JPS613409B2 - - Google Patents

Info

Publication number
JPS613409B2
JPS613409B2 JP49073480A JP7348074A JPS613409B2 JP S613409 B2 JPS613409 B2 JP S613409B2 JP 49073480 A JP49073480 A JP 49073480A JP 7348074 A JP7348074 A JP 7348074A JP S613409 B2 JPS613409 B2 JP S613409B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP49073480A
Other versions
JPS5039145A (ja
Inventor
Deiitsu Do Fueeru Yohanesu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
WAANAA RANBAATO TEKUNOROJIIZU Inc
Original Assignee
WAANAA RANBAATO TEKUNOROJIIZU Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by WAANAA RANBAATO TEKUNOROJIIZU Inc filed Critical WAANAA RANBAATO TEKUNOROJIIZU Inc
Publication of JPS5039145A publication Critical patent/JPS5039145A/ja
Publication of JPS613409B2 publication Critical patent/JPS613409B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0092—Polarisation microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Polarising Elements (AREA)
  • Microscoopes, Condenser (AREA)
JP49073480A 1973-07-02 1974-06-28 Expired JPS613409B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US376074A US3904267A (en) 1973-07-02 1973-07-02 Compensating plate to provide uniformity in interference microscopes

Publications (2)

Publication Number Publication Date
JPS5039145A JPS5039145A (ja) 1975-04-11
JPS613409B2 true JPS613409B2 (ja) 1986-02-01

Family

ID=23483601

Family Applications (1)

Application Number Title Priority Date Filing Date
JP49073480A Expired JPS613409B2 (ja) 1973-07-02 1974-06-28

Country Status (7)

Country Link
US (1) US3904267A (ja)
JP (1) JPS613409B2 (ja)
CH (1) CH572630A5 (ja)
DD (1) DD113271A5 (ja)
DE (1) DE2428810C2 (ja)
FR (1) FR2241798B1 (ja)
GB (1) GB1445046A (ja)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5614491Y2 (ja) * 1976-10-06 1981-04-06
JPS5770510A (en) * 1980-10-20 1982-05-01 Konishiroku Photo Ind Co Ltd Polarizing optical system
JPS5770511A (en) * 1980-10-20 1982-05-01 Konishiroku Photo Ind Co Ltd Polarizing optical system
US4571030A (en) * 1983-04-04 1986-02-18 Cooper Lasersonics, Inc. Sum-beam separator using critical angle
DD233670A1 (de) * 1984-12-29 1986-03-05 Zeiss Jena Veb Carl Anordnung zur kompensation von gangunterschiedsdifferenzen
US4795246A (en) * 1987-07-30 1989-01-03 Loro Albert Differential interference contrast microscope using non-uniformly deformed plastic birefringent components
JPH02151825A (ja) * 1988-12-05 1990-06-11 Olympus Optical Co Ltd 微分干渉顕微鏡
US5764363A (en) * 1995-06-30 1998-06-09 Nikon Corporation Apparatus for observing a surface using polarized light
JP3639807B2 (ja) * 2001-06-27 2005-04-20 キヤノン株式会社 光学素子及び製造方法
DE10247248A1 (de) * 2002-10-10 2004-04-22 Leica Microsystems Wetzlar Gmbh Polarisations-Interferenzmikroskop
US20090040601A1 (en) * 2005-05-18 2009-02-12 Olympus Corporation Polarization microscope
JP4935254B2 (ja) * 2006-09-04 2012-05-23 株式会社ニコン 微分干渉顕微鏡
DE102010036073A1 (de) 2010-09-01 2012-03-01 Carl Zeiss Microlmaging Gmbh Lichtmikroskop und optisches Modul
US9494531B2 (en) 2013-08-09 2016-11-15 Kla-Tencor Corporation Multi-spot illumination for improved detection sensitivity
WO2015027200A1 (en) 2013-08-23 2015-02-26 Kla-Tencor Corporation Broadband and wide field angle compensator
JP2015049381A (ja) * 2013-09-02 2015-03-16 ソニー株式会社 表示装置、表示方法及び補償部材の製造方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2601175A (en) * 1947-08-05 1952-06-17 Smith Francis Hughes Interference microscope
US2924142A (en) * 1952-05-14 1960-02-09 Centre Nat Rech Scient Interferential polarizing device for study of phase objects
DE1134844B (de) * 1960-11-30 1962-08-16 Zeiss Carl Fa Interferenzeinrichtung fuer Mikroskope

Also Published As

Publication number Publication date
DE2428810C2 (de) 1984-12-06
FR2241798A1 (ja) 1975-03-21
JPS5039145A (ja) 1975-04-11
FR2241798B1 (ja) 1977-03-11
GB1445046A (en) 1976-08-04
US3904267A (en) 1975-09-09
DD113271A5 (ja) 1975-05-20
DE2428810A1 (de) 1975-01-23
CH572630A5 (ja) 1976-02-13

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