DE3444768C2 - - Google Patents

Info

Publication number
DE3444768C2
DE3444768C2 DE19843444768 DE3444768A DE3444768C2 DE 3444768 C2 DE3444768 C2 DE 3444768C2 DE 19843444768 DE19843444768 DE 19843444768 DE 3444768 A DE3444768 A DE 3444768A DE 3444768 C2 DE3444768 C2 DE 3444768C2
Authority
DE
Germany
Prior art keywords
measurement
blank
correction
sample
specific wavelengths
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE19843444768
Other languages
German (de)
English (en)
Other versions
DE3444768A1 (de
Inventor
Toshihide Fujiwara
Yawara Nagai
Taiichi Hachioji Tokio/Tokyo Jp Banno
Takashi Kokubunji Tokio/Tokyo Jp Tabara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Publication of DE3444768A1 publication Critical patent/DE3444768A1/de
Application granted granted Critical
Publication of DE3444768C2 publication Critical patent/DE3444768C2/de
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/02Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation
    • G01D3/022Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation having an ideal characteristic, map or correction data stored in a digital memory
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274Calibration, base line adjustment, drift correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/30Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/36Investigating two or more bands of a spectrum by separate detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/12Circuits of general importance; Signal processing
    • G01N2201/127Calibration; base line adjustment; drift compensation
    • G01N2201/12746Calibration values determination
    • G01N2201/12753Calibration values determination and storage

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Technology Law (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
DE19843444768 1983-12-13 1984-12-07 Verfahren zum korrigieren kolorimetrischer messergebnisse Granted DE3444768A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23354583A JPS60125542A (ja) 1983-12-13 1983-12-13 測定デ−タ補正方法

Publications (2)

Publication Number Publication Date
DE3444768A1 DE3444768A1 (de) 1985-06-20
DE3444768C2 true DE3444768C2 (fr) 1991-09-12

Family

ID=16956733

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19843444768 Granted DE3444768A1 (de) 1983-12-13 1984-12-07 Verfahren zum korrigieren kolorimetrischer messergebnisse

Country Status (2)

Country Link
JP (1) JPS60125542A (fr)
DE (1) DE3444768A1 (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0723871B2 (ja) * 1986-01-31 1995-03-15 株式会社島津製作所 多項目生化学分析方法
DE3628178A1 (de) * 1986-08-20 1988-02-25 Kernforschungsz Karlsruhe Verfahren zur linearisierung der kennlinie einer messgroesse und anordnung zur durchfuehrung des verfahrens
DE3633916A1 (de) * 1986-10-04 1988-04-14 Kernforschungsz Karlsruhe Verfahren zur selektiven messung der konzentrationen von ir- bis uv-strahlung absorbierenden gasfoermigen und/oder fluessigen substanzen in gasen und/oder fluessigkeiten und vorrichtung zur durchfuehrung des verfahrens
DE3830181A1 (de) * 1988-09-06 1990-03-15 Leybold Ag Gleitlageranordnung fuer eine rasch rotierende welle
DE3839561C2 (de) * 1988-11-24 1996-10-24 Lange Gmbh Dr Bruno Vorrichtung zum Bestimmen der Komponenten in flüssigen Medien
DE4121089A1 (de) * 1991-06-26 1993-01-07 Boehringer Mannheim Gmbh Analysesystem zur automatischen analyse von koerperfluessigkeiten
JPH05273118A (ja) * 1992-03-24 1993-10-22 Hitachi Ltd 被検試料液の濃度又は成分の分析方法及び分析装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3681577A (en) * 1970-10-30 1972-08-01 Technicon Instr Automatic calibration apparatus
US3703726A (en) * 1970-12-31 1972-11-21 Corning Glass Works Quantitative chemical analysis by x-ray emission spectroscopy
JPS59779B2 (ja) * 1977-01-20 1984-01-09 株式会社京都第一科学 尿等の分析方法
US4406547A (en) * 1979-08-07 1983-09-27 Olympus Optical Company Limited Apparatus for effecting automatic analysis
JPS5630650A (en) * 1979-08-22 1981-03-27 Hitachi Ltd Automatic chemical analyzer
JPS585669A (ja) * 1981-06-30 1983-01-13 Shimadzu Corp ベ−スライン補正方法

Also Published As

Publication number Publication date
DE3444768A1 (de) 1985-06-20
JPS60125542A (ja) 1985-07-04
JPH0514855B2 (fr) 1993-02-26

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8125 Change of the main classification

Ipc: G01N 21/27

D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee