DE3587975T2 - Fourier-Transformation-Ionen-Zyklotron-Resonanz-Massenspektrometer mit räumlicher Trennung von Quellen und Detektor. - Google Patents

Fourier-Transformation-Ionen-Zyklotron-Resonanz-Massenspektrometer mit räumlicher Trennung von Quellen und Detektor.

Info

Publication number
DE3587975T2
DE3587975T2 DE3587975T DE3587975T DE3587975T2 DE 3587975 T2 DE3587975 T2 DE 3587975T2 DE 3587975 T DE3587975 T DE 3587975T DE 3587975 T DE3587975 T DE 3587975T DE 3587975 T2 DE3587975 T2 DE 3587975T2
Authority
DE
Germany
Prior art keywords
cyclotron resonance
ionic
ion cyclotron
fourier transform
mass
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Revoked
Application number
DE3587975T
Other languages
English (en)
Other versions
DE3587975D1 (de
Inventor
Jon Timothy Meek
Gerald William Stockton
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Wyeth Holdings LLC
Original Assignee
American Cyanamid Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=24753764&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE3587975(T2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by American Cyanamid Co filed Critical American Cyanamid Co
Application granted granted Critical
Publication of DE3587975D1 publication Critical patent/DE3587975D1/de
Publication of DE3587975T2 publication Critical patent/DE3587975T2/de
Anticipated expiration legal-status Critical
Revoked legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N24/00—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
    • G01N24/14—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects by using cyclotron resonance
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/36—Radio frequency spectrometers, e.g. Bennett-type spectrometers, Redhead-type spectrometers
    • H01J49/38—Omegatrons ; using ion cyclotron resonance
DE3587975T 1984-12-24 1985-11-26 Fourier-Transformation-Ionen-Zyklotron-Resonanz-Massenspektrometer mit räumlicher Trennung von Quellen und Detektor. Revoked DE3587975T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/685,811 US4686365A (en) 1984-12-24 1984-12-24 Fourier transform ion cyclothon resonance mass spectrometer with spatially separated sources and detector

Publications (2)

Publication Number Publication Date
DE3587975D1 DE3587975D1 (de) 1995-02-23
DE3587975T2 true DE3587975T2 (de) 1995-07-27

Family

ID=24753764

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3587975T Revoked DE3587975T2 (de) 1984-12-24 1985-11-26 Fourier-Transformation-Ionen-Zyklotron-Resonanz-Massenspektrometer mit räumlicher Trennung von Quellen und Detektor.

Country Status (7)

Country Link
US (1) US4686365A (de)
EP (1) EP0185944B1 (de)
JP (1) JPH0746597B2 (de)
KR (1) KR940002515B1 (de)
AT (1) ATE117127T1 (de)
CA (1) CA1251871A (de)
DE (1) DE3587975T2 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE112004003144B4 (de) * 2003-09-25 2018-02-08 Thermo Finnigan Llc Verfahren und Vorrichtung zur Massenspektrometrie

Families Citing this family (70)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3515766A1 (de) * 1985-05-02 1986-11-06 Spectrospin AG, Fällanden, Zürich Ionen-zyklotron-resonanz-spektrometer
DE3538407A1 (de) * 1985-10-29 1987-04-30 Spectrospin Ag Ionen-zyklotron-resonanz-spektrometer
DE3627605A1 (de) * 1986-08-14 1988-02-25 Spectrospin Ag Verfahren zum eliminieren unerwuenschter geladener teilchen aus der messzelle eines icr-spektrometers
DE3719018A1 (de) * 1987-06-06 1988-12-22 Spectrospin Ag Verfahren zur aufnahme von icr-massenspektren und zur durchfuehrung des verfahrens ausgebildetes icr-massenspektrometer
DE3733853A1 (de) * 1987-10-07 1989-04-27 Spectrospin Ag Verfahren zum einbringen von ionen in die ionenfalle eines ionen-zyklotron-resonanz-spektrometers und zur durchfuehrung des verfahrens ausgebildetes ionen-zyklotron-resonanz-spektrometers
US4845364A (en) * 1988-02-29 1989-07-04 Battelle Memorial Institute Coaxial reentrant ion source for surface mass spectroscopy
US4959543A (en) * 1988-06-03 1990-09-25 Ionspec Corporation Method and apparatus for acceleration and detection of ions in an ion cyclotron resonance cell
US4990775A (en) * 1988-06-06 1991-02-05 University Of Delaware Resolution improvement in an ion cyclotron resonance mass spectrometer
DE3821998A1 (de) * 1988-06-30 1990-01-04 Spectrospin Ag Icr-ionenfalle
FR2634063B1 (fr) * 1988-07-07 1991-05-10 Univ Metz Interface microsonde laser pour spectrometre de masse
US4990856A (en) * 1989-01-23 1991-02-05 Varian Associates, Inc. Mass analysis apparatus and method
US4931640A (en) * 1989-05-19 1990-06-05 Marshall Alan G Mass spectrometer with reduced static electric field
US4945234A (en) * 1989-05-19 1990-07-31 Extrel Ftms, Inc. Method and apparatus for producing an arbitrary excitation spectrum for Fourier transform mass spectrometry
JPH05500726A (ja) * 1989-06-06 1993-02-12 ヴァイキング　インストゥルメンツ　コーポレーション 小型質量分析器システム
US5313061A (en) * 1989-06-06 1994-05-17 Viking Instrument Miniaturized mass spectrometer system
US5013912A (en) * 1989-07-14 1991-05-07 University Of The Pacific General phase modulation method for stored waveform inverse fourier transform excitation for fourier transform ion cyclotron resonance mass spectrometry
US4982088A (en) * 1990-02-02 1991-01-01 California Institute Of Technology Method and apparatus for highly sensitive spectroscopy of trapped ions
US5248883A (en) * 1991-05-30 1993-09-28 International Business Machines Corporation Ion traps of mono- or multi-planar geometry and planar ion trap devices
US5179278A (en) * 1991-08-23 1993-01-12 Mds Health Group Limited Multipole inlet system for ion traps
US5302827A (en) * 1993-05-11 1994-04-12 Mks Instruments, Inc. Quadrupole mass spectrometer
GB9419912D0 (en) * 1994-10-03 1994-11-16 Coin Controls Optical coin sensing station
US5539204A (en) * 1995-02-10 1996-07-23 Regents Of The University Of California Mass spectrometer vacuum housing and pumping system
GB9507257D0 (en) * 1995-04-07 1995-05-31 Coin Controls Coin validation apparatus and method
DE19524963A1 (de) * 1995-07-08 1997-01-09 Bosch Gmbh Robert Schaltnetzteil mit B-Steuerung
DE69625206D1 (de) * 1995-07-14 2003-01-16 Coin Controls Münzprüfer
JP3623025B2 (ja) * 1995-09-29 2005-02-23 日機装株式会社 混合気体成分分析装置
US5986258A (en) * 1995-10-25 1999-11-16 Bruker Daltonics, Inc. Extended Bradbury-Nielson gate
US5712480A (en) * 1995-11-16 1998-01-27 Leco Corporation Time-of-flight data acquisition system
US5767512A (en) * 1996-01-05 1998-06-16 Battelle Memorial Institute Method for reduction of selected ion intensities in confined ion beams
GB9601335D0 (en) 1996-01-23 1996-03-27 Coin Controls Coin validator
GB9611659D0 (en) 1996-06-05 1996-08-07 Coin Controls Coin validator calibration
US6225624B1 (en) * 1998-10-16 2001-05-01 Siemens Aktiengesellschaft Precision pressure monitor
US6121609A (en) * 1998-10-16 2000-09-19 Siemens Aktiengesellschaft Pulsed mass spectrometer leak valve with controlled energy closure
US6452168B1 (en) * 1999-09-15 2002-09-17 Ut-Battelle, Llc Apparatus and methods for continuous beam fourier transform mass spectrometry
US6858839B1 (en) * 2000-02-08 2005-02-22 Agilent Technologies, Inc. Ion optics for mass spectrometers
US6703628B2 (en) 2000-07-25 2004-03-09 Axceliss Technologies, Inc Method and system for ion beam containment in an ion beam guide
US6414329B1 (en) * 2000-07-25 2002-07-02 Axcelis Technologies, Inc. Method and system for microwave excitation of plasma in an ion beam guide
GB0029040D0 (en) * 2000-11-29 2001-01-10 Micromass Ltd Orthogonal time of flight mass spectrometer
US7038197B2 (en) * 2001-04-03 2006-05-02 Micromass Limited Mass spectrometer and method of mass spectrometry
AUPR474801A0 (en) * 2001-05-03 2001-05-31 University Of Sydney, The Mass spectrometer
EP1464070A1 (de) 2002-01-09 2004-10-06 Trustees Of Boston University Vorrichung und verfahren zur ionen-zyklotron-resonanz-massenspektrometrie
JP2005528756A (ja) * 2002-05-31 2005-09-22 サーモ フィニガン エルエルシー 精度の向上した質量分析装置
US6686595B2 (en) * 2002-06-26 2004-02-03 Semequip Inc. Electron impact ion source
AU2003262835A1 (en) * 2002-08-23 2004-03-11 Efeckta Technologies Corporation Image processing of mass spectrometry data for using at multiple resolutions
GB2399450A (en) * 2003-03-10 2004-09-15 Thermo Finnigan Llc Mass spectrometer
US6815674B1 (en) * 2003-06-03 2004-11-09 Monitor Instruments Company, Llc Mass spectrometer and related ionizer and methods
US6891174B2 (en) * 2003-07-31 2005-05-10 Axcelis Technologies, Inc. Method and system for ion beam containment using photoelectrons in an ion beam guide
US7038200B2 (en) * 2004-04-28 2006-05-02 Bruker Daltonik Gmbh Ion cyclotron resonance mass spectrometer
GB0416288D0 (en) * 2004-07-21 2004-08-25 Micromass Ltd Mass spectrometer
US20060043285A1 (en) * 2004-08-26 2006-03-02 Battelle Memorial Institute Method and apparatus for enhanced sequencing of complex molecules using surface-induced dissociation in conjunction with mass spectrometric analysis
US7064322B2 (en) * 2004-10-01 2006-06-20 Agilent Technologies, Inc. Mass spectrometer multipole device
US7482580B2 (en) * 2005-10-20 2009-01-27 Agilent Technologies, Inc. Dynamic adjustment of ion monitoring periods
US7855557B2 (en) * 2006-01-16 2010-12-21 National University Corporation Kobe University Gas nuclear magnetic resonance apparatus
US7501621B2 (en) 2006-07-12 2009-03-10 Leco Corporation Data acquisition system for a spectrometer using an adaptive threshold
KR100824693B1 (ko) * 2006-11-20 2008-04-24 한국기초과학지원연구원 혼성 이온 전송 장치
US7777182B2 (en) * 2007-08-02 2010-08-17 Battelle Energy Alliance, Llc Method and apparatus for ion cyclotron spectrometry
WO2009062145A1 (en) * 2007-11-09 2009-05-14 Vista Clara, Inc. Multicoil low-field nuclear magnetic resonance detection and imaging apparatus and method
KR100962550B1 (ko) * 2007-12-31 2010-06-14 한국기초과학지원연구원 푸리에변환 이온 싸이클로트론 공명 질량분석기의 데이터획득 장치 및 그 방법
DE102007063567A1 (de) 2007-12-31 2009-07-09 Daimler Ag Verfahren zur Erzeugung einer nichtzylindrischen Bohrungsfläche in einem Werkstück durch Formhonen
US20090258810A1 (en) * 2008-04-01 2009-10-15 Brian Xiaoqing Song Gel automatic dishwashing detergent composition
US7709790B2 (en) * 2008-04-01 2010-05-04 Thermo Finnigan Llc Removable ion source that does not require venting of the vacuum chamber
CA2731106A1 (en) * 2008-08-15 2010-02-18 Jennifer Beth Ponder Benefit compositions comprising polyglycerol esters
DE102008064610B4 (de) * 2008-12-30 2019-01-24 Bruker Daltonik Gmbh Anregung von Ionen in ICR-Massenspektrometern
US8309911B2 (en) * 2009-08-25 2012-11-13 Agilent Technologies, Inc. Methods and apparatus for filling an ion detector cell
KR101239747B1 (ko) * 2010-12-03 2013-03-06 한국기초과학지원연구원 푸리에 변환 이온 싸이클로트론 공명 질량 분석기 및 푸리에 변환 이온 싸이클로트론 공명 질량 분석을 위한 이온 집중 방법
GB2488745B (en) * 2010-12-14 2016-12-07 Thermo Fisher Scient (Bremen) Gmbh Ion Detection
DE102011015595B8 (de) * 2011-03-30 2015-01-29 Krohne Messtechnik Gmbh Verfahren zur Ansteuerung eines synchronous ion shield Massenseparators
KR101879274B1 (ko) * 2012-01-09 2018-08-20 삼성디스플레이 주식회사 저온 증착 장치
US11499764B2 (en) * 2019-09-04 2022-11-15 Quantinuum Llc Cable management for cryogenic system
JP7440475B2 (ja) * 2021-11-05 2024-02-28 日本電子株式会社 高電圧増幅回路、及び分析装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3922543A (en) * 1972-10-17 1975-11-25 Jesse L Beauchamp Ion cyclotron resonance spectrometer and method
US3984681A (en) * 1974-08-27 1976-10-05 Nasa Ion and electron detector for use in an ICR spectrometer
US3937955A (en) * 1974-10-15 1976-02-10 Nicolet Technology Corporation Fourier transform ion cyclotron resonance spectroscopy method and apparatus
US3997846A (en) * 1975-06-30 1976-12-14 International Business Machines Corporation Method and apparatus for electrostatic deflection of high current ion beams in scanning apparatus
DE3124465C2 (de) * 1981-06-22 1985-02-14 Spectrospin AG, Fällanden, Zürich Verfahren zur Ionen-Zyklotron-Resonanz-Spektroskopie
US4535235A (en) * 1983-05-06 1985-08-13 Finnigan Corporation Apparatus and method for injection of ions into an ion cyclotron resonance cell
US4581533A (en) * 1984-05-15 1986-04-08 Nicolet Instrument Corporation Mass spectrometer and method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE112004003144B4 (de) * 2003-09-25 2018-02-08 Thermo Finnigan Llc Verfahren und Vorrichtung zur Massenspektrometrie
DE112004003145B4 (de) * 2003-09-25 2019-01-03 Thermo Finnigan Llc Verfahren zur Massenspektrometrie
DE112004001794B4 (de) * 2003-09-25 2019-12-12 Thermo Finnigan Llc Verfahren zur Massenspektrometrie

Also Published As

Publication number Publication date
JPH0746597B2 (ja) 1995-05-17
EP0185944B1 (de) 1995-01-11
KR940002515B1 (ko) 1994-03-25
KR860005224A (ko) 1986-07-18
ATE117127T1 (de) 1995-01-15
JPS61203554A (ja) 1986-09-09
CA1251871A (en) 1989-03-28
EP0185944A3 (en) 1987-10-07
EP0185944A2 (de) 1986-07-02
DE3587975D1 (de) 1995-02-23
US4686365A (en) 1987-08-11

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Legal Events

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8363 Opposition against the patent
8331 Complete revocation