DE3671976D1 - Pruefsystem fuer gedruckte leiter. - Google Patents

Pruefsystem fuer gedruckte leiter.

Info

Publication number
DE3671976D1
DE3671976D1 DE8686103031T DE3671976T DE3671976D1 DE 3671976 D1 DE3671976 D1 DE 3671976D1 DE 8686103031 T DE8686103031 T DE 8686103031T DE 3671976 T DE3671976 T DE 3671976T DE 3671976 D1 DE3671976 D1 DE 3671976D1
Authority
DE
Germany
Prior art keywords
ladders
printed
testing system
testing
printed ladders
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8686103031T
Other languages
English (en)
Inventor
James E Frushour
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Application granted granted Critical
Publication of DE3671976D1 publication Critical patent/DE3671976D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/54—Testing for continuity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
DE8686103031T 1985-04-01 1986-03-07 Pruefsystem fuer gedruckte leiter. Expired - Fee Related DE3671976D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/718,466 US4697142A (en) 1985-04-01 1985-04-01 Printed circuit conductor test system

Publications (1)

Publication Number Publication Date
DE3671976D1 true DE3671976D1 (de) 1990-07-19

Family

ID=24886182

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686103031T Expired - Fee Related DE3671976D1 (de) 1985-04-01 1986-03-07 Pruefsystem fuer gedruckte leiter.

Country Status (4)

Country Link
US (1) US4697142A (de)
EP (1) EP0196496B1 (de)
JP (1) JPH065242B2 (de)
DE (1) DE3671976D1 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4922184A (en) * 1988-08-29 1990-05-01 Control Data Corporation Apparatus and process for the simultaneous continuity sensing of multiple circuits
US4871962A (en) * 1988-10-28 1989-10-03 Advanced Micro Devices, Inc. Method for measuring the size of vias
JPH0526944A (ja) * 1991-07-24 1993-02-05 Nippon Sheet Glass Co Ltd 導電パターンの検査装置
US5266901A (en) * 1992-05-29 1993-11-30 International Business Machines Corp. Apparatus and method for resistive detection and waveform analysis of interconenction networks
US5570027A (en) * 1995-04-19 1996-10-29 Photocircuits Corporation Printed circuit board test apparatus and method
US6054720A (en) 1997-11-06 2000-04-25 International Business Machines Corporation Apparatus and method for evaluating the surface insulation resistance of electronic assembly manufacture
JP3642456B2 (ja) * 1998-02-24 2005-04-27 株式会社村田製作所 電子部品の検査方法および装置
ES2157758B1 (es) * 1999-02-15 2002-01-16 Venelente Sl Sistema de gestion remoto, de control fiscal, utilizacion fraudulenta y de localizacion geografica de maquinas accionadas por monedas o por tarjetas.
KR100648275B1 (ko) * 2004-12-09 2006-11-23 삼성전자주식회사 반도체 테스트 장치
DE102005013450A1 (de) * 2005-03-23 2006-09-28 Robert Bosch Gmbh Sicherheitssystem
DE102010007349B4 (de) * 2009-02-09 2018-03-01 Fuji Electric Co., Ltd. Anomalienüberwachungsvorrichtung
JP5756437B2 (ja) * 2012-07-20 2015-07-29 株式会社オンソク コイルを含む電気回路の導通状態検査装置、および導通状態検査方法
CN109541371B (zh) * 2018-11-19 2021-02-23 贵州中航聚电科技有限公司 一种片式钽电容器测量工装

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2605322A (en) * 1948-01-14 1952-07-29 Chase Shawmut Co Apparatus for testing and demonstrating characteristics of fusible protective devices
US3392332A (en) * 1963-03-21 1968-07-09 Christensen William Millivolt drop indicator having a current regulated power supply and means to protect the indicator against overvoltage
US3373356A (en) * 1966-03-23 1968-03-12 Mallory & Co Inc P R Holding current meter for scr or the like
US3366055A (en) * 1966-11-15 1968-01-30 Green Mansions Inc Semiconductive explosive igniter
US3772590A (en) * 1972-05-24 1973-11-13 Mc Graw Edison Co Method of production testing fuses and circuit for accomplishing such testing
US4140965A (en) * 1976-02-25 1979-02-20 Optron, Inc. Isolation voltage test apparatus
JPS55142254A (en) * 1979-04-25 1980-11-06 Hitachi Ltd Inspecting method for pattern of printed wiring board
JPH0413665Y2 (de) * 1985-02-05 1992-03-30

Also Published As

Publication number Publication date
EP0196496A1 (de) 1986-10-08
US4697142A (en) 1987-09-29
EP0196496B1 (de) 1990-06-13
JPH065242B2 (ja) 1994-01-19
JPS61230062A (ja) 1986-10-14

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee