DE3582031D1 - Photodetektor. - Google Patents

Photodetektor.

Info

Publication number
DE3582031D1
DE3582031D1 DE8585115750T DE3582031T DE3582031D1 DE 3582031 D1 DE3582031 D1 DE 3582031D1 DE 8585115750 T DE8585115750 T DE 8585115750T DE 3582031 T DE3582031 T DE 3582031T DE 3582031 D1 DE3582031 D1 DE 3582031D1
Authority
DE
Germany
Prior art keywords
photodetector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8585115750T
Other languages
English (en)
Inventor
Kazuo Ito
Toshiyuki Kudo
Ritsuo Hama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP19104984U external-priority patent/JPS61105921U/ja
Priority claimed from JP19105084U external-priority patent/JPS61105922U/ja
Priority claimed from JP1824885U external-priority patent/JPS61136331U/ja
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Application granted granted Critical
Publication of DE3582031D1 publication Critical patent/DE3582031D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0203—Containers; Encapsulations, e.g. encapsulation of photodiodes
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/08—Disposition or mounting of heads or light sources relatively to record carriers
    • G11B7/09—Disposition or mounting of heads or light sources relatively to record carriers with provision for moving the light beam or focus plane for the purpose of maintaining alignment of the light beam relative to the record carrier during transducing operation, e.g. to compensate for surface irregularities of the latter or for track following
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/12—Heads, e.g. forming of the optical beam spot or modulation of the optical beam
    • G11B7/13—Optical detectors therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • H01L25/041—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L31/00
    • H01L25/042—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L31/00 the devices being arranged next to each other
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0232—Optical elements or arrangements associated with the device
    • H01L31/02325—Optical elements or arrangements associated with the device the optical elements not being integrated nor being directly associated with the device
DE8585115750T 1984-12-17 1985-12-11 Photodetektor. Expired - Lifetime DE3582031D1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP19104984U JPS61105921U (de) 1984-12-17 1984-12-17
JP19105084U JPS61105922U (de) 1984-12-17 1984-12-17
JP1824885U JPS61136331U (de) 1985-02-12 1985-02-12

Publications (1)

Publication Number Publication Date
DE3582031D1 true DE3582031D1 (de) 1991-04-11

Family

ID=27282140

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8585115750T Expired - Lifetime DE3582031D1 (de) 1984-12-17 1985-12-11 Photodetektor.

Country Status (4)

Country Link
US (1) US4697074A (de)
EP (1) EP0186044B1 (de)
CA (1) CA1269163A (de)
DE (1) DE3582031D1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3782201T2 (de) * 1986-07-16 1993-04-15 Canon Kk Halbleiterphotosensor und verfahren zu dessen herstellung.
JP3028854B2 (ja) * 1990-07-18 2000-04-04 セイコーエプソン株式会社 光ヘッド及び光記憶再生装置
JP2795528B2 (ja) * 1990-07-25 1998-09-10 パイオニア株式会社 信号検出装置
JP2705326B2 (ja) * 1991-02-19 1998-01-28 日本電気株式会社 光磁気ヘッド装置
JP2661521B2 (ja) * 1993-09-25 1997-10-08 日本電気株式会社 半導体受光装置
DE19960055A1 (de) * 1999-12-13 2001-06-21 Thomson Brandt Gmbh Photoelement für ein Gerät zum Lesen optischer Aufzeichnungsträger und Verfahren zu dessen Herstellung
US7066335B2 (en) * 2001-12-19 2006-06-27 Pretech As Apparatus for receiving and distributing cash
US20090027038A1 (en) * 2002-10-23 2009-01-29 Elsa Garmire Systems And Methods That Detect Changes In Incident Optical Radiation
US7423279B2 (en) * 2002-10-23 2008-09-09 The Trustees Of Dartmouth College Systems and methods that detect changes in incident optical radiation
US20070041729A1 (en) * 2002-10-23 2007-02-22 Philip Heinz Systems and methods for detecting changes in incident optical radiation at high frequencies
US7576361B2 (en) 2005-08-03 2009-08-18 Aptina Imaging Corporation Backside silicon wafer design reducing image artifacts from infrared radiation

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1614865A1 (de) * 1967-09-27 1970-12-23 Telefunken Patent Optoelektronische Halbleiteranordnung
DE2253699C3 (de) * 1972-11-02 1978-11-23 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Halbleiter-Optokoppler und Verfahren zu seiner Herstellung
US3842263A (en) * 1973-02-01 1974-10-15 Gen Electric Molded opto-electronic transducer
US3859536A (en) * 1974-01-07 1975-01-07 Corning Glass Works Optical communication system source-detector pair
US4124860A (en) * 1975-02-27 1978-11-07 Optron, Inc. Optical coupler
FR2388412A1 (fr) * 1977-04-18 1978-11-17 Radiotechnique Compelec Element isolant pour dispositif optoelectronique photocoupleur et dispositifs comportant un tel element
JPS5412285A (en) * 1977-06-27 1979-01-29 Hitachi Ltd Photo detector
JPS58192366A (ja) * 1982-05-07 1983-11-09 Hitachi Ltd 受光素子内蔵集積回路装置
US4675263A (en) * 1984-03-12 1987-06-23 Canon Kabushiki Kaisha Member having substrate and light-receiving layer of A-Si:Ge film and A-Si film with non-parallel interface with substrate

Also Published As

Publication number Publication date
CA1269163A (en) 1990-05-15
EP0186044A3 (en) 1989-02-08
EP0186044A2 (de) 1986-07-02
EP0186044B1 (de) 1991-03-06
US4697074A (en) 1987-09-29

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition