DE3537199A1 - Verfahren zum ermitteln des mittelpunktes eines elektrophoretischen bildes - Google Patents

Verfahren zum ermitteln des mittelpunktes eines elektrophoretischen bildes

Info

Publication number
DE3537199A1
DE3537199A1 DE19853537199 DE3537199A DE3537199A1 DE 3537199 A1 DE3537199 A1 DE 3537199A1 DE 19853537199 DE19853537199 DE 19853537199 DE 3537199 A DE3537199 A DE 3537199A DE 3537199 A1 DE3537199 A1 DE 3537199A1
Authority
DE
Germany
Prior art keywords
point
electrophoretic
determined
leading edge
optical density
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE19853537199
Other languages
German (de)
English (en)
Other versions
DE3537199C2 (enExample
Inventor
Mutsuro Mishima Shizuoka Kashiba
Ryuji Tokio/Tokyo Shinkawa
Hidehiko Hachioji Tokio/Tokyo Yamamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Publication of DE3537199A1 publication Critical patent/DE3537199A1/de
Application granted granted Critical
Publication of DE3537199C2 publication Critical patent/DE3537199C2/de
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/416Systems
    • G01N27/447Systems using electrophoresis
    • G01N27/44704Details; Accessories
    • G01N27/44717Arrangements for investigating the separated zones, e.g. localising zones
    • G01N27/44721Arrangements for investigating the separated zones, e.g. localising zones by optical means

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Molecular Biology (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE19853537199 1984-10-23 1985-10-18 Verfahren zum ermitteln des mittelpunktes eines elektrophoretischen bildes Granted DE3537199A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59221133A JPH0621864B2 (ja) 1984-10-23 1984-10-23 電気泳動像の分析方法

Publications (2)

Publication Number Publication Date
DE3537199A1 true DE3537199A1 (de) 1986-04-24
DE3537199C2 DE3537199C2 (enExample) 1989-03-30

Family

ID=16761970

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19853537199 Granted DE3537199A1 (de) 1984-10-23 1985-10-18 Verfahren zum ermitteln des mittelpunktes eines elektrophoretischen bildes

Country Status (2)

Country Link
JP (1) JPH0621864B2 (enExample)
DE (1) DE3537199A1 (enExample)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57204437A (en) * 1981-06-11 1982-12-15 Hiranuma Sangyo Kk Measuring method for interval of inspection body in concentration measuring apparatus
JPS5845540A (ja) * 1981-09-14 1983-03-16 Toyo Kagaku Sangyo Kk デンシトメ−タ−における検体の中心部検出方法

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Touchstone, Joseph. C.: Advances in Thin Layer Chromatography, New York u.a. 1982, John Wiley & Sons, S.132-137 *

Also Published As

Publication number Publication date
JPS6199841A (ja) 1986-05-17
DE3537199C2 (enExample) 1989-03-30
JPH0621864B2 (ja) 1994-03-23

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8125 Change of the main classification

Ipc: G01N 27/26

D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee