfahren zum Messen eines Objektes mit einem Koordinatenmessgerät |
EP2069713A4 (de) * | 2006-05-26 | 2012-12-26 | Corp Spg Data3D | Fotogrammetrisches system und techniken zur 3d-akuisition |
CA2597891A1 (en) * | 2007-08-20 | 2009-02-20 | Marc Miousset | Multi-beam optical probe and system for dimensional measurement |
JP2009139139A (ja) * | 2007-12-04 | 2009-06-25 | Mitsutoyo Corp | 画像測定装置の校正方法 |
JP5595798B2 (ja) * | 2010-06-10 | 2014-09-24 | Dmg森精機株式会社 | 工作機械における工作物測定方法およびその装置 |
WO2013051382A1 (ja) * | 2011-10-04 | 2013-04-11 | コニカミノルタアドバンストレイヤー株式会社 | 形状測定装置及び形状測定方法 |
GB201311600D0 (en) * | 2013-06-28 | 2013-08-14 | Renishaw Plc | Calibration of a contact probe |
EP2887011B1 (de) * | 2013-12-20 | 2017-02-08 | Hexagon Technology Center GmbH | Koordinatenmessmaschine mit hochpräziser 3D-Druckfunktionalität |
JP6675121B2 (ja) * | 2015-09-30 | 2020-04-01 | 学校法人金沢工業大学 | 試料保持・走査機構、走査型プローブ顕微鏡及び探針の製造方法 |
EP3184960B1 (de) * | 2015-12-22 | 2018-06-27 | Tesa Sa | Motorisierter ausrichtbarer kopf für ein messsystem |
CN106546270B (zh) * | 2017-01-11 | 2023-07-21 | 诺伯特智能装备(山东)有限公司 | 一种机器人定位精度测试仪及接触式测量方法 |
CN111272126A (zh) * | 2018-12-05 | 2020-06-12 | 长春设备工艺研究所 | 零件壳体复杂曲面测量误差分析与建模方法 |
CN114366295B (zh) * | 2021-12-31 | 2023-07-25 | 杭州脉流科技有限公司 | 微导管路径生成方法、塑形针的塑形方法、计算机设备、可读存储介质和程序产品 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1477508A (en) * | 1974-08-21 | 1977-06-22 | Rank Organisation Ltd | Measuring apparatus |
US3983374A (en) * | 1975-06-20 | 1976-09-28 | Uresco, Inc. | Digital system for slope and curvature control |
JPS599305B2 (ja) * | 1978-03-23 | 1984-03-01 | ファナック株式会社 | 倣い制御装置 |
DE2940633C2 (de) * | 1979-10-06 | 1986-01-02 | Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar | Verfahren zur Bestimmung der Drehachse eines Rundtisches in Mehrkoordinaten-Meßgeräten |
US4636960A (en) * | 1982-09-16 | 1987-01-13 | Renishaw Electrical Limited | Method of operating a machine tool with a sensing probe in order to gather positional data for the calculation of tool offset parameters |
US4585350A (en) * | 1983-01-28 | 1986-04-29 | Pryor Timothy R | Pulsed robotic inspection |
DE3342675A1 (de) * | 1983-11-25 | 1985-06-05 | Fa. Carl Zeiss, 7920 Heidenheim | Verfahren und vorrichtung zur beruehrungslosen vermessung von objekten |
CH661981A5 (de) * | 1984-02-13 | 1987-08-31 | Haenni & Cie Ag | Optisches messgeraet zur beruehrungslosen abstandsmessung. |
FR2560377B1 (fr) * | 1984-02-29 | 1988-05-13 | Commissariat Energie Atomique | Dispositif optique de mesure de proximite de surface et son application au releve du profil d'une surface |
US4688184A (en) * | 1984-03-29 | 1987-08-18 | Mitsubishi Denki Kabushiki Kaisha | System for measuring three-dimensional coordinates |
JPS6171307A (ja) * | 1984-09-17 | 1986-04-12 | Nippon Steel Corp | 管棒状体の曲り測定方法 |
US4705395A (en) * | 1984-10-03 | 1987-11-10 | Diffracto Ltd. | Triangulation data integrity |
JPS6186606A (ja) * | 1984-10-05 | 1986-05-02 | Hitachi Ltd | 非接触形状測定方法 |
US4708483A (en) * | 1985-06-28 | 1987-11-24 | Rexnord Inc. | Optical measuring apparatus and method |
GB8522875D0 (en) * | 1985-09-16 | 1985-10-23 | Renishaw Plc | Converting analogue input into digital outputs |
US4743770A (en) * | 1986-09-22 | 1988-05-10 | Mitutoyo Mfg. Co., Ltd. | Profile-measuring light probe using a change in reflection factor in the proximity of a critical angle of light |
US4819195A (en) * | 1987-01-20 | 1989-04-04 | The Warner & Swasey Company | Method for calibrating a coordinate measuring machine and the like and system therefor |
-
1986
- 1986-10-08 GB GB868624191A patent/GB8624191D0/en active Pending
-
1987
- 1987-10-02 US US07/103,752 patent/US4875177A/en not_active Expired - Lifetime
- 1987-10-07 EP EP87308878A patent/EP0264223B1/de not_active Expired
- 1987-10-07 DE DE8787308878T patent/DE3771162D1/de not_active Expired - Fee Related
- 1987-10-08 JP JP62252649A patent/JP2764103B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0264223A2 (de) | 1988-04-20 |
JP2764103B2 (ja) | 1998-06-11 |
US4875177A (en) | 1989-10-17 |
GB8624191D0 (en) | 1986-11-12 |
EP0264223A3 (en) | 1989-07-19 |
JPS6398508A (ja) | 1988-04-30 |
EP0264223B1 (de) | 1991-07-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |