DE3679078D1 - Photomaskenherstellungsverfahren. - Google Patents

Photomaskenherstellungsverfahren.

Info

Publication number
DE3679078D1
DE3679078D1 DE8686300569T DE3679078T DE3679078D1 DE 3679078 D1 DE3679078 D1 DE 3679078D1 DE 8686300569 T DE8686300569 T DE 8686300569T DE 3679078 T DE3679078 T DE 3679078T DE 3679078 D1 DE3679078 D1 DE 3679078D1
Authority
DE
Germany
Prior art keywords
production process
photomask production
photomask
production
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8686300569T
Other languages
English (en)
Inventor
Yaichiro Mitsubishi D Watakabe
Tatsuo Mitsubishi Denk Okamoto
Shuichi Matsuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Application granted granted Critical
Publication of DE3679078D1 publication Critical patent/DE3679078D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/54—Absorbers, e.g. of opaque materials

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
DE8686300569T 1985-01-28 1986-01-28 Photomaskenherstellungsverfahren. Expired - Lifetime DE3679078D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60016203A JPS61173251A (ja) 1985-01-28 1985-01-28 フオトマスクの製造方法

Publications (1)

Publication Number Publication Date
DE3679078D1 true DE3679078D1 (de) 1991-06-13

Family

ID=11909948

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686300569T Expired - Lifetime DE3679078D1 (de) 1985-01-28 1986-01-28 Photomaskenherstellungsverfahren.

Country Status (4)

Country Link
US (2) US4876164A (de)
EP (1) EP0190867B1 (de)
JP (1) JPS61173251A (de)
DE (1) DE3679078D1 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61173251A (ja) * 1985-01-28 1986-08-04 Mitsubishi Electric Corp フオトマスクの製造方法
JPS6385553A (ja) * 1986-09-30 1988-04-16 Toshiba Corp マスク基板およびマスクパタ−ンの形成方法
US5306601A (en) * 1988-06-29 1994-04-26 Matsushita Electric Industrial Co., Ltd. Fine pattern forming material and pattern forming method
JPH0827534B2 (ja) * 1990-09-11 1996-03-21 三菱電機株式会社 フォトマスク
US5153083A (en) * 1990-12-05 1992-10-06 At&T Bell Laboratories Method of making phase-shifting lithographic masks
JPH06504628A (ja) * 1990-12-20 1994-05-26 エクソン・ケミカル・パテンツ・インク リソグラフィー及び腐食防止コーティング用途向けのｕｖ／ｅｂ硬化性ブチルコポリマー
JPH04368947A (ja) * 1991-06-18 1992-12-21 Mitsubishi Electric Corp 位相シフトマスクの作成方法
JPH07159974A (ja) * 1993-12-09 1995-06-23 Ryoden Semiconductor Syst Eng Kk パターン転写マスクおよびその製造方法
JP2878143B2 (ja) * 1994-02-22 1999-04-05 インターナショナル・ビジネス・マシーンズ・コーポレイション 減衰位相シフト・マスク作成用の薄膜材料及びその作成方法
KR0151427B1 (ko) * 1994-03-04 1999-02-18 문정환 위상 반전마스크 및 그의 제조방법
US5786114A (en) * 1997-01-10 1998-07-28 Kabushiki Kaisha Toshiba Attenuated phase shift mask with halftone boundary regions
JP3347670B2 (ja) * 1998-07-06 2002-11-20 キヤノン株式会社 マスク及びそれを用いた露光方法
US6410453B1 (en) * 1999-09-02 2002-06-25 Micron Technology, Inc. Method of processing a substrate
US6811959B2 (en) 2002-03-04 2004-11-02 International Business Machines Corporation Hardmask/barrier layer for dry etching chrome films and improving post develop resist profiles on photomasks
KR100789063B1 (ko) * 2003-04-11 2007-12-26 호야 가부시키가이샤 크롬계 박막의 에칭방법 및 포토마스크의 제조방법
US7588866B2 (en) * 2005-06-01 2009-09-15 Kinoptics Technologies Inc. Filter arrays for liquid crystal displays and methods of making the same
JP2007183048A (ja) * 2006-01-10 2007-07-19 Sansyu Sangyo Co Ltd 燃焼装置および燃焼装置の運転方法
US7754394B2 (en) * 2006-11-14 2010-07-13 International Business Machines Corporation Method to etch chrome for photomask fabrication
JP5709564B2 (ja) * 2011-02-09 2015-04-30 キヤノン株式会社 半導体装置の製造方法

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3600243A (en) * 1966-11-09 1971-08-17 Us Army Method of making chromium mask for photoresist application
US3721584A (en) * 1970-04-13 1973-03-20 A Diem Silicon coated substrates and objects fabricated therefrom
US4113486A (en) * 1973-10-22 1978-09-12 Fuji Photo Film Co., Ltd. Method for producing a photomask
JPS51105821A (en) * 1975-03-14 1976-09-20 Fuji Photo Film Co Ltd Masukugazono keiseihoho
JPS5185380A (de) * 1975-05-21 1976-07-26 Dainippon Printing Co Ltd
JPS5269269A (en) * 1975-12-05 1977-06-08 Dainippon Printing Co Ltd Photomask
US4051297A (en) * 1976-08-16 1977-09-27 Shatterproof Glass Corporation Transparent article and method of making the same
JPS5642183A (en) * 1979-09-13 1981-04-20 Tokyo Shibaura Electric Co Shielding plug
JPS5642176A (en) * 1979-09-14 1981-04-20 Rhythm Watch Co Ltd Time correction device of timepiece
DE3152307A1 (de) * 1980-08-28 1982-11-04 Wisconsin Alumni Res Found Use of metallic glasses for fabrication of structures with submicron dimensions
DE3070833D1 (en) * 1980-09-19 1985-08-08 Ibm Deutschland Structure with a silicon body that presents an aperture and method of making this structure
JPS57157249A (en) * 1981-03-23 1982-09-28 Nec Corp Preparation of optical exposure mask
JPS57157247A (en) * 1981-03-23 1982-09-28 Nec Corp Optical exposure mask
JPS57160127A (en) * 1981-03-27 1982-10-02 Nec Corp Manufacture of transcribe mask for x-ray exposure
JPS59162276A (ja) * 1983-03-07 1984-09-13 Toshiba Corp 反応性イオンエツチング方法
JPS60176235A (ja) * 1984-02-22 1985-09-10 Nippon Kogaku Kk <Nikon> Ｘ線露光用マスク原板
JPS61173251A (ja) * 1985-01-28 1986-08-04 Mitsubishi Electric Corp フオトマスクの製造方法

Also Published As

Publication number Publication date
JPS61173251A (ja) 1986-08-04
US4876164A (en) 1989-10-24
US4985319A (en) 1991-01-15
JPH0434141B2 (de) 1992-06-05
EP0190867A3 (en) 1988-01-07
EP0190867B1 (de) 1991-05-08
EP0190867A2 (de) 1986-08-13

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8320 Willingness to grant licences declared (paragraph 23)
8328 Change in the person/name/address of the agent

Representative=s name: PRUFER & PARTNER GBR, 81545 MUENCHEN