DE3226802A1 - Kombinierte thermische und massenspektrometrische analyse - Google Patents

Kombinierte thermische und massenspektrometrische analyse

Info

Publication number
DE3226802A1
DE3226802A1 DE19823226802 DE3226802A DE3226802A1 DE 3226802 A1 DE3226802 A1 DE 3226802A1 DE 19823226802 DE19823226802 DE 19823226802 DE 3226802 A DE3226802 A DE 3226802A DE 3226802 A1 DE3226802 A1 DE 3226802A1
Authority
DE
Germany
Prior art keywords
sample
mass spectrometer
pressure
measuring head
capillary
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE19823226802
Other languages
German (de)
English (en)
Other versions
DE3226802C2 (enrdf_load_stackoverflow
Inventor
Günter Dipl.-Phys. Dr. 5068 Odenthal Hentze
Eike 5653 Leichlingen Willerding
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hentze Guenter Dipl-Physdr 5068 Odenthal De
Original Assignee
Bayer AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bayer AG filed Critical Bayer AG
Priority to DE19823226802 priority Critical patent/DE3226802A1/de
Publication of DE3226802A1 publication Critical patent/DE3226802A1/de
Application granted granted Critical
Publication of DE3226802C2 publication Critical patent/DE3226802C2/de
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00Investigating or analyzing materials by the use of thermal means
    • G01N25/20Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
    • G01N25/48Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation
    • G01N25/4846Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation for a motionless, e.g. solid sample
    • G01N25/4866Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation for a motionless, e.g. solid sample by using a differential method
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/0486Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for monitoring the sample temperature

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Combustion & Propulsion (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
DE19823226802 1982-07-17 1982-07-17 Kombinierte thermische und massenspektrometrische analyse Granted DE3226802A1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19823226802 DE3226802A1 (de) 1982-07-17 1982-07-17 Kombinierte thermische und massenspektrometrische analyse

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19823226802 DE3226802A1 (de) 1982-07-17 1982-07-17 Kombinierte thermische und massenspektrometrische analyse

Publications (2)

Publication Number Publication Date
DE3226802A1 true DE3226802A1 (de) 1984-01-19
DE3226802C2 DE3226802C2 (enrdf_load_stackoverflow) 1988-08-25

Family

ID=6168674

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19823226802 Granted DE3226802A1 (de) 1982-07-17 1982-07-17 Kombinierte thermische und massenspektrometrische analyse

Country Status (1)

Country Link
DE (1) DE3226802A1 (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3522834A1 (de) * 1985-06-26 1987-01-08 Hoelter Heinz Sensor fuer geruchswahrnehmung
CN102393418A (zh) * 2011-09-23 2012-03-28 聚光科技(杭州)股份有限公司 一种应用于质谱分析的进样装置及方法

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
DE-Buch: D. Jentzsch u. E. Otte: Detektoren in der Gaschromatographie aus der Reihe: Methoden der Analyse in der Chemie, Bd. 14, Akademische Verlagsgesellschaft, Frankfurt am Main, 1970, S. 390-393 *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3522834A1 (de) * 1985-06-26 1987-01-08 Hoelter Heinz Sensor fuer geruchswahrnehmung
CN102393418A (zh) * 2011-09-23 2012-03-28 聚光科技(杭州)股份有限公司 一种应用于质谱分析的进样装置及方法
CN102393418B (zh) * 2011-09-23 2013-07-10 聚光科技(杭州)股份有限公司 一种应用于质谱分析的进样装置及方法

Also Published As

Publication number Publication date
DE3226802C2 (enrdf_load_stackoverflow) 1988-08-25

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
D2 Grant after examination
8327 Change in the person/name/address of the patent owner

Owner name: HENTZE, GUENTER, DIPL.-PHYS.DR., 5068 ODENTHAL, DE

8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee