DE3583085D1 - Lineares rueckgekoppeltes schieberegister zur gueltigkeitsbestaetigung bei der schaltungsentwurftechnologie. - Google Patents

Lineares rueckgekoppeltes schieberegister zur gueltigkeitsbestaetigung bei der schaltungsentwurftechnologie.

Info

Publication number
DE3583085D1
DE3583085D1 DE8585303443T DE3583085T DE3583085D1 DE 3583085 D1 DE3583085 D1 DE 3583085D1 DE 8585303443 T DE8585303443 T DE 8585303443T DE 3583085 T DE3583085 T DE 3583085T DE 3583085 D1 DE3583085 D1 DE 3583085D1
Authority
DE
Germany
Prior art keywords
linear
circuit design
device technology
design technology
validity confirmation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8585303443T
Other languages
English (en)
Inventor
Venkatraman Iyer
Gil Lee
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advanced Micro Devices Inc
Original Assignee
Advanced Micro Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advanced Micro Devices Inc filed Critical Advanced Micro Devices Inc
Application granted granted Critical
Publication of DE3583085D1 publication Critical patent/DE3583085D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318385—Random or pseudo-random test pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318522—Test of Sequential circuits
    • G01R31/31853—Test of registers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/27—Built-in tests
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/277—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C19/00—Digital stores in which the information is moved stepwise, e.g. shift registers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Logic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Dc Digital Transmission (AREA)
  • Pulse Circuits (AREA)
  • Electronic Switches (AREA)
  • Synchronisation In Digital Transmission Systems (AREA)
DE8585303443T 1984-05-17 1985-05-16 Lineares rueckgekoppeltes schieberegister zur gueltigkeitsbestaetigung bei der schaltungsentwurftechnologie. Expired - Lifetime DE3583085D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/611,450 US4713605A (en) 1984-05-17 1984-05-17 Linear feedback shift register for circuit design technology validation

Publications (1)

Publication Number Publication Date
DE3583085D1 true DE3583085D1 (de) 1991-07-11

Family

ID=24449069

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8585303443T Expired - Lifetime DE3583085D1 (de) 1984-05-17 1985-05-16 Lineares rueckgekoppeltes schieberegister zur gueltigkeitsbestaetigung bei der schaltungsentwurftechnologie.

Country Status (5)

Country Link
US (1) US4713605A (de)
EP (1) EP0171874B1 (de)
JP (1) JPH077041B2 (de)
AT (1) ATE64230T1 (de)
DE (1) DE3583085D1 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8626517D0 (en) * 1986-11-06 1986-12-10 Int Computers Ltd Testing programmable logic arrays
GB8626516D0 (en) * 1986-11-06 1986-12-10 Int Computers Ltd Testing programmable logic arrays
JPS63182585A (ja) * 1987-01-26 1988-07-27 Toshiba Corp テスト容易化機能を備えた論理回路
US5033048A (en) * 1988-04-01 1991-07-16 Digital Equipment Corporation Memory selftest method and apparatus same
US5228045A (en) * 1990-08-06 1993-07-13 Ncr Corporation Test driver for connecting a standard test port integrated circuit chip to a controlling computer
US5991909A (en) * 1996-10-15 1999-11-23 Mentor Graphics Corporation Parallel decompressor and related methods and apparatuses
US6675338B1 (en) * 2000-08-09 2004-01-06 Sun Microsystems, Inc. Internally generated vectors for burnin system
US6665760B1 (en) 2000-09-29 2003-12-16 Rockwell Automation Technologies, Inc. Group shifting and level shifting rotational arbiter system
US6883132B1 (en) 2000-09-29 2005-04-19 Rockwell Automation Technologies, Inc. Programmable error checking value circuit and method
US6556021B1 (en) * 2000-11-29 2003-04-29 Lsi Logic Corporation Device frequency measurement system
GB2375463A (en) * 2001-05-08 2002-11-13 Ubinetics Ltd Configurable encoder
JP4254201B2 (ja) * 2002-10-31 2009-04-15 ソニー株式会社 スクランブラ、送信装置および受信装置
DE102005024917A1 (de) * 2005-05-31 2006-12-07 Advanced Micro Devices, Inc., Sunnyvale Dynamische Synchronisierersimulation
US7668893B2 (en) * 2005-08-30 2010-02-23 Micron Technology, Inc. Data generator having linear feedback shift registers for generating data pattern in forward and reverse orders
WO2007034935A1 (en) 2005-09-21 2007-03-29 Semiconductor Energy Laboratory Co., Ltd. Cyclic redundancy check circuit and semiconductor device having the cyclic redundancy check circuit
CA2664620A1 (en) 2009-05-07 2009-07-20 Avalon Microelectronics, Inc. Pseudo-random bit sequence generator
US8949493B1 (en) 2010-07-30 2015-02-03 Altera Corporation Configurable multi-lane scrambler for flexible protocol support
CN111105825A (zh) * 2018-10-26 2020-05-05 长鑫存储技术有限公司 移位寄存器电路、动态随机存储器和电路控制方法
CN113030709B (zh) * 2021-04-06 2022-06-24 中国科学院上海微系统与信息技术研究所 超导高频测试系统和方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3976864A (en) * 1974-09-03 1976-08-24 Hewlett-Packard Company Apparatus and method for testing digital circuits
US4340857A (en) * 1980-04-11 1982-07-20 Siemens Corporation Device for testing digital circuits using built-in logic block observers (BILBO's)

Also Published As

Publication number Publication date
US4713605A (en) 1987-12-15
JPS60259973A (ja) 1985-12-23
EP0171874B1 (de) 1991-06-05
EP0171874A2 (de) 1986-02-19
JPH077041B2 (ja) 1995-01-30
ATE64230T1 (de) 1991-06-15
EP0171874A3 (en) 1988-08-10

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee