DE3486320D1 - Schaltung und Methode zur Selbstprüfung eines Speichers in einem Gatterfeld mit bidirektionaler Symmetrie. - Google Patents

Schaltung und Methode zur Selbstprüfung eines Speichers in einem Gatterfeld mit bidirektionaler Symmetrie.

Info

Publication number
DE3486320D1
DE3486320D1 DE3486320T DE3486320T DE3486320D1 DE 3486320 D1 DE3486320 D1 DE 3486320D1 DE 3486320 T DE3486320 T DE 3486320T DE 3486320 T DE3486320 T DE 3486320T DE 3486320 D1 DE3486320 D1 DE 3486320D1
Authority
DE
Germany
Prior art keywords
checking
self
memory
circuit
gate field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE3486320T
Other languages
English (en)
Other versions
DE3486320T2 (de
Inventor
Joseph L Angleton
Jeffery L Gutgsell
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Raytheon Co
Original Assignee
Hughes Aircraft Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hughes Aircraft Co filed Critical Hughes Aircraft Co
Publication of DE3486320D1 publication Critical patent/DE3486320D1/de
Application granted granted Critical
Publication of DE3486320T2 publication Critical patent/DE3486320T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/10—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F12/00—Accessing, addressing or allocating within memory systems or architectures
    • G06F12/02—Addressing or allocation; Relocation
    • G06F12/04—Addressing variable-length words or parts of words
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/10—Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns 
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/36—Data generation devices, e.g. data inverters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1006—Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/12—Group selection circuits, e.g. for memory block selection, chip selection, array selection
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/10—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
    • H01L27/118—Masterslice integrated circuits
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/267—Reconfiguring circuits for testing, e.g. LSSD, partitioning

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Engineering & Computer Science (AREA)
  • Dram (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Static Random-Access Memory (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Semiconductor Memories (AREA)
  • Read Only Memory (AREA)
  • Memory System (AREA)
DE3486320T 1984-07-18 1984-11-14 Schaltung und Methode zur Selbstprüfung eines Speichers in einem Gatterfeld mit bidirektionaler Symmetrie. Expired - Fee Related DE3486320T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/632,099 US4724531A (en) 1984-07-18 1984-07-18 Gate array with bidirectional symmetry

Publications (2)

Publication Number Publication Date
DE3486320D1 true DE3486320D1 (de) 1994-07-21
DE3486320T2 DE3486320T2 (de) 1994-10-06

Family

ID=24534074

Family Applications (3)

Application Number Title Priority Date Filing Date
DE3486320T Expired - Fee Related DE3486320T2 (de) 1984-07-18 1984-11-14 Schaltung und Methode zur Selbstprüfung eines Speichers in einem Gatterfeld mit bidirektionaler Symmetrie.
DE8484904302T Expired - Fee Related DE3483971D1 (de) 1984-07-18 1984-11-14 Gate-array, das eine zweirichtungssymmetrie besitzt.
DE3486312T Expired - Fee Related DE3486312T2 (de) 1984-07-18 1984-11-14 Speicher mit programmierbarer Wortlänge in einem Gatterfeld mit bidirektionaler Symmetrie.

Family Applications After (2)

Application Number Title Priority Date Filing Date
DE8484904302T Expired - Fee Related DE3483971D1 (de) 1984-07-18 1984-11-14 Gate-array, das eine zweirichtungssymmetrie besitzt.
DE3486312T Expired - Fee Related DE3486312T2 (de) 1984-07-18 1984-11-14 Speicher mit programmierbarer Wortlänge in einem Gatterfeld mit bidirektionaler Symmetrie.

Country Status (14)

Country Link
US (1) US4724531A (de)
EP (1) EP0188431B2 (de)
JP (2) JPS61502789A (de)
KR (1) KR900000182B1 (de)
AU (2) AU560082B2 (de)
CA (1) CA1242276A (de)
DE (3) DE3486320T2 (de)
DK (1) DK324885A (de)
ES (1) ES8704039A1 (de)
IL (1) IL75514A (de)
IN (1) IN166001B (de)
IT (1) IT1182069B (de)
NO (1) NO168558C (de)
WO (1) WO1986001036A1 (de)

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JPS61169941A (ja) * 1985-01-22 1986-07-31 Sony Corp 記憶装置
JPS61227289A (ja) * 1985-03-30 1986-10-09 Fujitsu Ltd 半導体記憶装置
EP0263312A3 (de) * 1986-09-08 1989-04-26 Kabushiki Kaisha Toshiba Halbleiterspeichergerät mit Selbstprüfungsfunktion
US4922441A (en) * 1987-01-19 1990-05-01 Ricoh Company, Ltd. Gate array device having a memory cell/interconnection region
DE3718182A1 (de) * 1987-05-29 1988-12-15 Siemens Ag Verfahren und anordnung zur ausfuehrung eines selbsttestes eines wortweise organisierten rams
US4849904A (en) * 1987-06-19 1989-07-18 International Business Machines Corporation Macro structural arrangement and method for generating macros for VLSI semiconductor circuit devices
JP2659095B2 (ja) * 1987-06-30 1997-09-30 富士通株式会社 ゲートアレイ及びメモリを有する半導体集積回路装置
US5062080A (en) * 1987-08-03 1991-10-29 Motorola, Inc. Method and apparatus for enabling a memory
US5230067A (en) * 1988-05-11 1993-07-20 Digital Equipment Corporation Bus control circuit for latching and maintaining data independently of timing event on the bus until new data is driven onto
NL194182C (nl) * 1988-07-23 2001-08-03 Samsung Electronics Co Ltd Randloze moederschijf-halfgeleiderinrichting.
US5027319A (en) * 1988-09-02 1991-06-25 Motorola, Inc. Gate array macro cell
US5146428A (en) * 1989-02-07 1992-09-08 Hitachi, Ltd. Single chip gate array
US5255203A (en) * 1989-08-15 1993-10-19 Advanced Micro Devices, Inc. Interconnect structure for programmable logic device
US5212652A (en) * 1989-08-15 1993-05-18 Advanced Micro Devices, Inc. Programmable gate array with improved interconnect structure
US5644496A (en) * 1989-08-15 1997-07-01 Advanced Micro Devices, Inc. Programmable logic device with internal time-constant multiplexing of signals from external interconnect buses
US5251228A (en) * 1989-12-05 1993-10-05 Vlsi Technology, Inc. Reliability qualification vehicle for application specific integrated circuits
US5210860A (en) * 1990-07-20 1993-05-11 Compaq Computer Corporation Intelligent disk array controller
US5270964A (en) * 1992-05-19 1993-12-14 Sun Microsystems, Inc. Single in-line memory module
DE4227281C1 (de) * 1992-08-18 1994-02-10 Siemens Ag Anordnung zum Testen eines Speichers nach dem Selbsttestprinzip
US5617534A (en) * 1994-02-16 1997-04-01 Intel Corporation Interface protocol for testing of a cache memory
US5502621A (en) * 1994-03-31 1996-03-26 Hewlett-Packard Company Mirrored pin assignment for two sided multi-chip layout
JPH09107048A (ja) 1995-03-30 1997-04-22 Mitsubishi Electric Corp 半導体パッケージ
US5689466A (en) * 1995-04-07 1997-11-18 National Semiconductor Corporation Built in self test (BIST) for multiple RAMs
US6041426A (en) * 1995-04-07 2000-03-21 National Semiconductor Corporation Built in self test BIST for RAMS using a Johnson counter as a source of data
US5552721A (en) * 1995-06-05 1996-09-03 International Business Machines Corporation Method and system for enhanced drive in programmmable gate arrays
US5767565A (en) * 1996-07-22 1998-06-16 Alliance Semiconductor Corporation Semiconductor devices having cooperative mode option at assembly stage and method thereof
US5805520A (en) * 1997-04-25 1998-09-08 Hewlett-Packard Company Integrated circuit address reconfigurability
JP3797810B2 (ja) 1998-11-30 2006-07-19 松下電器産業株式会社 半導体装置
JP2002083001A (ja) * 2000-09-06 2002-03-22 Hitachi Ltd 論理回路の設計方法及びそれに使用するセルライブラリ
US6470475B2 (en) * 2000-11-23 2002-10-22 Stmicroelectronics Ltd. Synthesizable synchronous static RAM
JP2003099414A (ja) * 2001-09-21 2003-04-04 Mitsubishi Electric Corp 半導体集積回路
KR100368021B1 (ko) * 2001-11-22 2003-01-15 주식회사 메리디안 맥상분석장치
US8176370B2 (en) * 2003-09-12 2012-05-08 Broadcom Corporation Method and system for direct access memory testing of an integrated circuit
US9003168B1 (en) * 2005-02-17 2015-04-07 Hewlett-Packard Development Company, L. P. Control system for resource selection between or among conjoined-cores
US7731558B2 (en) 2007-08-15 2010-06-08 Jon Capriola Illuminated toy building structures
KR101036233B1 (ko) * 2009-09-22 2011-05-20 광운대학교 산학협력단 이차 미분 맥파의 특징점 분포를 이용한 특징점 검출 방법 및 장치
US9972395B2 (en) * 2015-10-05 2018-05-15 Silicon Storage Technology, Inc. Row and column decoders comprising fully depleted silicon-on-insulator transistors for use in flash memory systems
US10719477B1 (en) 2019-06-20 2020-07-21 Semiconductor Components Industries, Llc Methods and system for an integrated circuit

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2123040B1 (de) * 1970-05-29 1974-05-03 Cii
US3686640A (en) * 1970-06-25 1972-08-22 Cogar Corp Variable organization memory system
GB1440512A (en) * 1973-04-30 1976-06-23 Rca Corp Universal array using complementary transistors
US3999214A (en) * 1974-06-26 1976-12-21 Ibm Corporation Wireable planar integrated circuit chip structure
US4099253A (en) * 1976-09-13 1978-07-04 Dynage, Incorporated Random access memory with bit or byte addressing capability
DE2846890A1 (de) * 1978-10-27 1980-05-08 Siemens Ag Verfahren zur ueberpruefung von speichern mit wahlfreiem zugriff
DE2948159C2 (de) * 1979-11-29 1983-10-27 Siemens AG, 1000 Berlin und 8000 München Integrierter Speicherbaustein mit wählbaren Betriebsfunktionen
US4431928A (en) * 1981-06-22 1984-02-14 Hewlett-Packard Company Symmetrical programmable logic array
US4556947A (en) * 1982-08-23 1985-12-03 Motorola, Inc. Bi-directional switching circuit

Also Published As

Publication number Publication date
US4724531A (en) 1988-02-09
CA1242276A (en) 1988-09-20
EP0188431B1 (de) 1991-01-16
EP0188431A1 (de) 1986-07-30
ES545316A0 (es) 1987-03-01
JPS61502789A (ja) 1986-11-27
IL75514A0 (en) 1985-10-31
AU4339585A (en) 1986-01-23
NO852621L (no) 1986-01-20
IT1182069B (it) 1987-09-30
DE3483971D1 (de) 1991-02-21
DE3486312T2 (de) 1994-09-22
IT8548362A0 (it) 1985-07-17
IN166001B (de) 1990-02-24
EP0188431B2 (de) 1994-08-17
AU560082B2 (en) 1987-03-26
DK324885A (da) 1986-01-19
JPH07175719A (ja) 1995-07-14
KR860001487A (ko) 1986-02-26
NO168558B (no) 1991-11-25
ES8704039A1 (es) 1987-03-01
AU582939B2 (en) 1989-04-13
KR900000182B1 (ko) 1990-01-23
DK324885D0 (da) 1985-07-17
WO1986001036A1 (en) 1986-02-13
DE3486312D1 (de) 1994-07-07
DE3486320T2 (de) 1994-10-06
IL75514A (en) 1990-11-05
NO168558C (no) 1992-03-04
AU6769587A (en) 1987-04-30

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee