DE2759116A1 - Massenspektrometer - Google Patents
MassenspektrometerInfo
- Publication number
- DE2759116A1 DE2759116A1 DE19772759116 DE2759116A DE2759116A1 DE 2759116 A1 DE2759116 A1 DE 2759116A1 DE 19772759116 DE19772759116 DE 19772759116 DE 2759116 A DE2759116 A DE 2759116A DE 2759116 A1 DE2759116 A1 DE 2759116A1
- Authority
- DE
- Germany
- Prior art keywords
- magnetic field
- ion
- field sector
- deflector
- plane
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 238000004949 mass spectrometry Methods 0.000 title description 2
- 238000010884 ion-beam technique Methods 0.000 claims 2
- 150000002500 ions Chemical class 0.000 description 27
- 238000001228 spectrum Methods 0.000 description 4
- 238000004458 analytical method Methods 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 239000001307 helium Substances 0.000 description 2
- 229910052734 helium Inorganic materials 0.000 description 2
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 238000005070 sampling Methods 0.000 description 2
- 230000001133 acceleration Effects 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/284—Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR7639720A FR2376511A1 (fr) | 1976-12-31 | 1976-12-31 | Spectrometre de masse a balayage ultra-rapide |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE2759116A1 true DE2759116A1 (de) | 1978-07-13 |
Family
ID=9181806
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19772759116 Ceased DE2759116A1 (de) | 1976-12-31 | 1977-12-30 | Massenspektrometer |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US4171482A (enExample) |
| JP (1) | JPS5415792A (enExample) |
| DE (1) | DE2759116A1 (enExample) |
| FR (1) | FR2376511A1 (enExample) |
| GB (1) | GB1598831A (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4435642A (en) | 1982-03-24 | 1984-03-06 | The United States Of America As Represented By The United States National Aeronautics And Space Administration | Ion mass spectrometer |
| US4843239A (en) * | 1987-05-18 | 1989-06-27 | Max-Planck-Gesellschaft Zur Foerderung Der Wisserschaften E.V. | Compact double focussing mass spectrometer |
| JPH01213950A (ja) * | 1988-02-23 | 1989-08-28 | Jeol Ltd | 質量分析装置及びそれを用いたms/ms装置 |
| JPH083987B2 (ja) * | 1989-01-09 | 1996-01-17 | 株式会社日立製作所 | 質量分析装置の後段加速検知器 |
| GB9019560D0 (en) * | 1990-09-07 | 1990-10-24 | Vg Instr Group | Method and apparatus for mass spectrometry |
| FR2806527B1 (fr) * | 2000-03-20 | 2002-10-25 | Schlumberger Technologies Inc | Colonne a focalisation simultanee d'un faisceau de particules et d'un faisceau optique |
| GB2402260B (en) * | 2003-05-30 | 2006-05-24 | Thermo Finnigan Llc | All mass MS/MS method and apparatus |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1004945A (en) * | 1962-02-28 | 1965-09-22 | Heinz Ewald | Improvements in or relating to mass spectroscopes |
| GB1134448A (en) * | 1965-09-30 | 1968-11-20 | Hitachi Ltd | Double focussing mass spectrometer |
-
1976
- 1976-12-31 FR FR7639720A patent/FR2376511A1/fr active Granted
-
1977
- 1977-12-27 US US05/864,702 patent/US4171482A/en not_active Expired - Lifetime
- 1977-12-28 GB GB54052/77A patent/GB1598831A/en not_active Expired
- 1977-12-28 JP JP15854077A patent/JPS5415792A/ja active Pending
- 1977-12-30 DE DE19772759116 patent/DE2759116A1/de not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5415792A (en) | 1979-02-05 |
| FR2376511B1 (enExample) | 1980-09-19 |
| FR2376511A1 (fr) | 1978-07-28 |
| US4171482A (en) | 1979-10-16 |
| GB1598831A (en) | 1981-09-23 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP0218920B1 (de) | Elektronenenergiefilter vom Omega-Typ | |
| EP1277221B1 (de) | Strahlerzeugungssystem für elektronen oder ionenstrahlen hoher monochromasie oder hoher stromdichte | |
| DE69311124T2 (de) | Verfahren zur reduzierung von interferenzen in plasmaquellen-massenspektrometern | |
| DE69118492T2 (de) | Massenspektrometer mit elektrostatischem Energiefilter | |
| CH615532A5 (enExample) | ||
| DE2246380A1 (de) | Verfahren und vorrichtung zum sortieren von teilchen | |
| DE1798021B2 (de) | Einrichtung zur buendelung eines primaer-ionenstrahls eines mikroanalysators | |
| EP0218921B1 (de) | Elektronenenergiefilter vom Alpha-Typ | |
| DE69903439T2 (de) | Ablenkeinheit zur Separation zweier Teilchenstrahlen | |
| DE2934408A1 (de) | Ionenquelle mit kaltkathode und damit ausgeruestetes massenspektrometer | |
| DE2628422C3 (de) | Verfahren zur Massenspektroskopie | |
| DE2255302B2 (de) | Einrichtung für die Sekundär-Ionen-Massenspektroskopie | |
| DE2011193C3 (de) | Vorrichtung für die Elektronen-Rastermikroskopie und die Elektronenstrahl-Mikroanalyse | |
| EP0001228A1 (de) | Verbesserung an einer Vorrichtung zur Elektronenstrahleintastung | |
| DE1498646B2 (de) | Ionen mikroanalysevorrichtung | |
| DE19635645A1 (de) | Hochauflösende Ionendetektion für lineare Flugzeitmassenspektrometer | |
| DE69121463T2 (de) | Ionenbündelvorrichtung | |
| DE2759116A1 (de) | Massenspektrometer | |
| DE2458025A1 (de) | Vorrichtung fuer massenanalyse und strukturanalyse einer oberflaechenschicht durch ionenstreuung | |
| DE2705430B2 (de) | Elektrostatischer Analysator für geladene Teilchen | |
| DE3872848T2 (de) | Verfahren zur analyse der flugzeit mit stetiger abtastung und analysierungsvorrichtung zur durchfuehrung des verfahrens. | |
| DE3430984A1 (de) | Verfahren und vorrichtung zur registrierung von teilchen oder quanten mit hilfe eines detektors | |
| DE3783476T2 (de) | Massenspektrometer mit getrennter ionenquelle. | |
| DE69712739T2 (de) | Massenselektor | |
| DE2031811A1 (de) | Stigmatisch abbildendes Massenspektrometer mit Richtungs- und Energiefokussierung |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OAP | Request for examination filed | ||
| OD | Request for examination | ||
| 8131 | Rejection |