DE3686923T2 - Verfahren zur sichtbarkeitsverbesserung von ausrichtmarkierungen erster ordnung. - Google Patents
Verfahren zur sichtbarkeitsverbesserung von ausrichtmarkierungen erster ordnung.Info
- Publication number
- DE3686923T2 DE3686923T2 DE8686109503T DE3686923T DE3686923T2 DE 3686923 T2 DE3686923 T2 DE 3686923T2 DE 8686109503 T DE8686109503 T DE 8686109503T DE 3686923 T DE3686923 T DE 3686923T DE 3686923 T2 DE3686923 T2 DE 3686923T2
- Authority
- DE
- Germany
- Prior art keywords
- improving visibility
- alignment markings
- order alignment
- order
- markings
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/544—Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54453—Marks applied to semiconductor devices or parts for use prior to dicing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/975—Substrate or mask aligning feature
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/767,316 US4632724A (en) | 1985-08-19 | 1985-08-19 | Visibility enhancement of first order alignment marks |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3686923D1 DE3686923D1 (de) | 1992-11-12 |
DE3686923T2 true DE3686923T2 (de) | 1993-04-22 |
Family
ID=25079116
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8686109503T Expired - Fee Related DE3686923T2 (de) | 1985-08-19 | 1986-07-11 | Verfahren zur sichtbarkeitsverbesserung von ausrichtmarkierungen erster ordnung. |
Country Status (4)
Country | Link |
---|---|
US (1) | US4632724A (de) |
EP (1) | EP0212219B1 (de) |
JP (1) | JPH07118441B2 (de) |
DE (1) | DE3686923T2 (de) |
Families Citing this family (41)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3788470T2 (de) * | 1986-08-08 | 1994-06-09 | Philips Nv | Verfahren zur Herstellung eines Feldeffekttransistors mit isoliertem Gate. |
DE69118031T2 (de) * | 1990-06-29 | 1996-09-05 | Canon Kk | Verfahren zum Herstellen einer Halbleiteranordnung mit einer Ausrichtungsmarke |
JPH05159221A (ja) * | 1991-12-02 | 1993-06-25 | Fujitsu Ltd | 薄膜ヘッドおよびその製造方法 |
US5470693A (en) * | 1992-02-18 | 1995-11-28 | International Business Machines Corporation | Method of forming patterned polyimide films |
US5300797A (en) * | 1992-03-31 | 1994-04-05 | Sgs-Thomson Microelectronics, Inc. | Coplanar twin-well integrated circuit structure |
US5401691A (en) * | 1994-07-01 | 1995-03-28 | Cypress Semiconductor Corporation | Method of fabrication an inverse open frame alignment mark |
US5952247A (en) * | 1994-11-23 | 1999-09-14 | Intel Corporation | Method of accessing the circuitry on a semiconductor substrate from the bottom of the semiconductor substrate |
US5976980A (en) * | 1994-11-23 | 1999-11-02 | Intel Corporation | Method and apparatus providing a mechanical probe structure in an integrated circuit die |
US6153891A (en) * | 1994-11-23 | 2000-11-28 | Intel Corporation | Method and apparatus providing a circuit edit structure through the back side of an integrated circuit die |
US6020746A (en) * | 1994-11-23 | 2000-02-01 | Intel Corporation | Method and apparatus for probing an integrated circuit through the back side of an integrated circuit die |
US5700732A (en) | 1996-08-02 | 1997-12-23 | Micron Technology, Inc. | Semiconductor wafer, wafer alignment patterns and method of forming wafer alignment patterns |
US5783490A (en) * | 1997-04-21 | 1998-07-21 | Vanguard International Semiconductor Corporation | Photolithography alignment mark and manufacturing method |
US6309897B1 (en) | 1997-09-30 | 2001-10-30 | Intel Corporation | Method and apparatus providing a circuit edit structure through the back side of an integrated circuit die |
US5904486A (en) * | 1997-09-30 | 1999-05-18 | Intel Corporation | Method for performing a circuit edit through the back side of an integrated circuit die |
US6008060A (en) * | 1998-04-14 | 1999-12-28 | Etec Systems, Inc. | Detecting registration marks with a low energy electron beam |
US6159754A (en) * | 1998-05-07 | 2000-12-12 | Intel Corporation | Method of making a circuit edit interconnect structure through the backside of an integrated circuit die |
JPH11329923A (ja) | 1998-05-11 | 1999-11-30 | Sony Corp | 半導体装置の製造方法 |
US6241847B1 (en) | 1998-06-30 | 2001-06-05 | Lsi Logic Corporation | Method and apparatus for detecting a polishing endpoint based upon infrared signals |
US6071818A (en) | 1998-06-30 | 2000-06-06 | Lsi Logic Corporation | Endpoint detection method and apparatus which utilize an endpoint polishing layer of catalyst material |
US6077783A (en) * | 1998-06-30 | 2000-06-20 | Lsi Logic Corporation | Method and apparatus for detecting a polishing endpoint based upon heat conducted through a semiconductor wafer |
US6268224B1 (en) | 1998-06-30 | 2001-07-31 | Lsi Logic Corporation | Method and apparatus for detecting an ion-implanted polishing endpoint layer within a semiconductor wafer |
US6074517A (en) * | 1998-07-08 | 2000-06-13 | Lsi Logic Corporation | Method and apparatus for detecting an endpoint polishing layer by transmitting infrared light signals through a semiconductor wafer |
US6285035B1 (en) | 1998-07-08 | 2001-09-04 | Lsi Logic Corporation | Apparatus for detecting an endpoint polishing layer of a semiconductor wafer having a wafer carrier with independent concentric sub-carriers and associated method |
US6080670A (en) * | 1998-08-10 | 2000-06-27 | Lsi Logic Corporation | Method of detecting a polishing endpoint layer of a semiconductor wafer which includes a non-reactive reporting specie |
US6201253B1 (en) | 1998-10-22 | 2001-03-13 | Lsi Logic Corporation | Method and apparatus for detecting a planarized outer layer of a semiconductor wafer with a confocal optical system |
US6121147A (en) * | 1998-12-11 | 2000-09-19 | Lsi Logic Corporation | Apparatus and method of detecting a polishing endpoint layer of a semiconductor wafer which includes a metallic reporting substance |
US6288773B2 (en) | 1998-12-11 | 2001-09-11 | Lsi Logic Corporation | Method and apparatus for removing residual material from an alignment mark of a semiconductor wafer |
US6117779A (en) * | 1998-12-15 | 2000-09-12 | Lsi Logic Corporation | Endpoint detection method and apparatus which utilize a chelating agent to detect a polishing endpoint |
JP3288320B2 (ja) * | 1998-12-21 | 2002-06-04 | 沖電気工業株式会社 | レジストマーク |
DE19904571C1 (de) * | 1999-02-04 | 2000-04-20 | Siemens Ag | Verfahren zur Herstellung einer integrierten Schaltungsanordnung aus zwei Substraten, wobei die Schaltungsstrukturen des Substrate exakt gegeneinander ausgerichtet sind |
US6303459B1 (en) * | 1999-11-15 | 2001-10-16 | Taiwan Semiconductor Manufacturing Company | Integration process for Al pad |
US7751609B1 (en) | 2000-04-20 | 2010-07-06 | Lsi Logic Corporation | Determination of film thickness during chemical mechanical polishing |
US6492269B1 (en) | 2001-01-08 | 2002-12-10 | Taiwan Semiconductor Manufacturing Company | Methods for edge alignment mark protection during damascene electrochemical plating of copper |
US6693365B2 (en) * | 2002-02-23 | 2004-02-17 | Taiwan Semiconductor Manufacturing Co., Ltd. | Local electrochemical deplating of alignment mark regions of semiconductor wafers |
US6692995B2 (en) | 2002-04-05 | 2004-02-17 | Intel Corporation | Physically deposited layer to electrically connect circuit edit connection targets |
US6596604B1 (en) | 2002-07-22 | 2003-07-22 | Atmel Corporation | Method of preventing shift of alignment marks during rapid thermal processing |
JP2006106263A (ja) * | 2004-10-04 | 2006-04-20 | Fujinon Sano Kk | 光学素子の製造方法 |
US20080191310A1 (en) * | 2007-02-12 | 2008-08-14 | Weng-Jin Wu | By-product removal for wafer bonding process |
JP2008288430A (ja) * | 2007-05-18 | 2008-11-27 | Toshiba Corp | 半導体装置の製造方法 |
US9472506B2 (en) | 2015-02-25 | 2016-10-18 | International Business Machines Corporation | Registration mark formation during sidewall image transfer process |
US11244907B2 (en) | 2020-01-02 | 2022-02-08 | International Business Machines Corporation | Metal surface preparation for increased alignment contrast |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3802940A (en) * | 1969-08-18 | 1974-04-09 | Computervision Corp | Enhanced contrast semiconductor wafer alignment target and method for making same |
JPS51147179A (en) * | 1975-06-12 | 1976-12-17 | Fujitsu Ltd | Method of munufacturing of semiconductor device |
GB1520925A (en) * | 1975-10-06 | 1978-08-09 | Mullard Ltd | Semiconductor device manufacture |
JPS5534442A (en) * | 1978-08-31 | 1980-03-11 | Fujitsu Ltd | Preparation of semiconductor device |
US4374915A (en) * | 1981-07-30 | 1983-02-22 | Intel Corporation | High contrast alignment marker for integrated circuit fabrication |
JPS60149130A (ja) * | 1984-01-17 | 1985-08-06 | Hitachi Ltd | パターン検出方法およびそれに用いる反射防止膜用材料 |
US4487653A (en) * | 1984-03-19 | 1984-12-11 | Advanced Micro Devices, Inc. | Process for forming and locating buried layers |
-
1985
- 1985-08-19 US US06/767,316 patent/US4632724A/en not_active Expired - Fee Related
-
1986
- 1986-07-11 EP EP86109503A patent/EP0212219B1/de not_active Expired - Lifetime
- 1986-07-11 JP JP61162210A patent/JPH07118441B2/ja not_active Expired - Lifetime
- 1986-07-11 DE DE8686109503T patent/DE3686923T2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0212219A2 (de) | 1987-03-04 |
EP0212219B1 (de) | 1992-10-07 |
US4632724A (en) | 1986-12-30 |
JPS6245028A (ja) | 1987-02-27 |
DE3686923D1 (de) | 1992-11-12 |
EP0212219A3 (en) | 1989-10-25 |
JPH07118441B2 (ja) | 1995-12-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |