DE3765740D1 - Befestigungssystem fuer eine gedruckte schaltung. - Google Patents

Befestigungssystem fuer eine gedruckte schaltung.

Info

Publication number
DE3765740D1
DE3765740D1 DE8787112934T DE3765740T DE3765740D1 DE 3765740 D1 DE3765740 D1 DE 3765740D1 DE 8787112934 T DE8787112934 T DE 8787112934T DE 3765740 T DE3765740 T DE 3765740T DE 3765740 D1 DE3765740 D1 DE 3765740D1
Authority
DE
Germany
Prior art keywords
printed circuit
fixing system
fixing
printed
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8787112934T
Other languages
English (en)
Inventor
Ronald K Kerschner
Michael L Bullock
James Hayes
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Application granted granted Critical
Publication of DE3765740D1 publication Critical patent/DE3765740D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
DE8787112934T 1986-10-08 1987-09-04 Befestigungssystem fuer eine gedruckte schaltung. Expired - Lifetime DE3765740D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/916,667 US4818933A (en) 1986-10-08 1986-10-08 Board fixturing system

Publications (1)

Publication Number Publication Date
DE3765740D1 true DE3765740D1 (de) 1990-11-29

Family

ID=25437660

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8787112934T Expired - Lifetime DE3765740D1 (de) 1986-10-08 1987-09-04 Befestigungssystem fuer eine gedruckte schaltung.

Country Status (4)

Country Link
US (1) US4818933A (de)
EP (1) EP0263307B1 (de)
JP (1) JP2585024B2 (de)
DE (1) DE3765740D1 (de)

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DE3781979D1 (de) * 1986-08-07 1992-11-05 Siemens Ag Pruefeinrichtung fuer beidseitige, zweistufige kontaktierung bestueckter leiterplatten.
US4912400A (en) * 1988-09-13 1990-03-27 Design And Manufacturing Specialties, Inc. Apparatus for testing circuit boards
US5094584A (en) * 1989-04-06 1992-03-10 Hewlett-Packard Company Method and apparatus for automatically changing printed circuit board test fixtures
US5104277A (en) * 1989-04-06 1992-04-14 Hewlett-Packard Company Method and apparatus for automatically changing printed circuit board test fixtures
US5055779A (en) * 1989-06-19 1991-10-08 Hewlett-Packard Company Integrated board testing system
US4993136A (en) * 1989-06-19 1991-02-19 Hewlett-Packard Company Method of converting a vacuum test fixture on a board testing apparatus to a mechanical test fixture
US5311119A (en) * 1990-09-12 1994-05-10 Hewlett-Packard Company Probe contact through small amplitude vibration for bed of nails testing
US5192907A (en) * 1990-09-25 1993-03-09 S.P.E.A. S.R.L. Electronic module handling device for an automatic test apparatus
US5087878A (en) * 1990-11-30 1992-02-11 Compaq Computer Corporation Top-accessible system, and related methods, for simultaneously testing the opposite sides of printed circuit board
US5153504A (en) * 1991-04-23 1992-10-06 International Business Machines Corporation Pneumatically actuated hold down gate
US5389874A (en) * 1991-09-18 1995-02-14 Hewlett-Packard Company Method for control of ground bounce above an internal ground plane in a short-wire board test fixture
FR2692048B1 (fr) * 1992-06-09 1996-09-06 Everett Charles Tech Montage d'essai.
TW227644B (de) * 1992-12-18 1994-08-01 Tesukon Kk
US5572144A (en) * 1993-02-22 1996-11-05 Seagate Technology Test jig and method for probing a printed circuit board
IT1266653B1 (it) * 1993-11-02 1997-01-09 Circuit Line Spa Macchina per eseguire il test elettrico simultaneo, sulle due facce di una piastra con circuiti stampati
DE4338445A1 (de) * 1993-11-10 1995-05-11 Heraeus Voetsch Gmbh Verfahren und Vorrichtung zum Temperieren und Prüfen von elektronischen, elektromechanischen und mechanischen Baugruppen
US5596282A (en) * 1993-12-10 1997-01-21 Texas Instruments Incorporated Tester for integrated circuits
US5823737A (en) * 1995-10-31 1998-10-20 Lucent Technologies Probemat handler
SE9503902L (sv) * 1995-11-06 1997-07-30 Reinhold Strandberg Apparat för testning av med elektriska ledningsmönster försedda kort samt för en sådan apparat avsedd adapter
US5945836A (en) 1996-10-29 1999-08-31 Hewlett-Packard Company Loaded-board, guided-probe test fixture
US5773988A (en) * 1996-10-29 1998-06-30 Hewlett-Packard Company Standard- and limited-access hybrid test fixture
US6407565B1 (en) 1996-10-29 2002-06-18 Agilent Technologies, Inc. Loaded-board, guided-probe test fixture
IT1290345B1 (it) * 1997-02-18 1998-10-22 Circuit Line Spa Metodo e dispositivo per la correzione dell'errore di allineamento fra aghi di test e punti di test nella fase di test elettrico di
US6084422A (en) * 1997-11-10 2000-07-04 Bartholomew; Mark Printed circuit board testing device
US6191572B1 (en) * 1998-05-29 2001-02-20 Agilent Technologies Inc. Adjustable fast press with PCA shuttle and modular expansion capabilities
US6307386B1 (en) * 1998-05-29 2001-10-23 Agilent Technologies, Inc. Modular mechanical fixturing and automated handling of printed circuit assemblies on automated test equipment
US6543983B1 (en) * 1998-07-07 2003-04-08 University Of Virginia Patent Foundation Robotic pick up and deliver system
US6433562B1 (en) 1998-08-28 2002-08-13 International Business Machines Corporation Method and apparatus of interconnecting with a system board
US6562636B1 (en) 1999-07-14 2003-05-13 Aehr Test Systems Wafer level burn-in and electrical test system and method
US6340895B1 (en) 1999-07-14 2002-01-22 Aehr Test Systems, Inc. Wafer-level burn-in and test cartridge
US6580283B1 (en) * 1999-07-14 2003-06-17 Aehr Test Systems Wafer level burn-in and test methods
ATE316247T1 (de) * 1999-07-14 2006-02-15 Aehr Test Systems Kassette zum einbrennen und testen eines wafers
US6788078B2 (en) * 2001-11-16 2004-09-07 Delaware Capital Formation, Inc. Apparatus for scan testing printed circuit boards
US6838898B2 (en) * 2002-01-17 2005-01-04 Di/Dt, Inc. Apparatus and method for testing high current circuit assemblies
US6784675B2 (en) * 2002-06-25 2004-08-31 Agilent Technologies, Inc. Wireless test fixture adapter for printed circuit assembly tester
US6833717B1 (en) * 2004-02-12 2004-12-21 Applied Materials, Inc. Electron beam test system with integrated substrate transfer module
US7355418B2 (en) * 2004-02-12 2008-04-08 Applied Materials, Inc. Configurable prober for TFT LCD array test
US7319335B2 (en) * 2004-02-12 2008-01-15 Applied Materials, Inc. Configurable prober for TFT LCD array testing
JP4529135B2 (ja) * 2005-04-11 2010-08-25 富士機械製造株式会社 対回路基板作業システム
US7535238B2 (en) * 2005-04-29 2009-05-19 Applied Materials, Inc. In-line electron beam test system
JP5829376B2 (ja) * 2006-03-14 2015-12-09 アプライド マテリアルズ インコーポレイテッドＡｐｐｌｉｅｄ Ｍａｔｅｒｉａｌｓ，Ｉｎｃｏｒｐｏｒａｔｅｄ マルチカラム電子ビーム検査システムにおけるクロストークの軽減方法
US7786742B2 (en) * 2006-05-31 2010-08-31 Applied Materials, Inc. Prober for electronic device testing on large area substrates
US7602199B2 (en) * 2006-05-31 2009-10-13 Applied Materials, Inc. Mini-prober for TFT-LCD testing
US20080251019A1 (en) * 2007-04-12 2008-10-16 Sriram Krishnaswami System and method for transferring a substrate into and out of a reduced volume chamber accommodating multiple substrates
TW201224480A (en) * 2010-12-14 2012-06-16 Askey Computer Corp Test device
US8970245B2 (en) * 2012-09-26 2015-03-03 Shenzhen China Star Optoelectronics Technology Co., Ltd. Probing device for TFT-LCD substrate
CN105759082A (zh) * 2015-06-25 2016-07-13 中山市佑崴自动化科技有限公司 一种用于数据线测试机的旋转组
CN105785159A (zh) * 2015-06-25 2016-07-20 中山市佑崴自动化科技有限公司 用于数据线测试机的旋转装置
EP3470857A1 (de) 2017-10-10 2019-04-17 Fitech sp. z o.o. Pressenanordnung für einen in-circuit tester
CN109807767B (zh) * 2017-11-20 2021-11-05 上海微电子装备（集团）股份有限公司 物料固持装置及物料检测方法
IT201800004814A1 (it) 2018-04-24 2019-10-24 Stazione e metodo di controllo del circuito elettrico di sigarette elettroniche
TWI676031B (zh) * 2018-09-06 2019-11-01 致茂電子股份有限公司 滑移式電子元件測試裝置
WO2023157900A1 (ja) * 2022-02-18 2023-08-24 ヌヴォトンテクノロジージャパン株式会社 プローブユニット、検査装置、検査システム、検査方法、及び半導体レーザ装置の製造方法

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US2358890A (en) * 1941-09-03 1944-09-26 Tinnerman Products Inc Spring nut fastener
US2587355A (en) * 1948-01-15 1952-02-26 Batesville Casket Company Casket construction
US2775156A (en) * 1952-07-10 1956-12-25 Chain Belt Co Spring clip for sprocket chains
US3017570A (en) * 1959-12-04 1962-01-16 Electric Storage Battery Co Automatic battery discharge means
US3197022A (en) * 1963-07-26 1965-07-27 Hart Carter Co Conveyor
US3387529A (en) * 1966-09-23 1968-06-11 Tinnerman Products Inc Slide-type fastening device
US3629702A (en) * 1970-03-09 1971-12-21 Hazeltine Corp Automatic tester for a plurality of discrete electrical components supplied in a repetitive predetermined sequence
US3787768A (en) * 1970-12-25 1974-01-22 Matsushita Electric Ind Co Ltd Inspection apparatus for printed circuit boards
US3970934A (en) * 1974-08-12 1976-07-20 Akin Aksu Printed circuit board testing means
CA1044379A (en) * 1974-12-28 1978-12-12 Sony Corporation Wafer transfer device
US4320339A (en) * 1977-11-07 1982-03-16 Usm Corporation Component testing station
US4311427A (en) * 1979-12-21 1982-01-19 Varian Associates, Inc. Wafer transfer system
US4351108A (en) * 1980-07-07 1982-09-28 Reliability, Inc. Packaging system for semiconductor burn-in
US4432458A (en) * 1980-11-06 1984-02-21 Bell & Howell Company Electronic control system for monitoring and controlling the movement of an envelope through a mail sorting machine
IT1195391B (it) * 1983-03-04 1988-10-19 Circuit Line Srl Macchina analizzatrice automatica di circuiti stampati
DE3340178C1 (de) * 1983-11-07 1985-05-15 MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH Vorrichtung zum Andruecken von in einem Leiterplattenpruefgeraet zu testenden Leiterplatten und Verfahren zur Justierung der dazugehoerigen Lichtmarkenprojektoren
DE3511821C1 (de) * 1985-03-30 1986-06-19 Rohde & Schwarz GmbH & Co KG, 8000 München Adapter zur Aufnahme von beidseitig zu prüfenden Leiterplatten

Also Published As

Publication number Publication date
EP0263307B1 (de) 1990-10-24
US4818933A (en) 1989-04-04
EP0263307A2 (de) 1988-04-13
JPS63184076A (ja) 1988-07-29
JP2585024B2 (ja) 1997-02-26
EP0263307A3 (en) 1989-02-08

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee