DE3530999A1 - Verfahren zur herstellung von halbleiteranordnungen - Google Patents
Verfahren zur herstellung von halbleiteranordnungenInfo
- Publication number
- DE3530999A1 DE3530999A1 DE19853530999 DE3530999A DE3530999A1 DE 3530999 A1 DE3530999 A1 DE 3530999A1 DE 19853530999 DE19853530999 DE 19853530999 DE 3530999 A DE3530999 A DE 3530999A DE 3530999 A1 DE3530999 A1 DE 3530999A1
- Authority
- DE
- Germany
- Prior art keywords
- epitaxial
- edge zones
- peripheral edge
- semiconductor wafers
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02538—Group 13/15 materials
- H01L21/02546—Arsenides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B19/00—Liquid-phase epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B23/00—Single-crystal growth by condensing evaporated or sublimed materials
- C30B23/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02387—Group 13/15 materials
- H01L21/02392—Phosphides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02387—Group 13/15 materials
- H01L21/02395—Arsenides
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Organic Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Metallurgy (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Led Devices (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Recrystallisation Techniques (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19853530999 DE3530999A1 (de) | 1985-08-30 | 1985-08-30 | Verfahren zur herstellung von halbleiteranordnungen |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19853530999 DE3530999A1 (de) | 1985-08-30 | 1985-08-30 | Verfahren zur herstellung von halbleiteranordnungen |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE3530999A1 true DE3530999A1 (de) | 1987-03-05 |
| DE3530999C2 DE3530999C2 (enExample) | 1989-07-27 |
Family
ID=6279744
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19853530999 Granted DE3530999A1 (de) | 1985-08-30 | 1985-08-30 | Verfahren zur herstellung von halbleiteranordnungen |
Country Status (1)
| Country | Link |
|---|---|
| DE (1) | DE3530999A1 (enExample) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2718026A1 (de) * | 1976-04-22 | 1977-11-10 | Fujitsu Ltd | Verfahren zum aufwachsen einer duennschicht aus der dampfphase |
-
1985
- 1985-08-30 DE DE19853530999 patent/DE3530999A1/de active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2718026A1 (de) * | 1976-04-22 | 1977-11-10 | Fujitsu Ltd | Verfahren zum aufwachsen einer duennschicht aus der dampfphase |
Also Published As
| Publication number | Publication date |
|---|---|
| DE3530999C2 (enExample) | 1989-07-27 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE10247017B4 (de) | SiC-Einkristall, Verfahren zur Herstellung eines SiC-Einkristalls, SiC-Wafer mit einem Epitaxiefilm und Verfahren zur Herstellung eines SiC-Wafers, der einen Epitaxiefilm aufweist | |
| EP1604390B1 (de) | Verfahren zur herstellung einer spannungsrelaxierten schichtstruktur auf einem nicht gitterangepassten substrat sowie verwendung eines solchen schichtsystems in elektronischen und/oder optoelektronischen bauelementen | |
| DE69827824T3 (de) | Kontrolle der verspannungsdichte durch verwendung von gradientenschichten und durch planarisierung | |
| DE102005045338B4 (de) | Epitaxierte Siliciumscheibe und Verfahren zur Herstellung von epitaxierten Siliciumscheiben | |
| DE2030805A1 (de) | Verfahren zur Ausbildung epitaxialer Kristalle oder Plattchen in ausgewählten Bereichen von Substraten | |
| DE19802977A1 (de) | Verfahren zur Herstellung einer einkristallinen Schicht auf einem nicht gitterangepaßten Substrat, sowie eine oder mehrere solcher Schichten enthaltendes Bauelement | |
| DE102010030358A1 (de) | Verfahren zum Abtrennen einer Substratscheibe | |
| DE2039172A1 (de) | Kristallaufwachsvorrichtung und -verfahren | |
| DE2404276C3 (de) | Verfahren zum Aufwachsen einer einkristallinen Schicht aus Halbleitermaterial auf ein Substrat | |
| JP3117755B2 (ja) | ヘテロエピタキシャル層の成長法 | |
| DE3530999C2 (enExample) | ||
| DE69906129T2 (de) | Grossflächige einkristalline monoatomschicht aus kohlenstoff vom diamant-typ und verfahren zu ihrer herstellung | |
| DE69215165T2 (de) | Diamantschicht und Verfahren zu ihrer Herstellung | |
| DE2163075C2 (de) | Verfahren zur Herstellung von elektrolumineszierenden Halbleiterbauelementen | |
| EP1571242A2 (de) | Herstellung von Substratwafern für defektarme Halbleiterbauteile, ihre Verwendung, sowie damit erhaltene Bauteile | |
| DE69811607T2 (de) | SiC-Einkristall und Verfahren zu seiner Herstellung | |
| DE69318271T2 (de) | Verfahren zum Wachstum von Verbundhalbleitern auf einer Siliziumscheibe | |
| DE69005323T2 (de) | Epitaktische Abscheidung durch MOCVD bei niedrigem Druck. | |
| DE10048475C2 (de) | Passivierung der Resonatorendflächen von Halbleiterlasern auf der Basis von III-V-Halbleitermaterial | |
| DE69019639T2 (de) | Plättchen aus halbleiterkomposit. | |
| DE4438380C1 (de) | Verfahren zur Abscheidung von einkristallinen Mischkristallschichten aus Ge¶x¶Si¶1¶¶-¶¶x¶ für Halbleiterbauelemente | |
| DE3002671A1 (de) | Verfahren zur herstellung eines siliciumcarbidsubstrats | |
| DE10006108A1 (de) | Verfahren zur Epitaxie einkristalliner Aluminiumnitrid-Schichten | |
| DE19936905A1 (de) | Verfahren zur Herstellung eines Kristalls | |
| EP0482387B1 (de) | Verfahren zur Herstellung einer supraleitenden Schicht aus YBa2Cu3O7 auf einem Substrat aus Saphir |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OM8 | Search report available as to paragraph 43 lit. 1 sentence 1 patent law | ||
| OP8 | Request for examination as to paragraph 44 patent law | ||
| D2 | Grant after examination | ||
| 8364 | No opposition during term of opposition | ||
| 8320 | Willingness to grant licenses declared (paragraph 23) | ||
| 8327 | Change in the person/name/address of the patent owner |
Owner name: TEMIC TELEFUNKEN MICROELECTRONIC GMBH, 74072 HEILB |
|
| 8327 | Change in the person/name/address of the patent owner |
Owner name: VISHAY SEMICONDUCTOR GMBH, 74072 HEILBRONN, DE |
|
| 8339 | Ceased/non-payment of the annual fee |