DE3505531C2 - - Google Patents
Info
- Publication number
- DE3505531C2 DE3505531C2 DE19853505531 DE3505531A DE3505531C2 DE 3505531 C2 DE3505531 C2 DE 3505531C2 DE 19853505531 DE19853505531 DE 19853505531 DE 3505531 A DE3505531 A DE 3505531A DE 3505531 C2 DE3505531 C2 DE 3505531C2
- Authority
- DE
- Germany
- Prior art keywords
- measuring device
- connection
- chip
- pin
- housing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 49
- 230000006870 function Effects 0.000 claims description 30
- 230000003287 optical effect Effects 0.000 claims description 17
- 239000004020 conductor Substances 0.000 claims description 11
- 230000000712 assembly Effects 0.000 claims description 7
- 238000000429 assembly Methods 0.000 claims description 7
- 239000003990 capacitor Substances 0.000 claims description 5
- 239000011810 insulating material Substances 0.000 claims description 4
- 239000011324 bead Substances 0.000 claims description 3
- 230000000694 effects Effects 0.000 claims description 3
- 238000005520 cutting process Methods 0.000 claims description 2
- 239000011347 resin Substances 0.000 claims description 2
- 229920005989 resin Polymers 0.000 claims description 2
- 238000010276 construction Methods 0.000 claims 2
- 230000000977 initiatory effect Effects 0.000 claims 2
- 239000012528 membrane Substances 0.000 claims 1
- 238000003825 pressing Methods 0.000 description 10
- 230000004913 activation Effects 0.000 description 7
- 238000000034 method Methods 0.000 description 7
- 230000003068 static effect Effects 0.000 description 7
- 238000010586 diagram Methods 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 230000004044 response Effects 0.000 description 4
- 230000002457 bidirectional effect Effects 0.000 description 3
- 230000004069 differentiation Effects 0.000 description 3
- 239000011888 foil Substances 0.000 description 3
- 238000001208 nuclear magnetic resonance pulse sequence Methods 0.000 description 3
- 230000000737 periodic effect Effects 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- 230000001360 synchronised effect Effects 0.000 description 3
- 230000000007 visual effect Effects 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- UIFGGABIJBWRMG-FMQUCBEESA-N (4-chlorophenyl)methyl (ne)-n-[(4-chlorophenyl)methoxycarbonylimino]carbamate Chemical compound C1=CC(Cl)=CC=C1COC(=O)\N=N\C(=O)OCC1=CC=C(Cl)C=C1 UIFGGABIJBWRMG-FMQUCBEESA-N 0.000 description 1
- 230000006978 adaptation Effects 0.000 description 1
- 230000006399 behavior Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000009795 derivation Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 125000000524 functional group Chemical group 0.000 description 1
- 230000002045 lasting effect Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 239000011505 plaster Substances 0.000 description 1
- 230000002028 premature Effects 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 208000024891 symptom Diseases 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
- 238000013024 troubleshooting Methods 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/30—Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/12—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will
- G01R15/125—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will for digital multimeters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/18—Printed circuits structurally associated with non-printed electric components
- H05K1/189—Printed circuits structurally associated with non-printed electric components characterised by the use of a flexible or folded printed circuit
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Current Or Voltage (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19853505531 DE3505531A1 (de) | 1985-02-18 | 1985-02-18 | Elektronisches mehrzweckanzeigegeraet |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19853505531 DE3505531A1 (de) | 1985-02-18 | 1985-02-18 | Elektronisches mehrzweckanzeigegeraet |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE3505531A1 DE3505531A1 (de) | 1986-08-21 |
| DE3505531C2 true DE3505531C2 (enrdf_load_stackoverflow) | 1987-07-30 |
Family
ID=6262822
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19853505531 Granted DE3505531A1 (de) | 1985-02-18 | 1985-02-18 | Elektronisches mehrzweckanzeigegeraet |
Country Status (1)
| Country | Link |
|---|---|
| DE (1) | DE3505531A1 (enrdf_load_stackoverflow) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4134695A1 (de) * | 1991-10-21 | 1993-04-22 | Beha C Gmbh | Pruefgeraet zur anzeige elektrischer spannung |
| DE20206382U1 (de) | 2002-04-23 | 2002-07-25 | Theo Benning Elektrotechnik und Elektronik GmbH & Co KG, 46397 Bocholt | Einrichtung zur Messung elektrischer Größen |
| DE10248891A1 (de) * | 2002-10-18 | 2004-04-29 | MDS Medical Device Solutions AG | Sonde |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5218290A (en) * | 1991-01-31 | 1993-06-08 | John Fluke Mfg. Co., Inc. | Multi-function, multi-mode switch for an instrument |
| DE4131423A1 (de) * | 1991-09-20 | 1993-03-25 | Sf Vollverbundstein | Bausatz aus beton-formsteinen sowie eine hieraus erstellte schwergewichts-stuetzmauer |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE8015390U1 (de) * | 1980-10-09 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Prüfeinrichtung für Adern einer Kabelstrecke | |
| DE8111965U1 (de) * | 1981-11-26 | Huser, Bernhard, 8000 München | Handprüfgerät für die Gleichstromkreise von Kraftfahrzeugen | |
| US3893028A (en) * | 1973-10-16 | 1975-07-01 | Hewlett Packard Co | Probe multimeter with display inverting means |
| DE2548151A1 (de) * | 1975-10-28 | 1977-05-05 | Sender Freies Berlin Anstalt D | Logiktaster fuer ttl- und lsl- schaltungen |
| DE7919462U1 (de) * | 1978-07-07 | 1979-11-15 | Pama Electronics, Doar-Na-Hanegev (Israel) | Handsonde ohne Zuleitungen |
| DE2837584C3 (de) * | 1978-08-29 | 1982-02-04 | Lauerer, Friedrich, Dipl.-Ing., 8000 München | Elektrisches Prüfgerät |
| DE2855165A1 (de) * | 1978-12-20 | 1980-07-10 | Lauerer Friedrich | Elektrisches messgeraet |
| DE2914761C2 (de) * | 1979-04-11 | 1980-11-06 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Gerät zum Messen von Gleich- oder Wechselspannungen sowie der Werte von elektrischen Widerständen |
| DE2950583A1 (de) * | 1979-12-15 | 1981-06-19 | Wolfgang Dr.-Ing. 6101 Groß-Bieberau Hilberg | Kombinierter spannungs- und frequenzmesser |
| DE3004734C2 (de) * | 1980-02-08 | 1981-10-01 | Siemens AG, 1000 Berlin und 8000 München | Prüfeinrichtung in Form eines Schraubendrehers zum Anzeigen einer elektrischen Spannung bzw. zur Phasenprüfung am Wechselspannungsnetz |
| DE3122841A1 (de) * | 1981-03-10 | 1983-01-05 | Arens, Wolfgang, 5948 Schmallenberg | Elektrisches pruefgeraet |
| DE3125552C1 (de) * | 1981-06-29 | 1982-11-11 | Siemens AG, 1000 Berlin und 8000 München | Prüfeinrichtung zum Anzeigen einer elektrischen Spannung, deren Polarität und zur Durchgangsprüfung |
-
1985
- 1985-02-18 DE DE19853505531 patent/DE3505531A1/de active Granted
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4134695A1 (de) * | 1991-10-21 | 1993-04-22 | Beha C Gmbh | Pruefgeraet zur anzeige elektrischer spannung |
| DE20206382U1 (de) | 2002-04-23 | 2002-07-25 | Theo Benning Elektrotechnik und Elektronik GmbH & Co KG, 46397 Bocholt | Einrichtung zur Messung elektrischer Größen |
| DE10248891A1 (de) * | 2002-10-18 | 2004-04-29 | MDS Medical Device Solutions AG | Sonde |
Also Published As
| Publication number | Publication date |
|---|---|
| DE3505531A1 (de) | 1986-08-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE19614354C2 (de) | Steuerschaltung für eine MOS-Gate-gesteuerte Leistungshalbleiterschaltung | |
| DE69811950T2 (de) | Elektronische überwachungsschaltung für elektrische spannung | |
| DE2161519C3 (de) | Prüfeinrichtung zur Anzeige von Spannungspegeln | |
| EP0131146B1 (de) | Elektronisches, vorzugsweise berührungslos arbeitendes Schaltgerät | |
| DE3505531C2 (enrdf_load_stackoverflow) | ||
| WO2016026579A1 (de) | Versorgungsspannungsdetektionseinrichtung und verfahren zur detektion einer versorgungsspannung | |
| EP0219711A1 (de) | Infrarotdetektor | |
| EP0172454B1 (de) | Überwachungseinrichtung für Verkehrssignalanlagen | |
| DE4109943A1 (de) | Schaltungsanordnung zur spannungsanzeige | |
| DE3532229C2 (enrdf_load_stackoverflow) | ||
| DE3412734C2 (de) | Schaltungsanordnung zur Auswertung des normalerweise zwischen einem Minimalwert und einem Maximalwert liegenden Impedanzwertes einer eingangsseitig angeschlossenen Indikatorimpedanz | |
| DE102008018642B4 (de) | Überwachungsschaltung und Verfahren zum Prüfen der Schaltung | |
| DE2408254B2 (de) | Überlastschutzeinrichtung für eine elektrische Last | |
| EP0395153B1 (de) | Schaltungsanordnung zum Überwachen von zwei Betriebsspannungen | |
| DE2932270B1 (de) | Schaltungsanordnung zur signaltechnisch sicheren Relaisansteuerung | |
| DE2633786A1 (de) | Schaltung zur ueberpruefung von schutzleiter-steckdosen | |
| DE102012004944B4 (de) | Verfahren zum Überprüfen der Funktion von elektrischen Anschlüssen eines analogen oder digitalen Schaltkreises | |
| EP0626585A1 (de) | Programmierbares und vollelektronisches Transistormessgerät | |
| DE3032389C2 (enrdf_load_stackoverflow) | ||
| DE29721675U1 (de) | Vorrichtung für die Überprüfung der Funktion einer ein elektromagnetisches Schaltelement aufweisenden elektrischen Schaltung | |
| DE1954910C3 (de) | Anordnung zur Anzeige eines Defekts von Entkopplungsdioden in einer Matrix | |
| DE2918960C2 (de) | Schaltungsanordnung zum Prüfen der Betriebsspannung eines batteriebetriebenen Meßgerätes | |
| DE19536477C2 (de) | Schaltungsanordnung zur Sicherung elektronischer Bauteile | |
| EP0013706A1 (de) | Einrichtung zur automatischen Überwachung des Ladezustandes der netzunabhängigen Stromversorgung und der Luftfeuchte im Antwortgerät einer Anlage zur Standortbestimmung von Verkehrseinrichtungen | |
| DE2046945C (de) | Elektronische Schalteinrichtung |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OM8 | Search report available as to paragraph 43 lit. 1 sentence 1 patent law | ||
| OP8 | Request for examination as to paragraph 44 patent law | ||
| D2 | Grant after examination | ||
| 8364 | No opposition during term of opposition | ||
| 8320 | Willingness to grant licences declared (paragraph 23) | ||
| 8339 | Ceased/non-payment of the annual fee |