DE2505276A1 - Impatt-diode und verfahren zu ihrer herstellung - Google Patents

Impatt-diode und verfahren zu ihrer herstellung

Info

Publication number
DE2505276A1
DE2505276A1 DE19752505276 DE2505276A DE2505276A1 DE 2505276 A1 DE2505276 A1 DE 2505276A1 DE 19752505276 DE19752505276 DE 19752505276 DE 2505276 A DE2505276 A DE 2505276A DE 2505276 A1 DE2505276 A1 DE 2505276A1
Authority
DE
Germany
Prior art keywords
epitaxial layer
doped
boron
ions
silicon
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE19752505276
Other languages
German (de)
English (en)
Inventor
Christopher John Heslop
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Post Office
Original Assignee
Post Office
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Post Office filed Critical Post Office
Publication of DE2505276A1 publication Critical patent/DE2505276A1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/26Bombardment with radiation
    • H01L21/263Bombardment with radiation with high-energy radiation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D99/00Subject matter not provided for in other groups of this subclass

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Bipolar Transistors (AREA)
  • Recrystallisation Techniques (AREA)
DE19752505276 1974-02-08 1975-02-07 Impatt-diode und verfahren zu ihrer herstellung Withdrawn DE2505276A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB586574A GB1447723A (en) 1974-02-08 1974-02-08 Semiconductor devices

Publications (1)

Publication Number Publication Date
DE2505276A1 true DE2505276A1 (de) 1975-08-14

Family

ID=9804073

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19752505276 Withdrawn DE2505276A1 (de) 1974-02-08 1975-02-07 Impatt-diode und verfahren zu ihrer herstellung

Country Status (6)

Country Link
US (1) US3961989A (OSRAM)
JP (1) JPS5714031B2 (OSRAM)
CA (1) CA1016270A (OSRAM)
DE (1) DE2505276A1 (OSRAM)
FR (1) FR2260867B1 (OSRAM)
GB (1) GB1447723A (OSRAM)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4030943A (en) * 1976-05-21 1977-06-21 Hughes Aircraft Company Planar process for making high frequency ion implanted passivated semiconductor devices and microwave integrated circuits
GB2050802B (en) * 1979-06-12 1983-03-02 Imp Group Ltd Feeding tobacco webs
DE3839210A1 (de) * 1988-11-19 1990-05-23 Asea Brown Boveri Verfahren zum axialen einstellen der traegerlebensdauer
US7332750B1 (en) 2000-09-01 2008-02-19 Fairchild Semiconductor Corporation Power semiconductor device with improved unclamped inductive switching capability and process for forming same
DE102006002903A1 (de) * 2006-01-20 2007-08-02 Infineon Technologies Austria Ag Verfahren zur Behandlung eines Sauerstoff enthaltenden Halbleiterwafers und Halbleiterbauelement
ATE522927T1 (de) * 2006-01-20 2011-09-15 Infineon Technologies Austria Verfahren zur herstellung einer n-dotierten zone in einem halbleiterwafer und halbleiterbauelement

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3509428A (en) * 1967-10-18 1970-04-28 Hughes Aircraft Co Ion-implanted impatt diode
US3595716A (en) * 1968-05-16 1971-07-27 Philips Corp Method of manufacturing semiconductor devices
GB1332931A (en) * 1970-01-15 1973-10-10 Mullard Ltd Methods of manufacturing a semiconductor device
US3756862A (en) * 1971-12-21 1973-09-04 Ibm Proton enhanced diffusion methods

Also Published As

Publication number Publication date
FR2260867A1 (OSRAM) 1975-09-05
FR2260867B1 (OSRAM) 1978-10-27
JPS50115985A (OSRAM) 1975-09-10
US3961989A (en) 1976-06-08
GB1447723A (en) 1976-08-25
JPS5714031B2 (OSRAM) 1982-03-20
CA1016270A (en) 1977-08-23

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Legal Events

Date Code Title Description
OF Willingness to grant licences before publication of examined application
8141 Disposal/no request for examination