DE2428810C2 - Interferenzmikroskop - Google Patents

Interferenzmikroskop

Info

Publication number
DE2428810C2
DE2428810C2 DE2428810A DE2428810A DE2428810C2 DE 2428810 C2 DE2428810 C2 DE 2428810C2 DE 2428810 A DE2428810 A DE 2428810A DE 2428810 A DE2428810 A DE 2428810A DE 2428810 C2 DE2428810 C2 DE 2428810C2
Authority
DE
Germany
Prior art keywords
birefringent element
optical axis
plate
microscope
compensation plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE2428810A
Other languages
German (de)
English (en)
Other versions
DE2428810A1 (de
Inventor
Johannes Diets de Harvard Mass. Veer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Warner Lambert Technologies Inc
Original Assignee
Warner Lambert Technologies Inc Dallas Tex
Warner Lambert Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Warner Lambert Technologies Inc Dallas Tex, Warner Lambert Technologies Inc filed Critical Warner Lambert Technologies Inc Dallas Tex
Publication of DE2428810A1 publication Critical patent/DE2428810A1/de
Application granted granted Critical
Publication of DE2428810C2 publication Critical patent/DE2428810C2/de
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/0092Polarisation microscopes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens
    • G02B21/08Condensers
    • G02B21/14Condensers affording illumination for phase-contrast observation

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Polarising Elements (AREA)
DE2428810A 1973-07-02 1974-06-14 Interferenzmikroskop Expired DE2428810C2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US376074A US3904267A (en) 1973-07-02 1973-07-02 Compensating plate to provide uniformity in interference microscopes

Publications (2)

Publication Number Publication Date
DE2428810A1 DE2428810A1 (de) 1975-01-23
DE2428810C2 true DE2428810C2 (de) 1984-12-06

Family

ID=23483601

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2428810A Expired DE2428810C2 (de) 1973-07-02 1974-06-14 Interferenzmikroskop

Country Status (7)

Country Link
US (1) US3904267A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPS613409B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
CH (1) CH572630A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DD (1) DD113271A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE2428810C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
FR (1) FR2241798B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
GB (1) GB1445046A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19626261A1 (de) * 1995-06-30 1997-01-02 Nikon Corp Beobachtungsvorrichtung

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5614491Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1976-10-06 1981-04-06
JPS5770510A (en) * 1980-10-20 1982-05-01 Konishiroku Photo Ind Co Ltd Polarizing optical system
JPS5770511A (en) * 1980-10-20 1982-05-01 Konishiroku Photo Ind Co Ltd Polarizing optical system
US4571030A (en) * 1983-04-04 1986-02-18 Cooper Lasersonics, Inc. Sum-beam separator using critical angle
DD233670A1 (de) * 1984-12-29 1986-03-05 Zeiss Jena Veb Carl Anordnung zur kompensation von gangunterschiedsdifferenzen
US4795246A (en) * 1987-07-30 1989-01-03 Loro Albert Differential interference contrast microscope using non-uniformly deformed plastic birefringent components
JPH02151825A (ja) * 1988-12-05 1990-06-11 Olympus Optical Co Ltd 微分干渉顕微鏡
JP3639807B2 (ja) * 2001-06-27 2005-04-20 キヤノン株式会社 光学素子及び製造方法
DE10247248A1 (de) * 2002-10-10 2004-04-22 Leica Microsystems Wetzlar Gmbh Polarisations-Interferenzmikroskop
EP1882968A4 (en) * 2005-05-18 2010-09-01 Olympus Corp POLARIZATION MICROSCOPE
JP4935254B2 (ja) * 2006-09-04 2012-05-23 株式会社ニコン 微分干渉顕微鏡
DE102010036073A1 (de) 2010-09-01 2012-03-01 Carl Zeiss Microlmaging Gmbh Lichtmikroskop und optisches Modul
CN105612611B (zh) 2013-08-09 2019-03-12 科磊股份有限公司 用于提高检测灵敏度的多点照明
CN107991728B (zh) 2013-08-23 2020-06-16 科磊股份有限公司 宽带及宽视场角补偿器
JP2015049381A (ja) * 2013-09-02 2015-03-16 ソニー株式会社 表示装置、表示方法及び補償部材の製造方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2601175A (en) * 1947-08-05 1952-06-17 Smith Francis Hughes Interference microscope
US2924142A (en) * 1952-05-14 1960-02-09 Centre Nat Rech Scient Interferential polarizing device for study of phase objects
DE1134844B (de) * 1960-11-30 1962-08-16 Zeiss Carl Fa Interferenzeinrichtung fuer Mikroskope

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19626261A1 (de) * 1995-06-30 1997-01-02 Nikon Corp Beobachtungsvorrichtung

Also Published As

Publication number Publication date
FR2241798A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1975-03-21
DE2428810A1 (de) 1975-01-23
GB1445046A (en) 1976-08-04
DD113271A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1975-05-20
JPS5039145A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1975-04-11
US3904267A (en) 1975-09-09
CH572630A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1976-02-13
JPS613409B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1986-02-01
FR2241798B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1977-03-11

Similar Documents

Publication Publication Date Title
DE2428810C2 (de) Interferenzmikroskop
DE69807753T2 (de) Breitbandige optische phasenverzögerungsvorrichtung
DE69028497T2 (de) Polarisierendes Beleuchtungsgerät
DE69332479T2 (de) Verdrillt-nematische Flüssigkristallanzeigevorrichtung
DE69417174T2 (de) Beleuchtungssystem für Farbbildprojektionsvorrichtung und zirkularer Polarisator zur Anwendung in einem solchen System
DE2364951C3 (de) Anzeigevorrichtung mit elektrooptischen Modulationseinrichtungen
DE3702203C2 (de) Verfahren zum Messen von Relativbewegungen
DE2025509B2 (de) Interferenzmikroskop
DE2401973C2 (de) Polarisations-Interferenzmikroskop
DE69211225T3 (de) Projektor
DE69014334T2 (de) Flüssigkristall-Anzeigevorrichtung.
DE69118057T2 (de) Optische Prismenvorrichtung und diese verwendender Polarisator
EP1359453B1 (de) Anordnung und Verfahren zum polarisationsoptischen Interferenzkontrast
DE19751155A1 (de) Bilderzeugungsvorrichtung zum Erzeugen eines Bildsignals aus dem einfallenden Licht
DE7817436U1 (de) Justiervorrichtung
DE69024211T2 (de) Optischer isolator
DE102018001667B4 (de) Anordnungen zur Erzeugung von frequenzkonvertierten Strahlen mit Top-hat-Intensitätsprofil
DE3929713C2 (de) Verfahren zur Messung eines optischen Gangunterschiedes an anisotropen transparenten Objekten
DE3542218C2 (de) Anordnung zur Kompensation von Gangunterschiedsdifferenzen
DE2354562C2 (de) Optische Anordnung zum schrägen Reflektieren eines Bündels von polarisiertem Licht
DE2453424A1 (de) Tragbares polarisations-analysegeraet
DE3906119A1 (de) Anordnung zum messen polarisationsoptischer gangunterschiede
DE2115886B2 (de) Elektrooptische modulationsvorrichtung
DD143183B1 (de) Zwischenabbildungssystem zur durchfuehrung von kontrastverfahren bei mikroskopen
DE975217C (de) Interferenz-Mikroskop

Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
8127 New person/name/address of the applicant

Owner name: WARNER LAMBERT TECHNOLOGIES, INC., 75221 DALLAS, T

8128 New person/name/address of the agent

Representative=s name: DIEHL, H., DIPL.-PHYS. DR.RER.NAT. KRESSIN, H., DI

8128 New person/name/address of the agent

Representative=s name: DIEHL, H., DIPL.-PHYS. DR.RER.NAT., PAT.-ANW., 800

D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee