DE2428810C2 - Interferenzmikroskop - Google Patents
InterferenzmikroskopInfo
- Publication number
- DE2428810C2 DE2428810C2 DE2428810A DE2428810A DE2428810C2 DE 2428810 C2 DE2428810 C2 DE 2428810C2 DE 2428810 A DE2428810 A DE 2428810A DE 2428810 A DE2428810 A DE 2428810A DE 2428810 C2 DE2428810 C2 DE 2428810C2
- Authority
- DE
- Germany
- Prior art keywords
- birefringent element
- optical axis
- plate
- microscope
- compensation plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003287 optical effect Effects 0.000 claims description 27
- ORUIBWPALBXDOA-UHFFFAOYSA-L magnesium fluoride Chemical compound [F-].[F-].[Mg+2] ORUIBWPALBXDOA-UHFFFAOYSA-L 0.000 claims description 12
- 229910001635 magnesium fluoride Inorganic materials 0.000 claims description 12
- 239000013078 crystal Substances 0.000 claims description 7
- 239000010453 quartz Substances 0.000 claims description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 5
- 238000000576 coating method Methods 0.000 claims description 4
- 230000010363 phase shift Effects 0.000 claims description 2
- 230000010287 polarization Effects 0.000 description 10
- 210000001747 pupil Anatomy 0.000 description 8
- 230000010355 oscillation Effects 0.000 description 5
- 239000013256 coordination polymer Substances 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 229910021532 Calcite Inorganic materials 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/0092—Polarisation microscopes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
- G02B21/08—Condensers
- G02B21/14—Condensers affording illumination for phase-contrast observation
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Microscoopes, Condenser (AREA)
- Polarising Elements (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US376074A US3904267A (en) | 1973-07-02 | 1973-07-02 | Compensating plate to provide uniformity in interference microscopes |
Publications (2)
Publication Number | Publication Date |
---|---|
DE2428810A1 DE2428810A1 (de) | 1975-01-23 |
DE2428810C2 true DE2428810C2 (de) | 1984-12-06 |
Family
ID=23483601
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE2428810A Expired DE2428810C2 (de) | 1973-07-02 | 1974-06-14 | Interferenzmikroskop |
Country Status (7)
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19626261A1 (de) * | 1995-06-30 | 1997-01-02 | Nikon Corp | Beobachtungsvorrichtung |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5614491Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1976-10-06 | 1981-04-06 | ||
JPS5770510A (en) * | 1980-10-20 | 1982-05-01 | Konishiroku Photo Ind Co Ltd | Polarizing optical system |
JPS5770511A (en) * | 1980-10-20 | 1982-05-01 | Konishiroku Photo Ind Co Ltd | Polarizing optical system |
US4571030A (en) * | 1983-04-04 | 1986-02-18 | Cooper Lasersonics, Inc. | Sum-beam separator using critical angle |
DD233670A1 (de) * | 1984-12-29 | 1986-03-05 | Zeiss Jena Veb Carl | Anordnung zur kompensation von gangunterschiedsdifferenzen |
US4795246A (en) * | 1987-07-30 | 1989-01-03 | Loro Albert | Differential interference contrast microscope using non-uniformly deformed plastic birefringent components |
JPH02151825A (ja) * | 1988-12-05 | 1990-06-11 | Olympus Optical Co Ltd | 微分干渉顕微鏡 |
JP3639807B2 (ja) * | 2001-06-27 | 2005-04-20 | キヤノン株式会社 | 光学素子及び製造方法 |
DE10247248A1 (de) * | 2002-10-10 | 2004-04-22 | Leica Microsystems Wetzlar Gmbh | Polarisations-Interferenzmikroskop |
EP1882968A4 (en) * | 2005-05-18 | 2010-09-01 | Olympus Corp | POLARIZATION MICROSCOPE |
JP4935254B2 (ja) * | 2006-09-04 | 2012-05-23 | 株式会社ニコン | 微分干渉顕微鏡 |
DE102010036073A1 (de) | 2010-09-01 | 2012-03-01 | Carl Zeiss Microlmaging Gmbh | Lichtmikroskop und optisches Modul |
CN105612611B (zh) | 2013-08-09 | 2019-03-12 | 科磊股份有限公司 | 用于提高检测灵敏度的多点照明 |
CN107991728B (zh) | 2013-08-23 | 2020-06-16 | 科磊股份有限公司 | 宽带及宽视场角补偿器 |
JP2015049381A (ja) * | 2013-09-02 | 2015-03-16 | ソニー株式会社 | 表示装置、表示方法及び補償部材の製造方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2601175A (en) * | 1947-08-05 | 1952-06-17 | Smith Francis Hughes | Interference microscope |
US2924142A (en) * | 1952-05-14 | 1960-02-09 | Centre Nat Rech Scient | Interferential polarizing device for study of phase objects |
DE1134844B (de) * | 1960-11-30 | 1962-08-16 | Zeiss Carl Fa | Interferenzeinrichtung fuer Mikroskope |
-
1973
- 1973-07-02 US US376074A patent/US3904267A/en not_active Expired - Lifetime
-
1974
- 1974-06-14 DE DE2428810A patent/DE2428810C2/de not_active Expired
- 1974-06-18 CH CH832774A patent/CH572630A5/xx not_active IP Right Cessation
- 1974-06-28 DD DD179580A patent/DD113271A5/xx unknown
- 1974-06-28 JP JP49073480A patent/JPS613409B2/ja not_active Expired
- 1974-07-02 GB GB2936874A patent/GB1445046A/en not_active Expired
- 1974-07-02 FR FR7423378A patent/FR2241798B1/fr not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19626261A1 (de) * | 1995-06-30 | 1997-01-02 | Nikon Corp | Beobachtungsvorrichtung |
Also Published As
Publication number | Publication date |
---|---|
FR2241798A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1975-03-21 |
DE2428810A1 (de) | 1975-01-23 |
GB1445046A (en) | 1976-08-04 |
DD113271A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1975-05-20 |
JPS5039145A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1975-04-11 |
US3904267A (en) | 1975-09-09 |
CH572630A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1976-02-13 |
JPS613409B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1986-02-01 |
FR2241798B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1977-03-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8110 | Request for examination paragraph 44 | ||
8127 | New person/name/address of the applicant |
Owner name: WARNER LAMBERT TECHNOLOGIES, INC., 75221 DALLAS, T |
|
8128 | New person/name/address of the agent |
Representative=s name: DIEHL, H., DIPL.-PHYS. DR.RER.NAT. KRESSIN, H., DI |
|
8128 | New person/name/address of the agent |
Representative=s name: DIEHL, H., DIPL.-PHYS. DR.RER.NAT., PAT.-ANW., 800 |
|
D2 | Grant after examination | ||
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |