GB1598831A - Mass spectrometer for ultra-rapid scanning - Google Patents
Mass spectrometer for ultra-rapid scanning Download PDFInfo
- Publication number
- GB1598831A GB1598831A GB54052/77A GB5405277A GB1598831A GB 1598831 A GB1598831 A GB 1598831A GB 54052/77 A GB54052/77 A GB 54052/77A GB 5405277 A GB5405277 A GB 5405277A GB 1598831 A GB1598831 A GB 1598831A
- Authority
- GB
- United Kingdom
- Prior art keywords
- mass spectrometer
- focal plane
- electrodes
- ion species
- magnetic sector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 150000002500 ions Chemical class 0.000 description 22
- 238000001228 spectrum Methods 0.000 description 4
- 238000004458 analytical method Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 239000001307 helium Substances 0.000 description 2
- 229910052734 helium Inorganic materials 0.000 description 2
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 230000001133 acceleration Effects 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 238000004949 mass spectrometry Methods 0.000 description 1
- 238000001819 mass spectrum Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/284—Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR7639720A FR2376511A1 (fr) | 1976-12-31 | 1976-12-31 | Spectrometre de masse a balayage ultra-rapide |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB1598831A true GB1598831A (en) | 1981-09-23 |
Family
ID=9181806
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB54052/77A Expired GB1598831A (en) | 1976-12-31 | 1977-12-28 | Mass spectrometer for ultra-rapid scanning |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US4171482A (enExample) |
| JP (1) | JPS5415792A (enExample) |
| DE (1) | DE2759116A1 (enExample) |
| FR (1) | FR2376511A1 (enExample) |
| GB (1) | GB1598831A (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4435642A (en) | 1982-03-24 | 1984-03-06 | The United States Of America As Represented By The United States National Aeronautics And Space Administration | Ion mass spectrometer |
| US4843239A (en) * | 1987-05-18 | 1989-06-27 | Max-Planck-Gesellschaft Zur Foerderung Der Wisserschaften E.V. | Compact double focussing mass spectrometer |
| JPH01213950A (ja) * | 1988-02-23 | 1989-08-28 | Jeol Ltd | 質量分析装置及びそれを用いたｍｓ／ｍｓ装置 |
| JPH083987B2 (ja) * | 1989-01-09 | 1996-01-17 | 株式会社日立製作所 | 質量分析装置の後段加速検知器 |
| GB9019560D0 (en) * | 1990-09-07 | 1990-10-24 | Vg Instr Group | Method and apparatus for mass spectrometry |
| FR2806527B1 (fr) * | 2000-03-20 | 2002-10-25 | Schlumberger Technologies Inc | Colonne a focalisation simultanee d'un faisceau de particules et d'un faisceau optique |
| GB2402260B (en) * | 2003-05-30 | 2006-05-24 | Thermo Finnigan Llc | All mass MS/MS method and apparatus |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1004945A (en) * | 1962-02-28 | 1965-09-22 | Heinz Ewald | Improvements in or relating to mass spectroscopes |
| GB1134448A (en) * | 1965-09-30 | 1968-11-20 | Hitachi Ltd | Double focussing mass spectrometer |
-
1976
- 1976-12-31 FR FR7639720A patent/FR2376511A1/fr active Granted
-
1977
- 1977-12-27 US US05/864,702 patent/US4171482A/en not_active Expired - Lifetime
- 1977-12-28 GB GB54052/77A patent/GB1598831A/en not_active Expired
- 1977-12-28 JP JP15854077A patent/JPS5415792A/ja active Pending
- 1977-12-30 DE DE19772759116 patent/DE2759116A1/de not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5415792A (en) | 1979-02-05 |
| FR2376511B1 (enExample) | 1980-09-19 |
| FR2376511A1 (fr) | 1978-07-28 |
| US4171482A (en) | 1979-10-16 |
| DE2759116A1 (de) | 1978-07-13 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP7029494B2 (ja) | 分光およびイメージングシステム、並びに、試料の特性評価の方法 | |
| EP0952607B1 (en) | Simultaneous detection isotopic ratio mass spectrometer | |
| Giffin et al. | An electro—optical detector for focal plane mass spectrometers | |
| EP0488067B1 (en) | Ion-scattering spectrometer | |
| Liebl | Design of a combined ion and electron microprobe apparatus | |
| JPS5836464B2 (ja) | シツリヨウブンセキソウチ | |
| GB1598831A (en) | Mass spectrometer for ultra-rapid scanning | |
| GB2216331A (en) | Instrument for mass spectrometry/mass spectrometry | |
| Denbigh et al. | Scanning electron diffraction with energy analysis | |
| US3761707A (en) | Stigmatically imaging double focusing mass spectrometer | |
| Enge et al. | Performance of an energy-mass spectrograph for heavy ions | |
| US4942298A (en) | Electron spectrometer | |
| Chowdhury et al. | Ion energy analyser for laser-produced plasma | |
| Komma | A wide band electron spectrum analyzer | |
| Basto et al. | A high resolution, low energy electrostatic analyser for rocket payloads | |
| US5506413A (en) | Spatial-focus energy analyzer | |
| SU141559A1 (ru) | Способ изотопного и химического масс-спектрального анализа | |
| US4427885A (en) | Double focussing mass spectrometer | |
| JPS6360496B2 (enExample) | ||
| Aratari | An ion beam chopping method for low energy time-of-flight measurements | |
| JPS6245424Y2 (enExample) | ||
| Oron | A static field mass spectrograph for laser induced plasma experiments | |
| Koleva et al. | The low energy plasma composition experiment | |
| JPS6245423Y2 (enExample) | ||
| Matsuda | A new mass spectrograph for the analysis of dissociation fragments |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| CSNS | Application of which complete specification have been accepted and published, but patent is not sealed |