DE2508781A1 - Vorrichtung zur ermittlung der teilchengroesse in einem partikelsystem - Google Patents

Vorrichtung zur ermittlung der teilchengroesse in einem partikelsystem

Info

Publication number
DE2508781A1
DE2508781A1 DE19752508781 DE2508781A DE2508781A1 DE 2508781 A1 DE2508781 A1 DE 2508781A1 DE 19752508781 DE19752508781 DE 19752508781 DE 2508781 A DE2508781 A DE 2508781A DE 2508781 A1 DE2508781 A1 DE 2508781A1
Authority
DE
Germany
Prior art keywords
circuit
signal
counting
period
particle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE19752508781
Other languages
German (de)
English (en)
Inventor
Edward Neal Doty
David Richard Figueroa
Anthony Marino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Coulter Electronics Inc
Original Assignee
Coulter Electronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Coulter Electronics Inc filed Critical Coulter Electronics Inc
Publication of DE2508781A1 publication Critical patent/DE2508781A1/de
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/35—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of bipolar semiconductor devices with more than two PN junctions, or more than three electrodes, or more than one electrode connected to the same conductivity region
    • H03K3/351—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of bipolar semiconductor devices with more than two PN junctions, or more than three electrodes, or more than one electrode connected to the same conductivity region the devices being unijunction transistors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/1031—Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12—Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G01N15/131—Details
    • G01N15/132—Circuits
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06G—ANALOGUE COMPUTERS
    • G06G7/00—Devices in which the computing operation is performed by varying electric or magnetic quantities
    • G06G7/12—Arrangements for performing computing operations, e.g. operational amplifiers
    • G06G7/18—Arrangements for performing computing operations, e.g. operational amplifiers for integration or differentiation; for forming integrals
    • G06G7/184—Arrangements for performing computing operations, e.g. operational amplifiers for integration or differentiation; for forming integrals using capacitive elements
    • G06G7/186—Arrangements for performing computing operations, e.g. operational amplifiers for integration or differentiation; for forming integrals using capacitive elements using an operational amplifier comprising a capacitor or a resistor in the feedback loop
    • G06G7/1865—Arrangements for performing computing operations, e.g. operational amplifiers for integration or differentiation; for forming integrals using capacitive elements using an operational amplifier comprising a capacitor or a resistor in the feedback loop with initial condition setting
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K7/00—Modulating pulses with a continuously-variable modulating signal
    • H03K7/06—Frequency or rate modulation, i.e. PFM or PRM

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Software Systems (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Dispersion Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
DE19752508781 1974-03-01 1975-02-28 Vorrichtung zur ermittlung der teilchengroesse in einem partikelsystem Pending DE2508781A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US447264A US3894221A (en) 1974-03-01 1974-03-01 Speed up circuit in an apparatus for measuring a dividing particle size of a particulate system

Publications (1)

Publication Number Publication Date
DE2508781A1 true DE2508781A1 (de) 1975-09-04

Family

ID=23775645

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19752508781 Pending DE2508781A1 (de) 1974-03-01 1975-02-28 Vorrichtung zur ermittlung der teilchengroesse in einem partikelsystem

Country Status (3)

Country Link
US (1) US3894221A (enExample)
DE (1) DE2508781A1 (enExample)
FR (1) FR2273272B1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3227664A1 (de) * 1982-07-23 1984-02-02 Vladimir Vasil'evič Saratov Pavlov Einrichtung zur messung der menge und groesse fester teilchen in fluessigen und gasmedien

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1177774A (fr) * 1960-04-26 1959-04-29 Evans Electroselenium Ltd Perfectionnements aux appareils de comptage des petites particules
US3392331A (en) * 1961-04-06 1968-07-09 Coulter Electronics Particle analyzer threshold level control
US3271672A (en) * 1961-09-20 1966-09-06 Coulter Electronics Particle studying device control circuit
GB1112770A (en) * 1964-12-10 1968-05-08 Hitachi Ltd Method and apparatus for analysing the particle size distribution of powder
US3444464A (en) * 1965-11-26 1969-05-13 Coulter Electronics Multiple aperture fittings for particle analyzing apparatus
US3331950A (en) * 1966-07-11 1967-07-18 Coulter Electronics Particle distribution plotting apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3227664A1 (de) * 1982-07-23 1984-02-02 Vladimir Vasil'evič Saratov Pavlov Einrichtung zur messung der menge und groesse fester teilchen in fluessigen und gasmedien

Also Published As

Publication number Publication date
US3894221A (en) 1975-07-08
FR2273272A1 (enExample) 1975-12-26
FR2273272B1 (enExample) 1977-04-15

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