DE2402728C3 - Vorrichtung zum Analysieren einer Oberflachenschicht durch Ionenzerstreuung - Google Patents

Vorrichtung zum Analysieren einer Oberflachenschicht durch Ionenzerstreuung

Info

Publication number
DE2402728C3
DE2402728C3 DE19742402728 DE2402728A DE2402728C3 DE 2402728 C3 DE2402728 C3 DE 2402728C3 DE 19742402728 DE19742402728 DE 19742402728 DE 2402728 A DE2402728 A DE 2402728A DE 2402728 C3 DE2402728 C3 DE 2402728C3
Authority
DE
Germany
Prior art keywords
analyzer
surface layer
ion beam
ions
energy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE19742402728
Other languages
German (de)
English (en)
Other versions
DE2402728A1 (de
DE2402728B2 (de
Inventor
Hidde Herman Eindhoven Brongersma (Niederlande)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Publication of DE2402728A1 publication Critical patent/DE2402728A1/de
Publication of DE2402728B2 publication Critical patent/DE2402728B2/de
Application granted granted Critical
Publication of DE2402728C3 publication Critical patent/DE2402728C3/de
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203Measuring back scattering
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/28Static spectrometers
    • H01J49/282Static spectrometers using electrostatic analysers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
DE19742402728 1973-02-02 1974-01-21 Vorrichtung zum Analysieren einer Oberflachenschicht durch Ionenzerstreuung Expired DE2402728C3 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL7301496A NL7301496A (enrdf_load_stackoverflow) 1973-02-02 1973-02-02

Publications (3)

Publication Number Publication Date
DE2402728A1 DE2402728A1 (de) 1974-08-08
DE2402728B2 DE2402728B2 (de) 1980-04-30
DE2402728C3 true DE2402728C3 (de) 1981-01-15

Family

ID=19818135

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19742402728 Expired DE2402728C3 (de) 1973-02-02 1974-01-21 Vorrichtung zum Analysieren einer Oberflachenschicht durch Ionenzerstreuung

Country Status (5)

Country Link
CA (1) CA995825A (enrdf_load_stackoverflow)
DE (1) DE2402728C3 (enrdf_load_stackoverflow)
FR (1) FR2216578B1 (enrdf_load_stackoverflow)
GB (1) GB1454641A (enrdf_load_stackoverflow)
NL (1) NL7301496A (enrdf_load_stackoverflow)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4107526A (en) * 1976-03-22 1978-08-15 Minnesota Mining And Manufacturing Company Ion scattering spectrometer with modified bias
DE2856244A1 (de) * 1978-12-27 1980-07-03 Kernforschungsanlage Juelich Elektronenstosspektrometer
DE2922128A1 (de) * 1979-05-31 1980-12-11 Strahlen Umweltforsch Gmbh Ionenquelle fuer einen massenanalysator
JPS6037644A (ja) * 1983-08-10 1985-02-27 Anelva Corp 表面分析装置

Also Published As

Publication number Publication date
NL7301496A (enrdf_load_stackoverflow) 1974-08-06
DE2402728A1 (de) 1974-08-08
FR2216578A1 (enrdf_load_stackoverflow) 1974-08-30
FR2216578B1 (enrdf_load_stackoverflow) 1983-08-05
CA995825A (en) 1976-08-24
GB1454641A (en) 1976-11-03
DE2402728B2 (de) 1980-04-30

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Legal Events

Date Code Title Description
OD Request for examination
C3 Grant after two publication steps (3rd publication)
8339 Ceased/non-payment of the annual fee