DE3542121C2 - - Google Patents

Info

Publication number
DE3542121C2
DE3542121C2 DE19853542121 DE3542121A DE3542121C2 DE 3542121 C2 DE3542121 C2 DE 3542121C2 DE 19853542121 DE19853542121 DE 19853542121 DE 3542121 A DE3542121 A DE 3542121A DE 3542121 C2 DE3542121 C2 DE 3542121C2
Authority
DE
Germany
Prior art keywords
resistor
voltage
amplifier
terminal
connection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE19853542121
Other languages
German (de)
English (en)
Other versions
DE3542121A1 (de
Inventor
Ryoichi Yokohama Kanagawa Jp Sakai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Japan Ltd
Original Assignee
Sony Tektronix Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Tektronix Corp filed Critical Sony Tektronix Corp
Publication of DE3542121A1 publication Critical patent/DE3542121A1/de
Application granted granted Critical
Publication of DE3542121C2 publication Critical patent/DE3542121C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G01R31/2603—Apparatus or methods therefor for curve tracing of semiconductor characteristics, e.g. on oscilloscope

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Amplifiers (AREA)
DE19853542121 1984-12-05 1985-11-28 Messvorrichtung fuer elektronische bauelemente Granted DE3542121A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25719684A JPS61134682A (ja) 1984-12-05 1984-12-05 素子特性測定装置

Publications (2)

Publication Number Publication Date
DE3542121A1 DE3542121A1 (de) 1986-06-05
DE3542121C2 true DE3542121C2 (enrdf_load_stackoverflow) 1991-09-05

Family

ID=17303010

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19853542121 Granted DE3542121A1 (de) 1984-12-05 1985-11-28 Messvorrichtung fuer elektronische bauelemente

Country Status (5)

Country Link
JP (1) JPS61134682A (enrdf_load_stackoverflow)
CA (1) CA1228176A (enrdf_load_stackoverflow)
DE (1) DE3542121A1 (enrdf_load_stackoverflow)
GB (1) GB2168162B (enrdf_load_stackoverflow)
NL (1) NL190940C (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0721526B2 (ja) * 1987-08-18 1995-03-08 ソニ−・テクトロニクス株式会社 素子測定装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2980853A (en) * 1958-04-28 1961-04-18 Ryan Aeronautical Co Component output characteristic tracer
US3573618A (en) * 1968-05-27 1971-04-06 William G Dilley Solid-state characteristic curve tracer attachment for oscilloscopes
US4456880A (en) * 1982-02-04 1984-06-26 Warner Thomas H I-V Curve tracer employing parametric sampling

Also Published As

Publication number Publication date
GB2168162B (en) 1988-12-07
JPS61134682A (ja) 1986-06-21
CA1228176A (en) 1987-10-13
NL190940B (nl) 1994-06-01
NL8502440A (nl) 1986-07-01
DE3542121A1 (de) 1986-06-05
NL190940C (nl) 1994-11-01
GB2168162A (en) 1986-06-11
GB8522687D0 (en) 1985-10-16
JPH0137701B2 (enrdf_load_stackoverflow) 1989-08-09

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee