DE2558107A1 - Vorfilter-ionisator-vorrichtung zur verwendung mit quadrupol-sekundaerionenmassenspektrometern - Google Patents

Vorfilter-ionisator-vorrichtung zur verwendung mit quadrupol-sekundaerionenmassenspektrometern

Info

Publication number
DE2558107A1
DE2558107A1 DE19752558107 DE2558107A DE2558107A1 DE 2558107 A1 DE2558107 A1 DE 2558107A1 DE 19752558107 DE19752558107 DE 19752558107 DE 2558107 A DE2558107 A DE 2558107A DE 2558107 A1 DE2558107 A1 DE 2558107A1
Authority
DE
Germany
Prior art keywords
cylinder
ions
axis
electron source
analyzer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE19752558107
Other languages
German (de)
English (en)
Inventor
James T Mckinney
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kratos Ltd
Original Assignee
Minnesota Mining and Manufacturing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Minnesota Mining and Manufacturing Co filed Critical Minnesota Mining and Manufacturing Co
Publication of DE2558107A1 publication Critical patent/DE2558107A1/de
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE19752558107 1974-12-23 1975-12-22 Vorfilter-ionisator-vorrichtung zur verwendung mit quadrupol-sekundaerionenmassenspektrometern Ceased DE2558107A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/535,805 US3939344A (en) 1974-12-23 1974-12-23 Prefilter-ionizer apparatus for use with quadrupole type secondary-ion mass spectrometers

Publications (1)

Publication Number Publication Date
DE2558107A1 true DE2558107A1 (de) 1976-06-24

Family

ID=24135839

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19752558107 Ceased DE2558107A1 (de) 1974-12-23 1975-12-22 Vorfilter-ionisator-vorrichtung zur verwendung mit quadrupol-sekundaerionenmassenspektrometern

Country Status (6)

Country Link
US (1) US3939344A (fr)
JP (1) JPS5829578B2 (fr)
CH (1) CH610440A5 (fr)
DE (1) DE2558107A1 (fr)
FR (1) FR2296262A1 (fr)
GB (1) GB1537250A (fr)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4075479A (en) * 1976-03-04 1978-02-21 Finnigan Corporation Focusing ion lens system for mass spectrometer for separating charged and neutral particles
US4107526A (en) * 1976-03-22 1978-08-15 Minnesota Mining And Manufacturing Company Ion scattering spectrometer with modified bias
US4481415A (en) * 1982-10-27 1984-11-06 Shimadzu Corporation Quadrupole mass spectrometer
CA1245778A (fr) * 1985-10-24 1988-11-29 John B. French Systeme d'analyse de masse a derive reduite
US4719349A (en) * 1986-05-27 1988-01-12 The United States Of America As Represented By The Department Of Health And Human Services Electrochemical sample probe for use in fast-atom bombardment mass spectrometry
US4814613A (en) * 1987-03-06 1989-03-21 Extrel Corporation Collision cell for triple quadrupole tandem mass spectrometry
US4800273A (en) * 1988-01-07 1989-01-24 Phillips Bradway F Secondary ion mass spectrometer
JPH02304854A (ja) * 1989-05-19 1990-12-18 Jeol Ltd 同時検出型質量分析装置
EP0476062B1 (fr) * 1989-06-06 1996-08-28 Viking Instruments Corp. Systeme de spectrometrie de masse miniaturise
US5313061A (en) * 1989-06-06 1994-05-17 Viking Instrument Miniaturized mass spectrometer system
US4968888A (en) * 1989-07-05 1990-11-06 The United States Of America As Represented By The United States Department Of Energy Pulsed field sample neutralization
DE19511333C1 (de) * 1995-03-28 1996-08-08 Bruker Franzen Analytik Gmbh Verfahren und Vorrichtung für orthogonalen Einschuß von Ionen in ein Flugzeit-Massenspektrometer
US5596193A (en) * 1995-10-11 1997-01-21 California Institute Of Technology Miniature quadrupole mass spectrometer array
US8796620B2 (en) 2011-06-08 2014-08-05 Mks Instruments, Inc. Mass spectrometry for gas analysis with a one-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens
US8450681B2 (en) 2011-06-08 2013-05-28 Mks Instruments, Inc. Mass spectrometry for gas analysis in which both a charged particle source and a charged particle analyzer are offset from an axis of a deflector lens, resulting in reduced baseline signal offsets
US8796638B2 (en) 2011-06-08 2014-08-05 Mks Instruments, Inc. Mass spectrometry for a gas analysis with a two-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3473018A (en) * 1967-03-02 1969-10-14 Bell & Howell Co Mass analyzer using two spaced,tubular,and coaxial electrodes
DE2255302C3 (de) * 1972-11-11 1980-09-11 Leybold-Heraeus Gmbh, 5000 Koeln Einrichtung für die Sekundär-Ionen-Massenspektroskopie

Also Published As

Publication number Publication date
GB1537250A (en) 1978-12-29
FR2296262B1 (fr) 1981-09-18
FR2296262A1 (fr) 1976-07-23
JPS5829578B2 (ja) 1983-06-23
US3939344A (en) 1976-02-17
CH610440A5 (fr) 1979-04-12
JPS5189492A (fr) 1976-08-05

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
8127 New person/name/address of the applicant

Owner name: KRATOS LTD., URMSTON, MANCHESTER, GB

8128 New person/name/address of the agent

Representative=s name: RUSCHKE, O., DIPL.-ING., 1000 BERLIN RUSCHKE, H.,

8131 Rejection