DE3114884C2 - - Google Patents
Info
- Publication number
- DE3114884C2 DE3114884C2 DE3114884A DE3114884A DE3114884C2 DE 3114884 C2 DE3114884 C2 DE 3114884C2 DE 3114884 A DE3114884 A DE 3114884A DE 3114884 A DE3114884 A DE 3114884A DE 3114884 C2 DE3114884 C2 DE 3114884C2
- Authority
- DE
- Germany
- Prior art keywords
- arm
- measuring
- pivoting
- sliding part
- attached
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/20—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5209880A JPS56148007A (en) | 1980-04-18 | 1980-04-18 | Profile measuring apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3114884A1 DE3114884A1 (de) | 1982-01-28 |
DE3114884C2 true DE3114884C2 ( ) | 1988-12-22 |
Family
ID=12905362
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19813114884 Granted DE3114884A1 (de) | 1980-04-18 | 1981-04-13 | Konturmessinstrument |
Country Status (4)
Country | Link |
---|---|
US (1) | US4389786A ( ) |
JP (1) | JPS56148007A ( ) |
DE (1) | DE3114884A1 ( ) |
GB (1) | GB2075193B ( ) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3634816C2 (de) * | 1986-10-13 | 1994-08-11 | Bbc Pat Mestechnik Gmbh | Meßvorrichtung zur Formmessung von Zylindern |
DE3818400A1 (de) * | 1988-05-31 | 1989-12-07 | Kloeckner Wilhelmsburger Gmbh | Verfahren und vorrichtung zum bestimmen der aussenkontur und/oder der innenkontur von koerpern fuer das brennschneiden |
US5309755A (en) * | 1992-10-02 | 1994-05-10 | Tencor Instruments | Profilometer stylus assembly insensitive to vibration |
GB2281779B (en) * | 1993-09-14 | 1997-04-23 | Rank Taylor Hobson Ltd | Metrological instrument |
JP3256124B2 (ja) * | 1996-02-22 | 2002-02-12 | 株式会社ミツトヨ | 形状測定機 |
IT1299902B1 (it) * | 1998-03-13 | 2000-04-04 | Marposs Spa | Testa, apparecchiatura e metodo per il controllo di dimensioni lineari di pezzi meccanici. |
GB2339287B (en) | 1998-07-09 | 2002-12-24 | Taylor Hobson Ltd | Transducer circuit |
AU2001275607A1 (en) * | 2000-06-27 | 2002-01-08 | Universite Catholique De Louvain | Measurement of cylindrical objects through laser telemetry |
DE10349946B4 (de) * | 2003-10-24 | 2008-04-17 | Werth Messtechnik Gmbh | Anordnung zur Messung von Oberflächeneigenschaften |
ITBO20030694A1 (it) * | 2003-11-20 | 2005-05-21 | Marposs Spa | Tasta per il controllo di dimensioni lineari di pezzi meccanici. |
JP4923441B2 (ja) * | 2005-05-26 | 2012-04-25 | 株式会社ジェイテクト | 形状測定器 |
US7275331B2 (en) * | 2005-11-17 | 2007-10-02 | Gm Global Technology Operations, Inc. | Tool for indicating flushness of sunroof panel |
JP5301412B2 (ja) * | 2009-10-21 | 2013-09-25 | 株式会社ミツトヨ | 測定力制御装置 |
CN109631728B (zh) * | 2019-01-28 | 2024-03-15 | 苏州金世博精密机电有限公司 | 不规则大外圆检具 |
CN112894788A (zh) * | 2019-12-03 | 2021-06-04 | 苏州铭烨晟精密机械有限公司 | 一种用于白光测量系统的关节臂机器人 |
CN114932094B (zh) * | 2022-03-25 | 2023-08-29 | 保定天威保变电气股份有限公司 | 一种适用于变压器角环r角测量的方法 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3571934A (en) * | 1968-06-24 | 1971-03-23 | Lockheed Aircraft Corp | Three-axis inspection probe |
CH562441A5 ( ) * | 1973-01-06 | 1975-05-30 | Tesa Sa | |
CS166972B1 ( ) * | 1973-04-06 | 1976-03-29 | ||
JPS5728082Y2 ( ) * | 1975-03-19 | 1982-06-18 | ||
DE2745159A1 (de) * | 1977-10-07 | 1979-04-19 | Foerster Inst Dr Friedrich | Pruefkopf mit eine oder mehrere pruefsonden aufnehmendem tragkoerper |
IT1090767B (it) * | 1977-12-07 | 1985-06-26 | Finike Italiana Marposs | Misuratore elettronico per il controllo delle dimensioni lineari di pezzi meccanici |
JPS5822084Y2 (ja) * | 1978-02-22 | 1983-05-11 | 株式会社三豊製作所 | 形状測定器 |
-
1980
- 1980-04-18 JP JP5209880A patent/JPS56148007A/ja active Granted
-
1981
- 1981-04-02 US US06/250,484 patent/US4389786A/en not_active Expired - Fee Related
- 1981-04-02 GB GB8110369A patent/GB2075193B/en not_active Expired
- 1981-04-13 DE DE19813114884 patent/DE3114884A1/de active Granted
Also Published As
Publication number | Publication date |
---|---|
GB2075193B (en) | 1983-11-23 |
US4389786A (en) | 1983-06-28 |
JPS56148007A (en) | 1981-11-17 |
GB2075193A (en) | 1981-11-11 |
JPS6229002B2 ( ) | 1987-06-24 |
DE3114884A1 (de) | 1982-01-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
OP8 | Request for examination as to paragraph 44 patent law | ||
D2 | Grant after examination | ||
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |