DE3587220D1 - Identifizierungsverfahren von konturlinien. - Google Patents

Identifizierungsverfahren von konturlinien.

Info

Publication number
DE3587220D1
DE3587220D1 DE8585100073T DE3587220T DE3587220D1 DE 3587220 D1 DE3587220 D1 DE 3587220D1 DE 8585100073 T DE8585100073 T DE 8585100073T DE 3587220 T DE3587220 T DE 3587220T DE 3587220 D1 DE3587220 D1 DE 3587220D1
Authority
DE
Germany
Prior art keywords
identification method
contour lines
contour
lines
identification
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8585100073T
Other languages
English (en)
Other versions
DE3587220T2 (de
Inventor
Yuji Watanabe
Kozo Kato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Komatsu Ltd
Original Assignee
Komatsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP59004451A external-priority patent/JPS60147886A/ja
Priority claimed from JP59026580A external-priority patent/JPS60179881A/ja
Application filed by Komatsu Ltd filed Critical Komatsu Ltd
Publication of DE3587220D1 publication Critical patent/DE3587220D1/de
Application granted granted Critical
Publication of DE3587220T2 publication Critical patent/DE3587220T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/40—Extraction of image or video features
    • G06V10/44—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components
DE8585100073T 1984-01-13 1985-01-04 Identifizierungsverfahren von konturlinien. Expired - Fee Related DE3587220T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP59004451A JPS60147886A (ja) 1984-01-13 1984-01-13 輪郭線の連続性認識方法
JP59026580A JPS60179881A (ja) 1984-02-15 1984-02-15 輪郭線の認識方法

Publications (2)

Publication Number Publication Date
DE3587220D1 true DE3587220D1 (de) 1993-05-06
DE3587220T2 DE3587220T2 (de) 1993-07-08

Family

ID=26338218

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8585100073T Expired - Fee Related DE3587220T2 (de) 1984-01-13 1985-01-04 Identifizierungsverfahren von konturlinien.

Country Status (3)

Country Link
US (1) US4644583A (de)
EP (1) EP0149457B1 (de)
DE (1) DE3587220T2 (de)

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IT1179997B (it) * 1984-02-24 1987-09-23 Consiglio Nazionale Ricerche Procedimento ed apparecchiatura per il rilievo dell impronta lasciata in un provino nella misura della durezza alla penetrazione
GB2175396B (en) * 1985-05-22 1989-06-28 Filler Protection Developments Apparatus for examining objects
SE448126B (sv) * 1985-05-23 1987-01-19 Context Vision Ab Anordning for detektering av sprangartade forendringar av en egenskap inom ett omrade av en i diskreta bildelement uppdelad bild
SE448125B (sv) * 1985-05-23 1987-01-19 Context Vision Ab Anordning for bestemning av graden av konstans hos en egenskap for ett omrade i en i diskreta bildelement uppdelad bild
SE448124B (sv) * 1985-05-23 1987-01-19 Context Vision Ab Anordning for detektering av variationsgraden av en egenskap i ett omrade av en i diskreta bildelement uppdelad bild
KR900007548B1 (ko) * 1985-10-04 1990-10-15 다이닛뽕스쿠링세이소오 가부시키가이샤 패턴 마스킹 방법 및 그 장치
JPS62103508A (ja) * 1985-10-31 1987-05-14 Hajime Sangyo Kk 物体の外形検査方法及び装置
DE3542484A1 (de) * 1985-11-30 1987-07-02 Ant Nachrichtentech Verfahren zur erkennung von kantenstrukturen in einem bildsignal
JPS63503332A (ja) * 1985-12-16 1988-12-02 ブリティッシュ・テクノロジー・グループ・リミテッド 検査装置
JPS62209305A (ja) * 1986-03-10 1987-09-14 Fujitsu Ltd 寸法良否判定方法
JPS62209304A (ja) * 1986-03-10 1987-09-14 Fujitsu Ltd 寸法測定方法
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US4759074A (en) * 1986-10-28 1988-07-19 General Motors Corporation Method for automatically inspecting parts utilizing machine vision and system utilizing same
US4933865A (en) * 1986-12-20 1990-06-12 Fujitsu Limited Apparatus for recognition of drawn shapes or view types for automatic drawing input in CAD system
JP2596744B2 (ja) * 1987-04-16 1997-04-02 富士写真フイルム株式会社 放射線照射野認識方法
US4825263A (en) * 1987-06-02 1989-04-25 University Of Medicine & Dentistry Of New Jersey Optical method and apparatus for determining three-dimensional changes in facial contours
US4961425A (en) * 1987-08-14 1990-10-09 Massachusetts Institute Of Technology Morphometric analysis of anatomical tomographic data
DE3878802T2 (de) * 1987-09-18 1993-06-24 Toppan Printing Co Ltd Konturenzeichner.
JP2735197B2 (ja) * 1987-11-12 1998-04-02 株式会社東芝 図形入力装置
EP0334230B1 (de) * 1988-03-19 1995-09-06 Fuji Photo Film Co., Ltd. Verfahren zur Erkennung von möglichen Konturpunkten in einem Strahlungsfeld
US4992663A (en) * 1988-03-19 1991-02-12 Fuji Photo Film Co., Ltd. Method of judging the correctness or incorrectness of a prospective contour point of an irradiation field
US4901361A (en) * 1988-05-27 1990-02-13 The United States Of America As Represented By The Secretary Of The Air Force Automated spall panel analyzer
US5018211A (en) * 1988-10-31 1991-05-21 International Business Machines Corp. System for detecting and analyzing rounded objects
GB8906587D0 (en) * 1989-03-22 1989-05-04 Philips Electronic Associated Region/texture coding systems
JPH083405B2 (ja) * 1989-06-30 1996-01-17 松下電器産業株式会社 リード位置認識装置
US5054094A (en) * 1990-05-07 1991-10-01 Eastman Kodak Company Rotationally impervious feature extraction for optical character recognition
JP2528376B2 (ja) * 1990-06-28 1996-08-28 大日本スクリーン製造株式会社 画像の輪郭修正方法
JP2982150B2 (ja) * 1990-08-28 1999-11-22 キヤノン株式会社 文字パターン処理方法及び装置
US5345242A (en) * 1990-09-27 1994-09-06 Loral Aerospace Corp. Clutter rejection using connectivity
US5287293A (en) * 1990-12-31 1994-02-15 Industrial Technology Research Institute Method and apparatus for inspecting the contours of a gear
JPH04237383A (ja) * 1991-01-22 1992-08-25 Matsushita Electric Ind Co Ltd 二次元画像処理における円弧近似方法
US5134661A (en) * 1991-03-04 1992-07-28 Reinsch Roger A Method of capture and analysis of digitized image data
JP2639518B2 (ja) * 1991-10-30 1997-08-13 大日本スクリーン製造株式会社 画像処理方法
US5590220A (en) * 1992-08-12 1996-12-31 International Business Machines Corporation Bending point extraction method for optical character recognition system
US5339367A (en) * 1992-12-02 1994-08-16 National Research Council Of Canada Identifying curves within a scanned image
JP2919284B2 (ja) * 1994-02-23 1999-07-12 松下電工株式会社 物体認識方法
US6178262B1 (en) * 1994-03-11 2001-01-23 Cognex Corporation Circle location
US6021222A (en) * 1994-08-16 2000-02-01 Ricoh Co., Ltd. System and method for the detection of a circle image for pattern recognition
US6084986A (en) * 1995-02-13 2000-07-04 Eastman Kodak Company System and method for finding the center of approximately circular patterns in images
JPH09138471A (ja) * 1995-09-13 1997-05-27 Fuji Photo Film Co Ltd 特定形状領域の抽出方法、特定領域の抽出方法及び複写条件決定方法
FR2743416B1 (fr) * 1996-01-09 1998-02-13 Service Central Des Laboratoir Procede de comparaison de douilles projectiles et dispositif
FR2743415B1 (fr) * 1996-01-09 1998-02-13 Service Central Des Laboratoir Procede de comparaison de projectiles et dispositif
US6714679B1 (en) 1998-02-05 2004-03-30 Cognex Corporation Boundary analyzer
US6901171B1 (en) 1999-04-30 2005-05-31 Cognex Technology And Investment Corporation Methods and apparatuses for refining groupings of edge points that represent a contour in an image
US6697535B1 (en) 1999-04-30 2004-02-24 Cognex Technology And Investment Corporation Method for refining a parameter of a contour in an image
JP2001119610A (ja) * 1999-08-10 2001-04-27 Alps Electric Co Ltd 輪郭検出回路及び画像表示装置
US7474787B2 (en) * 1999-12-28 2009-01-06 Minolta Co., Ltd. Apparatus and method of detecting specified pattern
TWI254234B (en) * 2004-12-24 2006-05-01 Hon Hai Prec Ind Co Ltd System and method for auto-judging geometric shape trend of a set of dots on an image
DE102005023376A1 (de) * 2005-05-17 2006-11-23 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren und Vorrichtung zum Bestimmen von Materialgrenzen eines Prüfobjektes
TWI320914B (en) * 2006-07-28 2010-02-21 Via Tech Inc Weight-adjusted apparatus and method thereof
US10896327B1 (en) * 2013-03-15 2021-01-19 Spatial Cam Llc Device with a camera for locating hidden object
DE102009048066A1 (de) 2009-10-01 2011-04-07 Conti Temic Microelectronic Gmbh Verfahren zur Verkehrszeichenerkennung
JP5476938B2 (ja) * 2009-11-16 2014-04-23 ウシオ電機株式会社 アライメントマークの検出方法
DE102010020330A1 (de) * 2010-05-14 2011-11-17 Conti Temic Microelectronic Gmbh Verfahren zur Erkennung von Verkehrszeichen
DE102011109387A1 (de) 2011-08-04 2013-02-07 Conti Temic Microelectronic Gmbh Verfahren zur Erkennung von Verkehrszeichen
DE102013219909A1 (de) 2013-10-01 2015-04-02 Conti Temic Microelectronic Gmbh Verfahren und Vorrichtung zur Erkennung von Verkehrszeichen
JP2016123407A (ja) 2014-12-26 2016-07-11 富士通株式会社 画像処理装置、画像処理方法および画像処理プログラム
US20170337689A1 (en) * 2016-05-20 2017-11-23 Yung-Hui Li Method for validating segmentation of objects with arbitrary shapes

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4017721A (en) * 1974-05-16 1977-04-12 The Bendix Corporation Method and apparatus for determining the position of a body
JPS5218136A (en) * 1975-08-01 1977-02-10 Hitachi Ltd Signal processing unit
US4115761A (en) * 1976-02-13 1978-09-19 Hitachi, Ltd. Method and device for recognizing a specific pattern
US4228432A (en) * 1979-08-28 1980-10-14 The United States Of America As Represented By The Secretary Of The Navy Raster scan generator for plan view display
JPS5926064B2 (ja) * 1979-09-10 1984-06-23 工業技術院長 輪郭画像の特徴抽出装置

Also Published As

Publication number Publication date
DE3587220T2 (de) 1993-07-08
EP0149457A2 (de) 1985-07-24
US4644583A (en) 1987-02-17
EP0149457B1 (de) 1993-03-31
EP0149457A3 (en) 1989-02-22

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee